Defect-GAN: High-Fidelity Defect Synthesis for Automated Defect Inspection
Open accessAbstract
Automated defect inspection is critical for effective and efficient maintenance, repair, and operations in advanced manufacturing. On the other hand, automated defect inspection is often constrained by the lack of defect samples, especially when we adopt deep neural networks for this task. This paper presents Defect-GAN, an automated defect synthesis network that generates realistic and diverse defect samples for training accurate and robust defect inspection networks. Defect-GAN learns through defacement and restoration processes, where the defacement generates defects on normal surface images while the restoration removes defects to generate normal images. It employs a novel compositional layer-based architecture for generating realistic defects within various image backgrounds with different textures and appearances. It can also mimic the stochastic variations of defects and offer flexible control over the locations and categories of the generated defects within the image background. Extensive experiments show that Defect-GAN is capable of synthesizing various defects with superior diversity and fidelity. In addition, the synthesized defect samples demonstrate their effectiveness in training better defect inspection networks.
Integrity signals
Registry
Cites
Statistics
Claims the paper makes
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
Fully supervised learning methods depend on datasets meticulously labeled by experts, posing a significant financial burden.
“Fully supervised learning methods [6,7], used in deep learning, depend on datasets meticulously labeled by experts for model training. Although effective, this approach poses a significant financial burden on many facilities due to the high labor costs involved.”
From An Unsupervised Method for Industrial Image Anomaly Detection with Vision Transformer-Based Autoencoder (2024) · cites this paper as [6]
Cites
Deep Residual Learning for Image Recognition
He, K., Zhang, X., Ren, S., & Sun, J. (2016) · 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2016.90 · Cited by 235,474 · see citing works
Adam: A Method for Stochastic Optimization
Kingma, D. P., & Ba, J. (2014) · arXiv · doi:10.48550/arxiv.1412.6980 · Cited by 98,946 · see citing works
Faster R-CNN: Towards Real-Time Object Detection with Region Proposal Networks
Ren, S., He, K., Girshick, R., & Sun, J. (2015) · arXiv · doi:10.48550/arxiv.1506.01497 · Cited by 70,812 · see citing works
Faster R-CNN: Towards Real-Time Object Detection with Region Proposal Networks
Ren, S., He, K., Girshick, R., & Sun, J. (2017) · IEEE Transactions on Pattern Analysis and Machine Intelligence · doi:10.1109/tpami.2016.2577031 · Cited by 56,035 · see citing works
Densely Connected Convolutional Networks
Huang, G., Liu, Z., Van Der Maaten, L., & Weinberger, K. Q. (2017) · 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2017.243 · Cited by 48,566 · see citing works
Unpaired image-to-image translation using cycle-consistent adversarial networks
Zhu, J.-Y., Park, T., Isola, P., & Efros, A. A. (2017) · 2017 IEEE International Conference on Computer Vision (ICCV) · doi:10.1109/iccv.2017.244 · Cited by 23,602 · see citing works
Image-to-Image Translation with Conditional Adversarial Networks
Isola, P., Zhu, J.-Y., Zhou, T., & Efros, A. A. (2017) · 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2017.632 · Cited by 22,930 · see citing works
Labaca-Castro, R. (2023) · Springer eBooks · doi:10.1007/978-3-658-40442-0_9 · Cited by 21,100 · see citing works
GAN(Generative Adversarial Nets)
淳司, 柴. (2017) · Journal of Japan Society for Fuzzy Theory and Intelligent Informatics · doi:10.3156/jsoft.29.5_177_2 · Cited by 19,268 · see citing works
Photo-Realistic Single Image Super-Resolution Using a Generative Adversarial Network
Ledig, C., Theis, L., Huszar, F., Caballero, J., Cunningham, A., Acosta, A., Aitken, A., Tejani, A., Totz, J., Wang, Z., et al. (2017) · 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2017.19 · Cited by 12,696 · see citing works
Unsupervised representation learning with deep convolutional generative adversarial networks
