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An Improved Exponential Model for Predicting Remaining Useful Life of Rolling Element Bearings

Li, Naipeng, Lei, Yaguo, Lin, Jing, Ding, Steven X.·2015·IEEE Transactions on Industrial Electronics

Abstract

The remaining useful life (RUL) prediction of rolling element bearings has attracted substantial attention recently due to its importance for the bearing health management. The exponential model is one of the most widely used methods for RUL prediction of rolling element bearings. However, two shortcomings exist in the exponential model: 1) the first predicting time (FPT) is selected subjectively; and 2) random errors of the stochastic process decrease the prediction accuracy. To deal with these two shortcomings, an improved exponential model is proposed in this paper. In the improved model, an adaptive FPT selection approach is established based on the 3σ interval, and particle filtering is utilized to reduce random errors of the stochastic process. In order to demonstrate the effectiveness of the improved model, a simulation and four tests of bearing degradation processes are utilized for the RUL prediction. The results show that the improved model is able to select an appropriate FPT and reduce random errors of the stochastic process. Consequently, it performs better in the RUL prediction of rolling element bearings than the original exponential model.

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Metadata

Authors
Li, N., Lei, Y., Lin, J., & Ding, S. X.
Venue
IEEE Transactions on Industrial Electronics
Published
2015-12
Volume
62
Issue
12
Pages
7762-7773
ISSN
  • 0278-0046 (ISSN-L)
  • 1557-9948
OpenAlex
W2005523062
Cited by
686
References
2
FWCI
21.03
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: An Improved Exponential Model for Predicting Remaining Useful Life of Rolling Element Bearings. https://app.cochat.ai/papers/10.1109/tie.2015.2455055
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Li, N., Lei, Y., Lin, J., & Ding, S. X. (2015). An Improved Exponential Model for Predicting Remaining Useful Life of Rolling Element Bearings. IEEE Transactions on Industrial Electronics. https://doi.org/10.1109/tie.2015.2455055

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