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LSTM Learning With Bayesian and Gaussian Processing for Anomaly Detection in Industrial IoT

Open access
Wu, Di, Jiang, Zhongkai, Xie, Xiaofeng, Wei, Xuetao, Yu, Weiren, Li, Renfa·2020·IEEE Transactions on Industrial Informatics

Abstract

The data generated by millions of sensors in the industrial Internet of Things (IIoT) are extremely dynamic, heterogeneous, and large scale and pose great challenges on the real-time analysis and decision making for anomaly detection in the IIoT. In this article, we propose a long short-term memory (LSTM)-Gauss-NBayes method, which is a synergy of the long short-term memory neural network (LSTM-NN) and the Gaussian Bayes model for outlier detection in the IIoT. In a nutshell, the LSTM-NN builds a model on normal time series. It detects outliers by utilizing the predictive error for the Gaussian Naive Bayes model. Our method exploits advantages of both LSTM and Gaussian Naive Bayes models, which not only has strong prediction capability of LSTM for future time point data, but also achieves an excellent classification performance of the Gaussian Naive Bayes model through the predictive error. We evaluate our approaches on three real-life datasets that involve both long-term and short-term time dependence. Empirical studies demonstrate that our proposed techniques outperform the best-known competitors, which is a preferable choice for detecting anomalies.

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Metadata

Authors
Wu, D., Jiang, Z., Xie, X., Wei, X., Yu, W., & Li, R.
Venue
IEEE Transactions on Industrial Informatics
Published
2020-08
Volume
16
Issue
8
Pages
5244-5253
ISSN
  • 1551-3203 (ISSN-L)
  • 1941-0050
OpenAlex
W2987793235
Cited by
290
References
7
FWCI
13.12
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: LSTM Learning With Bayesian and Gaussian Processing for Anomaly Detection in Industrial IoT. https://app.cochat.ai/papers/10.1109/tii.2019.2952917
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Wu, D., Jiang, Z., Xie, X., Wei, X., Yu, W., & Li, R. (2020). LSTM Learning With Bayesian and Gaussian Processing for Anomaly Detection in Industrial IoT. IEEE Transactions on Industrial Informatics. https://doi.org/10.1109/tii.2019.2952917

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