Radford, A., Metz, L., & Chintala, S. (2015) · arXiv · doi:10.48550/arxiv.1511.06434 · Cited by 12,235 · see citing works
A Style-Based Generator Architecture for Generative Adversarial Networks
Karras, T., Laine, S., & Aila, T. (2019) · 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2019.00453 · Cited by 11,714 · see citing works
GANs Trained by a Two Time-Scale Update Rule Converge to a Local Nash Equilibrium
Heusel, M., Ramsauer, H., Unterthiner, T., Nessler, B., & Hochreiter, S. (2017) · arXiv · doi:10.48550/arxiv.1706.08500 · Cited by 8,365 · see citing works
Unsupervised Domain Adaptation by BackpropagationPreprint
Ganin, Y., & Lempitsky, V. (2014) · International Conference on Machine Learning · doi:10.48550/arxiv.1409.7495 · Cited by 7,311 · see citing works
Improved training of Wasserstein GANs
Gulrajani, I., Ahmed, F., Arjovsky, M., Dumoulin, V., & Courville, A. (2017) · arXiv · doi:10.48550/arxiv.1704.00028 · Cited by 6,800 · see citing works
(2017) · International Conference on Machine Learning · Cited by 6,382 · see citing works
Analyzing and Improving the Image Quality of StyleGAN
Karras, T., Laine, S., Aittala, M., Hellsten, J., Lehtinen, J., & Aila, T. (2020) · 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr42600.2020.00813 · Cited by 6,332 · see citing works
Prototypical Networks for Few-shot LearningPreprint
Snell, J., Swersky, K., & Zemel, R. S. (2017) · arXiv (Cornell University) · doi:10.48550/arxiv.1703.05175 · Cited by 5,863 · see citing works
Context Encoders: Feature Learning by Inpainting
Pathak, D., Krahenbuhl, P., Donahue, J., Darrell, T., & Efros, A. A. (2016) · 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2016.278 · Cited by 5,691 · see citing works
Progressive Growing of GANs for Improved Quality, Stability, and Variation
Karras, T., Aila, T., Laine, S., & Lehtinen, J. (2017) · arXiv · doi:10.48550/arxiv.1710.10196 · Cited by 4,727 · see citing works
StarGAN: Unified Generative Adversarial Networks for Multi-domain Image-to-Image Translation
Choi, Y., Choi, M., Kim, M., Ha, J.-W., Kim, S., & Choo, J. (2018) · 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition · doi:10.1109/cvpr.2018.00916 · Cited by 4,163 · see citing works
Large Scale GAN Training for High Fidelity Natural Image Synthesis
Brock, A., Donahue, J., & Simonyan, K. (2018) · arXiv · doi:10.48550/arxiv.1809.11096 · Cited by 3,717 · see citing works
Semantic Image Synthesis With Spatially-Adaptive Normalization
Park, T., Liu, M.-Y., Wang, T.-C., & Zhu, J.-Y. (2019) · 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2019.00244 · Cited by 2,974 · see citing works
Generative Image Inpainting with Contextual Attention
Yu, J., Lin, Z., Yang, J., Shen, X., Lu, X., & Huang, T. S. (2018) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr.2018.00577 · Cited by 2,633 · see citing works
Multimodal Unsupervised Image-to-Image Translation
Huang, X., Liu, M.-Y., Belongie, S., & Kautz, J. (2018) · Lecture notes in computer science · doi:10.1007/978-3-030-01219-9_11 · Cited by 2,597 · see citing works
Unsupervised Image-to-Image Translation NetworksPreprint
Liu, M.-Y., Breuel, T. M., & Kautz, J. (2017) · arXiv (Cornell University) · doi:10.48550/arxiv.1703.00848 · Cited by 2,121 · see citing works
Learning to Discover Cross-Domain Relations with Generative Adversarial Networks
Kim, T., Cha, M., Kim, H., Lee, J. K., & Kim, J. (2017) · arXiv · doi:10.48550/arxiv.1703.05192 · Cited by 1,716 · see citing works
StarGAN v2: Diverse Image Synthesis for Multiple Domains
Choi, Y., Uh, Y., Yoo, J., & Ha, J.-W. (2020) · 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr42600.2020.00821 · Cited by 1,663 · see citing works
Automatic Road Crack Detection Using Random Structured Forests
Shi, Y., Cui, L., Qi, Z., Meng, F., & Chen, Z. (2016) · IEEE Transactions on Intelligent Transportation Systems · doi:10.1109/tits.2016.2552248 · Cited by 1,565 · see citing works
A Closer Look at Few-shot ClassificationPreprint
Chen, W.-Y., Liu, Y., Kira, Z., Wang, Y.-C. F., & Huang, J. (2019) · arXiv (Cornell University) · doi:10.48550/arxiv.1904.04232 · Cited by 1,521 · see citing works
Meta-Learning With Differentiable Convex Optimization
