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Cited by 301

The DOI matches its Crossref record; 9 of the 9 references it cites were found in a registry or an index.

Pressure sensitivity in anisotropically etched thin-diaphragm pressure sensors

Clark, S.K., Wise, K.D.·1979·IEEE Transactions on Electron Devices

Abstract

In this paper the differential equations governing thin, square-diaphragm silicon pressure sensors are developed and solved using finite-difference numerical methods. Diaphragm deflection and stress patterns are presented in a normalized form applicable to diaphragms of arbitrary thickness and size. For 1-mm210-µm-thick diaphragms in

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Crossref · 10.1109/t-ed.1979.19792

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Metadata

Authors
Clark, S. K., & Wise, K. D.
Venue
IEEE Transactions on Electron Devices
Published
1979-12
Volume
26
Issue
12
Pages
1887-1896
ISSN
  • 0018-9383 (ISSN-L)
  • 1557-9646
OpenAlex
W1974978401
Cited by
301
References
9
FWCI
3.52
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Pressure sensitivity in anisotropically etched thin-diaphragm pressure sensors. https://app.cochat.ai/papers/10.1109/t-ed.1979.19792
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Clark, S. K., & Wise, K. D. (1979). Pressure sensitivity in anisotropically etched thin-diaphragm pressure sensors. IEEE Transactions on Electron Devices. https://doi.org/10.1109/t-ed.1979.19792

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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.