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High breakdown voltage AlGaN-GaN power-HEMT design and high current density switching behavior
Abstract
AlGaN-GaN power high-electron mobility transistors (HEMTs) with 600-V breakdown voltage are fabricated and demonstrated as switching power devices for motor drive and power supply applications. The fabricated power HEMT realized the high breakdown voltage by optimized field plate technique and the low on-state resistance of 3.3 m/spl Omega/cm/sup 2/, which is 20 times lower than that or silicon MOSFETs, thanks to the high critical field of GaN material and the high mobility in 2DEG channel. The fabricated devices also demonstrated the high current density switching of 850 A/cm/sup 2/ turn-off. These results show that AlGaN-GaN power-HEMTs are one of the most promising candidates for future switching power device for power electronics applications.
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Cited by
Uemoto, Y., Hikita, M., Ueno, H., Matsuo, H., Ishida, H., Yanagihara, M., Ueda, T., Tanaka, T., & Ueda, D. (2007) · IEEE Transactions on Electron Devices · doi:10.1109/ted.2007.908601 · Cited by 1,038
Perspective: Ga2O3 for ultra-high power rectifiers and MOSFETS
Pearton, S. J., Ren, F., Tadjer, M., & Kim, J. (2018) · Journal of Applied Physics · doi:10.1063/1.5062841 · Cited by 659
High Breakdown Voltage Achieved on AlGaN/GaN HEMTs With Integrated Slant Field Plates
Dora, Y., Chakraborty, A., Mccarthy, L., Keller, S., Denbaars, S. P., & Mishra, U. K. (2006) · IEEE Electron Device Letters · doi:10.1109/led.2006.881020 · Cited by 448
Metadata
- Authors
- Saito, W., Takada, Y., Kuraguchi, M., Tsuda, K., Omura, I., Ogura, T., & Ohashi, H.
- Venue
- IEEE Transactions on Electron Devices
- Published
- 2003-12
- Volume
- 50
- Issue
- 12
- Pages
- 2528-2531
- ISSN
- 0018-9383 (ISSN-L)
- OpenAlex
- W2149151998
- Cited by
- 414
- References
- 0
- FWCI
- 8.60
- Type
- journal article
- Language
- en
- Open access
- closed
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- Saito, W., Takada, Y., Kuraguchi, M., Tsuda, K., Omura, I., Ogura, T., & Ohashi, H. (2003). High breakdown voltage AlGaN-GaN power-HEMT design and high current density switching behavior. IEEE Transactions on Electron Devices. https://doi.org/10.1109/ted.2003.819248
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