Lee, K., Maji, S., Ravichandran, A., & Soatto, S. (2019) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr.2019.01091 · Cited by 1,351 · see citing works
Semantic Image Inpainting with Deep Generative Models
Yeh, R. A., Chen, C., Lim, T. Y., Schwing, A. G., Hasegawa‐Johnson, M., & Do, M. N. (2017) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr.2017.728 · Cited by 1,263 · see citing works
StackGAN++: Realistic Image Synthesis with Stacked Generative Adversarial Networks
Zhang, H., Xu, T., Li, H., Zhang, S., Wang, X., Huang, X., & Metaxas, D. (2018) · IEEE Transactions on Pattern Analysis and Machine Intelligence · doi:10.1109/tpami.2018.2856256 · Cited by 1,222 · see citing works
Dynamic Few-Shot Visual Learning Without Forgetting
Gidaris, S., & Komodakis, N. (2018) · 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition · doi:10.1109/cvpr.2018.00459 · Cited by 1,128 · see citing works
EnhanceNet: Single Image Super-Resolution Through Automated Texture Synthesis
Sajjadi, M. S. M., Schölkopf, B., & Hirsch, M. (2017) · IEEE/CVF International Conference on Computer Vision (ICCV) · doi:10.1109/iccv.2017.481 · Cited by 1,088 · see citing works
Few-Shot Object Detection via Feature Reweighting
Kang, B., Liu, Z., Wang, X., Yu, F., Feng, J., & Darrell, T. (2019) · IEEE/CVF International Conference on Computer Vision (ICCV) · doi:10.1109/iccv.2019.00851 · Cited by 894 · see citing works
Data Augmentation Generative Adversarial NetworksPreprint
Antoniou, A., Storkey, A., & Edwards, H. S. (2017) · arXiv (Cornell University) · doi:10.48550/arxiv.1711.04340 · Cited by 797 · see citing works
Low-Shot Learning from Imaginary Data
Wang, Y.-X., Girshick, R., Hebert, M., & Hariharan, B. (2018) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr.2018.00760 · Cited by 770 · see citing works
Few-Shot Object Detection With Attention-RPN and Multi-Relation Detector
Fan, Q., Zhuo, W., Tang, C., & Tai, Y. (2020) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr42600.2020.00407 · Cited by 680 · see citing works
Meta R-CNN: Towards General Solver for Instance-Level Low-Shot Learning
Yan, X., Chen, Z., Xu, A., Wang, X., Liang, X., & Lin, L. (2019) · IEEE/CVF International Conference on Computer Vision (ICCV) · doi:10.1109/iccv.2019.00967 · Cited by 662 · see citing works
GANimation: Anatomically-Aware Facial Animation from a Single Image
Pumarola, A., Agudo, A., Martinez, A. M., Sanfeliu, A., & Moreno-Noguer, F. (2018) · Lecture Notes in Computer Science · doi:10.1007/978-3-030-01249-6_50 · Cited by 621 · see citing works
F-VAEGAN-D2: A Feature Generating Framework for Any-Shot Learning
Xian, Y., Sharma, S., Schiele, B., & Akata, Z. (2019) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr.2019.01052 · Cited by 579 · see citing works
Frustratingly Simple Few-Shot Object DetectionPreprint
Wang, X., Huang, T. E., Darrell, T., Gonzalez, J. E., & Yu, F. (2020) · arXiv (Cornell University) · doi:10.48550/arxiv.2003.06957 · Cited by 568 · see citing works
Automated fabric defect detection—A review
Ngan, H. Y. T., Pang, G. K. H., & Yung, N. H. C. (2011) · Image and Vision Computing · doi:10.1016/j.imavis.2011.02.002 · Cited by 550 · see citing works
Shift-Net: Image Inpainting via Deep Feature Rearrangement
Yan, Z., Li, X., Li, M., Zuo, W., & Shan, S. (2018) · Lecture notes in computer science · doi:10.1007/978-3-030-01264-9_1 · Cited by 529 · see citing works
CAD-Net: A Context-Aware Detection Network for Objects in Remote Sensing Imagery
Zhang, G., Lu, S., & Zhang, W. (2019) · IEEE Transactions on Geoscience and Remote Sensing · doi:10.1109/tgrs.2019.2930982 · Cited by 497 · see citing works
Self-citationDifferentiable Augmentation for Data-Efficient GAN TrainingPreprint
Zhao, S., Liu, Z., Lin, J., Zhu, J.-Y., & Han, S. (2020) · arXiv (Cornell University) · doi:10.48550/arxiv.2006.10738 · Cited by 417 · see citing works
Meta-Learning to Detect Rare Objects
Wang, Y.-X., Ramanan, D., & Hebert, M. (2019) · IEEE/CVF International Conference on Computer Vision (ICCV) · doi:10.1109/iccv.2019.01002 · Cited by 376 · see citing works
Deep convolutional neural networks for detection of rail surface defects
