The DOI matches its Crossref record.
Reliability of Capacitors for DC-Link Applications in Power Electronic Converters—An Overview
Open accessAbstract
DC-link capacitors are an important part in the majority of power electronic converters which contribute to cost, size and failure rate on a considerable scale. From capacitor users' viewpoint, this paper presents a review on the improvement of reliability of dc link in power electronic converters from two aspects: 1) reliability-oriented dc-link design solutions; 2) conditioning monitoring of dc-link capacitors during operation. Failure mechanisms, failure modes and lifetime models of capacitors suitable for the applications are also discussed as a basis to understand the physics-of-failure. This review serves to provide a clear picture of the state-of-the-art research in this area and to identify the corresponding challenges and future research directions for capacitors and their dc-link applications.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Global Trends in High-Power On-Board Chargers for Electric Vehicles
Khaligh, A., & D'Antonio, M. (2019) · IEEE Transactions on Vehicular Technology · doi:10.1109/tvt.2019.2897050 · Cited by 652
Reliability of Power Electronic Systems: An Industry Perspective
Falck, J., Felgemacher, C., Rojko, A., Liserre, M., & Zacharias, P. (2018) · IEEE Industrial Electronics Magazine · doi:10.1109/mie.2018.2825481 · Cited by 336
Overview of Real-Time Lifetime Prediction and Extension for SiC Power Converters
Ni, Z., Lyu, X., Yadav, O. P., Singh, B. N., Zheng, S., & Cao, D. (2020) · IEEE Transactions on Power Electronics · doi:10.1109/tpel.2019.2962503 · Cited by 261
Reliability of Power Electronic Systems for EV/HEV Applications
Blaabjerg, F., Wang, H., Vernica, I., Liu, B., & Davari, P. (2021) · Proceedings of the IEEE · doi:10.1109/jproc.2020.3031041 · Cited by 249
“Besides active components, the capacitor reliability is also essential to understand and take into consideration when doing reliability analysis for the complete system [20].”
BackgroundInfluentialSelf-citationZhou, D., Wang, H., & Blaabjerg, F. (2018) · IEEE Transactions on Power Electronics · doi:10.1109/tpel.2017.2769161 · Cited by 200
Self-citation
Metadata
- Authors
- Wang, H., & Blaabjerg, F.
- Venue
- IEEE Transactions on Industry Applications
- Published
- 2014-09
- Volume
- 50
- Issue
- 5
- Pages
- 3569-3578
- ISSN
- 0093-9994 (ISSN-L)
- 1939-9367
- OpenAlex
- W2333012428
- Cited by
- 1,384
- References
- 0
- FWCI
- 187.57
- Type
- journal article
- Language
- en
- Open access
- bronze
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Reliability of Capacitors for DC-Link Applications in Power Electronic Converters—An Overview. https://app.cochat.ai/papers/10.1109/tia.2014.2308357
- The paper
- Wang, H., & Blaabjerg, F. (2014). Reliability of Capacitors for DC-Link Applications in Power Electronic Converters—An Overview. IEEE Transactions on Industry Applications. https://doi.org/10.1109/tia.2014.2308357
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.