The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.
Open-Transistor Fault Diagnostics in Voltage-Source Inverters by Analyzing the Load Currents
Abstract
A novel method is presented for the detection and isolation of open-transistor faults in voltage-source inverters feeding AC motors. The method is an extension of the normalized DC-components method. The normalized average currents are combined with additional diagnostic variables which convey information about the percentage of time spent by the phase currents in the near-zero zone. The combined diagnostic signals permit much more robust diagnostics of single-transistor faults and make feasible the diagnostics of multiple-transistor faults. Suggested in this paper is also an alternative solution for the normalization of DC components, which is easier interpreted and simpler to implement.
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Citations
Cites
Fault Diagnosis and Reconfiguration for Multilevel Inverter Drive Using AI-Based Techniques
Khomfoi, S., & Tolbert, L. M. (2007) · IEEE Transactions on Industrial Electronics · doi:10.1109/tie.2007.906994 · Cited by 284
Cited by
Trends in Fault Diagnosis for Electrical Machines: A Review of Diagnostic Techniques
Henao, H., Capolino, G.-A., Fernandez-Cabanas, M., Filippetti, F., Bruzzese, C., Strangas, E., Pusca, R., Estima, J., Riera-Guasp, M., & Hedayati-Kia, S. (2014) · IEEE Industrial Electronics Magazine · doi:10.1109/mie.2013.2287651 · Cited by 602
Survey of fault-tolerance techniques for three-phase voltage source inverters
Mirafzal, B. (2014) · IEEE Transactions on Industrial Electronics · doi:10.1109/tie.2014.2301712 · Cited by 440
Estima, J. O., & Marques Cardoso, A. J. (2013) · IEEE Transactions on Industrial Electronics · doi:10.1109/tie.2012.2188877 · Cited by 377
Jlassi, I., Estima, J. O., El Khil, S. K., Bellaaj, N. M., & Cardoso, A. J. M. (2017) · IEEE Transactions on Industry Applications · doi:10.1109/tia.2016.2616398 · Cited by 284
Smet, V., Forest, F., Huselstein, J.-J., Rashed, A., & Richardeau, F. (2013) · IEEE Transactions on Industrial Electronics · doi:10.1109/tie.2012.2196894 · Cited by 232
Metadata
- Authors
- Sleszynski, W., Nieznanski, J., & Cichowski, A.
- Venue
- IEEE Transactions on Industrial Electronics
- Published
- 2009-11
- Volume
- 56
- Issue
- 11
- Pages
- 4681-4688
- ISSN
- 0278-0046 (ISSN-L)
- OpenAlex
- W2156740116
- Cited by
- 300
- References
- 1
- FWCI
- 12.14
- Type
- journal article
- Language
- en
- Open access
- closed
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- Sleszynski, W., Nieznanski, J., & Cichowski, A. (2009). Open-Transistor Fault Diagnostics in Voltage-Source Inverters by Analyzing the Load Currents. IEEE Transactions on Industrial Electronics. https://doi.org/10.1109/tie.2009.2023640
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