Faghih‐Roohi, S., Hajizadeh, S., Núñez, A. A., Babuška, R., & Schutter, B. D. (2016) · International Joint Conference on Neural Networks (IJCNN) · doi:10.1109/ijcnn.2016.7727522 · Cited by 366 · see citing works
Seeing What a GAN Cannot GeneratePreprint
(2020) · DSpace@MIT (Massachusetts Institute of Technology) · Cited by 335 · see citing works
Unsupervised Attention-guided Image to Image TranslationPreprint
Mejjati, Y. A., Richardt, C., Tompkin, J., Cosker, D. P., & Kim, K. I. (2018) · arXiv (Cornell University) · doi:10.48550/arxiv.1806.02311 · Cited by 272 · see citing works
Deformable Patterned Fabric Defect Detection With Fisher Criterion-Based Deep Learning
Li, Y., Zhao, W., & Pan, J. (2016) · IEEE Transactions on Automation Science and Engineering · doi:10.1109/tase.2016.2520955 · Cited by 265 · see citing works
Defect Image Sample Generation With GAN for Improving Defect Recognition
Niu, S., Li, B., Wang, X., & Lin, H. (2020) · IEEE Transactions on Automation Science and Engineering · doi:10.1109/tase.2020.2967415 · Cited by 251 · see citing works
LR-GAN: Layered Recursive Generative Adversarial Networks for Image GenerationPreprint
Yang, J., Kannan, A., Batra, D., & Parikh, D. (2016) · International Conference on Learning Representations · doi:10.48550/arxiv.1703.01560 · Cited by 249 · see citing works
Automated surface inspection for directional textures
Tsai, D., & Hsieh, C.-Y. (1999) · Image and Vision Computing · doi:10.1016/s0262-8856(99)00009-8 · Cited by 214 · see citing works
Mundt, M., Majumder, S., Murali, S., Panetsos, P., & Ramesh, V. (2019) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr.2019.01145 · Cited by 199 · see citing works
Spatial Fusion GAN for Image Synthesis
Zhan, F., Zhu, H., & Lu, S. (2019) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr.2019.00377 · Cited by 160 · see citing works
Self-citationMery, D., & Filbert, D. (2002) · IEEE Transactions on Robotics and Automation · doi:10.1109/tra.2002.805646 · Cited by 141 · see citing works
FineGAN: Unsupervised Hierarchical Disentanglement for Fine-Grained Object Generation and Discovery
Singh, K. K., Ojha, U., & Lee, Y. J. (2019) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr.2019.00665 · Cited by 132 · see citing works
Cascade EF-GAN: Progressive Facial Expression Editing With Local Focuses
Wu, R., Zhang, G., Lu, S., & Chen, T. (2020) · 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr42600.2020.00507 · Cited by 121 · see citing works
Self-citationCascaded SR-GAN for Scale-Adaptive Low Resolution Person Re-identification
Wang, Z., Ye, M., Yang, F., Bai, X., & Satoh, S. (2018) · International Joint Conference on Artificial Intelligence · doi:10.24963/ijcai.2018/541 · Cited by 117 · see citing works
Verisimilar Image Synthesis for Accurate Detection and Recognition of Texts in Scenes
Zhan, F., Lu, S., & Xue, C. (2018) · Lecture notes in computer science · doi:10.1007/978-3-030-01237-3_16 · Cited by 110 · see citing works
Self-citationSemantically Multi-Modal Image Synthesis
Zhu, Z., Xu, Z., You, A., & Bai, X. (2020) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr42600.2020.00551 · Cited by 98 · see citing works
SDNET2018: A concrete crack image dataset for machine learning applications
Maguire, M., Dorafshan, S., & Thomas, R. J. (2018) · Digital Commons - USU (Utah State University) · doi:10.15142/t3td19 · Cited by 79 · see citing works
Dynamic Few-Shot Visual Learning without ForgettingPreprint
Gidaris, S., & Nikos Komodakis, A. (2018) · arXiv (Cornell University) · doi:10.48550/arxiv.1804.09458 · Cited by 75 · see citing works
Jointly Embedding Multiple Single-Cell Omics Measurements
Liu, J., Huang, Y., Singh, R., Vert, J., & Noble, W. S. (2019) · PubMed · doi:10.4230/lipics.wabi.2019.10 · Cited by 67 · see citing works
A sparse representation based fast detection method for surface defect detection of bottle caps
Zhou, W., Fei, M., Zhou, H., & Li, K. (2013) · Neurocomputing · doi:10.1016/j.neucom.2013.07.038 · Cited by 66 · see citing works
Automatic inspection system of LED chip using two-stages back-propagation neural network
Kuo, C. J., Hsu, C.-T. M., Liu, Z., & Wu, H. (2013) · Journal of Intelligent Manufacturing · doi:10.1007/s10845-012-0725-7 · Cited by 51 · see citing works
DefectGAN: Weakly-Supervised Defect Detection using Generative Adversarial Network
Niu, S., Lin, H. Z., Niu, T., Li, B., & Wang, X. (2019) · IEEE International Conference on Automation Science and Engineering (CASE) · doi:10.1109/coase.2019.8843204 · Cited by 40 · see citing works
Semantic Component Decomposition for Face Attribute Manipulation
Chen, Y.-C., Shen, X., Lin, Z., Lu, X. B., I-Ming, P., & Jia, J. (2019) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr.2019.01009 · Cited by 39 · see citing works
How to Make a Pizza: Learning a Compositional Layer-Based GAN Model
Papadopoulos, D. P., Tamaazousti, Y., Ofli, F., Weber, I. G., & Torralba, A. B. (2019) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr.2019.00819 · Cited by 38 · see citing works
PNPDet: Efficient Few-shot Detection without Forgetting via Plug-and-Play Sub-networks
Zhang, G., Cui, K., Wu, R., Lu, S., & Tian, Y. (2021) · IEEE Winter Conference on Applications of Computer Vision · doi:10.1109/wacv48630.2021.00387 · Cited by 37 · see citing works
Self-citationSimulation of defects in aluminium castings using CAD models of flaws and real X-ray images
Mery, D., Hahn, D., & Hitschfeld, N. (2005) · Insight - Non-Destructive Testing and Condition Monitoring · doi:10.1784/insi.2005.47.10.618 · Cited by 33 · see citing works
Multiscale image quality measures for defect detection in thin films
Tolba, A. S., & Raafat, H. M. (2015) · The International Journal of Advanced Manufacturing Technology · doi:10.1007/s00170-014-6758-7 · Cited by 28 · see citing works
LEED: Label-Free Expression Editing via Disentanglement
Wu, R., & Lu, S. (2020) · Lecture notes in computer science · doi:10.1007/978-3-030-58610-2_46 · Cited by 23 · see citing works
Self-citationA Template Model for Defect Simulation for Evaluating Nondestructive Testing in X-Radiography
Huang, Q., Wu, Y., Baruch, J. E. F., Jiang, P., & Peng, Y. (2009) · IEEE Transactions on Systems Man and Cybernetics - Part A Systems and Humans · doi:10.1109/tsmca.2008.2009941 · Cited by 22 · see citing works
RF-GAN: A Light and Reconfigurable Network for Unpaired Image-to-Image Translation
Köksal, A., & Lu, S. (2021) · Lecture notes in computer science · doi:10.1007/978-3-030-69538-5_33 · Cited by 10 · see citing works
Self-citation
Flagged first, then by citations
3 of the 80 references couldn’t be matched to a known paper.
Cited by
Sorted by citations
Deep Industrial Image Anomaly Detection: A Survey
Liu, J., Xie, G., Wang, J., Li, S., Wang, C., Zheng, F., & Jin, Y. (2024) · Machine Intelligence Research · doi:10.1007/s11633-023-1459-z · Cited by 463 · see citing works
“DefectGAN [164] also believes that defects and normal backgrounds can be layered, and that defects are foreground.”
AnomalyDiffusion: Few-Shot Anomaly Image Generation with Diffusion Model
Hu, T., Zhang, J., Yi, R., Du, Y., Chen, X., Liu, L., Wang, Y., & Wang, C. (2024) · Proceedings of the AAAI Conference on Artificial Intelligence · doi:10.1609/aaai.v38i8.28696 · Cited by 166 · see citing works
Diverse Image Inpainting with Bidirectional and Autoregressive Transformers
Yu, Y., Zhan, F., Wu, R., Pan, J., Cui, K., Lu, S., Ma, F., Xie, X., & Miao, C. (2021) · ACM International Conference on Multimedia (ACM MM) · doi:10.1145/3474085.3475436 · Cited by 160 · see citing works
Self-citationFew-Shot Defect Image Generation via Defect-Aware Feature Manipulation
Duan, Y., Hong, Y., Niu, L., & Zhang, L. (2023) · Proceedings of the AAAI Conference on Artificial Intelligence · doi:10.1609/aaai.v37i1.25132 · Cited by 121 · see citing works
Region- and Strength-Controllable GAN for Defect Generation and Segmentation in Industrial Images
Niu, S., Li, B., Wang, X., & Peng, Y. (2021) · IEEE Transactions on Industrial Informatics · doi:10.1109/tii.2021.3127188 · Cited by 104 · see citing works
Yang, G., Liu, K., Zhang, J., Zhao, B., Zhao, Z., Chen, X., & Chen, B. M. (2022) · Construction and Building Materials · doi:10.1016/j.conbuildmat.2022.129226 · Cited by 97 · see citing works
A New Contrastive GAN With Data Augmentation for Surface Defect Recognition Under Limited Data
Du, Z., Gao, L., & Li, X. (2022) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2022.3232649 · Cited by 65 · see citing works
DLS -GAN: Generative Adversarial Nets for Defect Location Sensitive Data Augmentation
Li, W., Gu, C., Chen, J., Ma, C., Zhang, X., Chen, B., & Wan, S. (2023) · IEEE Transactions on Automation Science and Engineering · doi:10.1109/tase.2023.3309629 · Cited by 60 · see citing works
Mask2Defect: A Prior Knowledge-Based Data Augmentation Method for Metal Surface Defect Inspection
Yang, B., Liu, Z., Duan, G., & Tan, J. (2021) · IEEE Transactions on Industrial Informatics · doi:10.1109/tii.2021.3126098 · Cited by 59 · see citing works
Liu, K., & Chen, B. M. (2022) · IEEE Transactions on Industrial Electronics · doi:10.1109/tie.2022.3204953 · Cited by 61 · see citing works
Unbalanced Feature Transport for Exemplar-based Image Translation
Zhan, F., Yu, Y., Cui, K., Zhang, G., Lu, S., Pan, J., Zhang, C., Ma, F., Xie, X., & Miao, C. (2021) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr46437.2021.01478 · Cited by 61 · see citing works
Self-citationA Survey of Defect Detection Applications Based on Generative Adversarial Networks
He, X., Chang, Z., Zhang, L., Xu, H., Chen, H., & Luo, Z. (2022) · IEEE Access · doi:10.1109/access.2022.3217227 · Cited by 55 · see citing works
DiffDD: A surface defect detection framework with diffusion probabilistic model
Zhou, X., Zhang, Y., Ren, Z., Mi, T., Feng, K., Zhou, S., & Jiang, Z. (2024) · Advanced Engineering Informatics · doi:10.1016/j.aei.2024.102637 · Cited by 45 · see citing works
DG-GAN: A High Quality Defect Image Generation Method for Defect Detection
He, X., Luo, Z., Li, Q., Chen, H., & Li, F. (2023) · Sensors · doi:10.3390/s23135922 · Cited by 43 · see citing works
Computer vision defect detection on unseen backgrounds for manufacturing inspection
Mezher, A. M., & Marble, A. E. (2023) · Expert Systems with Applications · doi:10.1016/j.eswa.2023.122749 · Cited by 47 · see citing works
Survey on industrial defect detection with deep learning
罗, 东., 蔡, 雨., 杨, 子., 章, 哲., 周, 瑜., & 白, 翔. (2022) · Scientia Sinica Informationis · doi:10.1360/ssi-2021-0336 · Cited by 43 · see citing works
Wang, Y., Hu, W., Wen, L., & Gao, L. (2023) · IEEE Transactions on Industrial Informatics · doi:10.1109/tii.2023.3252410 · Cited by 40 · see citing works
An Overview of Image Generation of Industrial Surface Defects
Zhong, X., Zhu, J., Liu, W., Hu, C., Deng, Y., & Wu, Z. (2023) · Sensors · doi:10.3390/s23198160 · Cited by 41 · see citing works
Tao, H. (2023) · Mechanical Systems and Signal Processing · doi:10.1016/j.ymssp.2023.111082 · Cited by 38 · see citing works
Diversifying Tire-Defect Image Generation Based on Generative Adversarial Network
Zhang, Y., Wang, Y., Jiang, Z., Liao, F., Li, Z., Tan, D., Chen, J., & Lu, J. (2022) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2022.3160542 · Cited by 39 · see citing works
Towards Continual Adaptation in Industrial Anomaly Detection
Li, W., Zhan, J., Wang, J., Xia, B., Gao, B.-B., Liu, J., Wang, C., & Zheng, F. (2022) · ACM International Conference on Multimedia (ACM MM) · doi:10.1145/3503161.3548232 · Cited by 39 · see citing works
Defect Image Sample Generation With Diffusion Prior for Steel Surface Defect Recognition
Tai, Y., Yang, K., Peng, T., Huang, Z., & Zhang, Z. (2024) · IEEE Transactions on Automation Science and Engineering · doi:10.1109/tase.2024.3482362 · Cited by 37 · see citing works
A survey on RGB, 3D, and multimodal approaches for unsupervised industrial image anomaly detection
Lin, Y., Chang, Y., Tong, X., Yu, J., Liotta, A., Huang, G., Song, W., Zeng, D., Wu, Z., Wang, Y., et al. (2025) · Information Fusion · doi:10.1016/j.inffus.2025.103139 · Cited by 36 · see citing works
PNPDet: Efficient Few-shot Detection without Forgetting via Plug-and-Play Sub-networks
Zhang, G., Cui, K., Wu, R., Lu, S., & Tian, Y. (2021) · IEEE Winter Conference on Applications of Computer Vision · doi:10.1109/wacv48630.2021.00387 · Cited by 37 · see citing works
Self-citationYang, Q., & Guo, R. (2024) · Sensors · doi:10.3390/s24082440 · Cited by 35 · see citing works
“Fully supervised learning methods [6,7], used in deep learning, depend on datasets meticulously labeled by experts for model training.”
MethodA Novel Remote Visual Inspection System for Bridge Predictive Maintenance
Galdelli, A., D’Imperio, M., Marchello, G., Mancini, A., Scaccia, M., Sasso, M., Frontoni, E., & Cannella, F. (2022) · Remote Sensing · doi:10.3390/rs14092248 · Cited by 37 · see citing works
DG2GAN: improving defect recognition performance with generated defect image sample
Deng, F., Luo, J., Fu, L., Huang, Y., Chen, J., Li, N., Zhong, J., & Lam, T. L. (2024) · Scientific Reports · doi:10.1038/s41598-024-64716-y · Cited by 34 · see citing works
Dual-Interrelated Diffusion Model for Few-Shot Anomaly Image Generation
Jin, Y., Peng, J., He, Q., Hu, T., Wu, J., Chen, H., Wang, H., Zhu, W., Chi, M., Liu, J., et al. (2025) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr52734.2025.02832 · Cited by 37 · see citing works
GenCo: Generative Co-training for Generative Adversarial Networks with Limited Data
Cui, K., Huang, J., Luo, Z., Zhang, G., Zhan, F., & Lu, S. (2022) · Proceedings of the AAAI Conference on Artificial Intelligence · doi:10.1609/aaai.v36i1.19928 · Cited by 33 · see citing works
Self-citationPeres, R. S., Guedes, M., Miranda, F., & Barata, J. (2021) · IEEE Access · doi:10.1109/access.2021.3082690 · Cited by 32 · see citing works
Synthetic data in generalizable, learning-based neuroimaging
Gopinath, K. K., Hoopes, A., Alexander, D. C., Arnold, S. E., Balbastre, Y., Billot, B., Casamitjana, A., Cheng, Y., Chua, R. Y. Z., Edlow, B. L., et al. (2024) · Imaging Neuroscience · doi:10.1162/imag_a_00337 · Cited by 29 · see citing works
Towards a Comprehensive Visual Quality Inspection for Industry 4.0*
Rožanec, J. M., Zajec, P., Trajkova, E., Šircelj, B., Brecelj, B., Novalija, I., Dam, P., Fortuna, B., & Mladenić, D. (2022) · IFAC-PapersOnLine · doi:10.1016/j.ifacol.2022.09.486 · Cited by 30 · see citing works
TF²: Few-Shot Text-Free Training-Free Defect Image Generation for Industrial Anomaly Inspection
Yu, Q., Zhu, K., Cao, Y. H., Xia, F., & Kang, Y. (2024) · IEEE Transactions on Circuits and Systems for Video Technology · doi:10.1109/tcsvt.2024.3424435 · Cited by 26 · see citing works
Unseen Visual Anomaly Generation
Sun, H., Cao, Y., Dong, H., & Fink, O. (2025) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr52734.2025.02375 · Cited by 23 · see citing works
Synthetic Data for Defect Segmentation on Complex Metal Surfaces
Fulir, J., Bosnar, L., Hagen, H., & Gospodnetić, P. (2023) · IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) · doi:10.1109/cvprw59228.2023.00465 · Cited by 22 · see citing works
Intraclass Image Augmentation for Defect Detection Using Generative Adversarial Neural Networks
Sampath, V., Maurtua, I., Martín, J. J. A., Iriondo, A., Lluvia, I., & Aizpurua, G. (2023) · Sensors · doi:10.3390/s23041861 · Cited by 21 · see citing works
Wei, J., Shen, F., Lv, C., Zhang, Z., Zhang, F., & Yang, H. (2023) · IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) · doi:10.1109/cvprw59228.2023.00467 · Cited by 21 · see citing works
Mask-Guided Generation Method for Industrial Defect Images with Non-uniform Structures
Wei, J., Zhang, Z., Shen, F., & Lv, C. (2022) · Machines · doi:10.3390/machines10121239 · Cited by 20 · see citing works
Gong, Y., Liu, M., & Wang, X. (2023) · Advanced Engineering Informatics · doi:10.1016/j.aei.2023.102253 · Cited by 19 · see citing works
Ye, S., Wang, Z., Xiong, P., Xu, X., Du, L., Tan, J., & Wang, W. (2023) · Journal of Intelligent Manufacturing · doi:10.1007/s10845-023-02168-3 · Cited by 17 · see citing works
Long-Tailed Anomaly Detection with Learnable Class Names
Ho, C.-H., Peng, K., & Vasconcelos, N. M. (2024) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr52733.2024.01182 · Cited by 17 · see citing works
Defect Spectrum: A Granular Look of Large-Scale Defect Datasets with Rich Semantics
Yang, S., Chen, Z., Chen, P., Fang, X., Liang, Y., Liu, S., & Chen, Y.-C. (2024) · Lecture notes in computer science · doi:10.1007/978-3-031-72667-5_11 · Cited by 17 · see citing works
DefectFill: Realistic Defect Generation with Inpainting Diffusion Model for Visual Inspection
Song, J., Park, D., Baek, K., Lee, S., Choi, J., Kim, E., & Yoon, S. (2025) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr52734.2025.01744 · Cited by 18 · see citing works
Singh, A. R., Hazra, S., Goswami, A., Debattista, K., & Bashford‐Rogers, T. (2025) · Computers in Industry · doi:10.1016/j.compind.2025.104360 · Cited by 17 · see citing works
Wu, T.-Y., Wu, R., Wang, P., Lin, T., & Chang, K. (2023) · Engineering Structures · doi:10.1016/j.engstruct.2023.116130 · Cited by 15 · see citing works
Advancing Ultrasonic Defect Detection in High-Speed Wheels via UT-YOLO
Zhang, Q., Peng, J.-P., Tian, K., Wang, A., Li, J.-L., & Gao, X.-R. (2024) · Italian National Conference on Sensors · doi:10.3390/s24051555 · Cited by 18 · see citing works
Gong, Y., Wang, X., Zhou, C.-C., Ge, M., Liu, C., & Zhang, X. (2024) · Journal of Intelligent Manufacturing · doi:10.1007/s10845-023-02270-6 · Cited by 16 · see citing works
DefectGAN: Synthetic Data Generation for EMU Defects Detection With Limited Data
Liu, S., Ni, H., Li, C., Zou, Y., & Luo, Y. (2024) · IEEE Sensors Journal · doi:10.1109/jsen.2024.3386711 · Cited by 17 · see citing works
ul-Huda, N., Ahmad, H., Banjar, A., Alzahrani, A. O., Ahmad, I., & Naeem, M. S. (2024) · Heliyon · doi:10.1016/j.heliyon.2024.e26466 · Cited by 14 · see citing works
Truong, A. M., & Luong, H. Q. (2024) · Current Research in Food Science · doi:10.1016/j.crfs.2024.100758 · Cited by 14 · see citing works
Few-Shot Defect Image Generation Based on Consistency Modeling
Shi, Q., Wei, J., Shen, F., & Zhang, Z. (2024) · Lecture notes in computer science · doi:10.1007/978-3-031-73116-7_21 · Cited by 14 · see citing works
Robust unsupervised-learning based crack detection for stamped metal products
Zhang, P., Ryu, H., Miao, Y., Jo, S., & Park, G. (2024) · Journal of Manufacturing Systems · doi:10.1016/j.jmsy.2024.01.003 · Cited by 12 · see citing works
A mask guided cross data augmentation method for industrial defect detection
Wang, X., Li, W., & Lu, C. H. (2024) · Future Generation Computer Systems · doi:10.1016/j.future.2024.107676 · Cited by 12 · see citing works
Alam, L., & Kehtarnavaz, N. (2023) · Sensors · doi:10.3390/s23104864 · Cited by 11 · see citing works
Intelligent IoT framework with GAN‐synthesized images for enhanced defect detection in manufacturing
Aramkul, S., & Sugunnasil, P. (2023) · Computational Intelligence · doi:10.1111/coin.12619 · Cited by 11 · see citing works
Synthesizing Industrial Defect Images Under Data Imbalance
Eun-Hee, C., Jeon, B., & Park, I. K. (2023) · IEEE Access · doi:10.1109/access.2023.3322927 · Cited by 10 · see citing works
On-the-fly image-level oversampling for imbalanced datasets of manufacturing defects
Theodoropoulos, S., Zajec, P., Rožanec, J. M., Kyriazis, D., & Tsanakas, P. D. (2024) · Machine Learning · doi:10.1007/s10994-023-06498-4 · Cited by 11 · see citing works
Ferdousi, R., Yang, C., Hossain, M. A., Laamarti, F., Hossain, M. S., & Saddik, A. E. (2024) · Cognitive Computation · doi:10.1007/s12559-024-10283-3 · Cited by 10 · see citing works
Industrial and medical anomaly detection through cycle-consistent adversarial networks
Bougaham, A., Delchevalerie, V., Adoui, M. E., & Frénay, B. (2024) · Neurocomputing · doi:10.1016/j.neucom.2024.128762 · Cited by 10 · see citing works
FEGAN: A Feature Extraction Based Approach for GAN Anomaly Detection and Localization
Fan, F., Zhang, L., & Dai, Y. (2024) · IEEE Access · doi:10.1109/access.2024.3406438 · Cited by 10 · see citing works
Shancheng, T., Jin, Z., Zhang, Y., Lu, J., Li, H., & Jiqing, Y. (2023) · Processes · doi:10.3390/pr11092615 · Cited by 10 · see citing works
Liu, B., Ding, L., He, L., Yang, L., Zhang, X., & Tian, Y. (2025) · Engineering Applications of Artificial Intelligence · doi:10.1016/j.engappai.2025.112720 · Cited by 9 · see citing works
Training-Free Industrial Defect Generation with Diffusion Models
Xu, R., Chiu, Y.-T., Chen, T.-I., Chew, O., Chuang, Y., & Cheng, W.-H. (2025) · IEEE/CVF International Conference on Computer Vision (ICCV) · doi:10.1109/iccv51701.2025.02244 · Cited by 9 · see citing works
Liu, K., Yang, G., Zhang, J., Zhao, Z., Chen, X., & Chen, B. M. (2022) · International Conference on Control and Automation · doi:10.1109/icca54724.2022.9831925 · Cited by 9 · see citing works
Defect Synthesis Using Latent Mapping Adversarial Network for Automated Visual Inspection
Song, S., Chang, K., Yun, K., Jun, C., & Baek, J. (2022) · Electronics · doi:10.3390/electronics11172763 · Cited by 9 · see citing works
Defect image generation through feature disentanglement using StyleGAN2-ADA
He, Z., Wu, K., & Wen, Y. (2025) · Neurocomputing · doi:10.1016/j.neucom.2025.130455 · Cited by 8 · see citing works
A Comprehensive Library for Benchmarking Multi-Class Visual Anomaly Detection
Zhang, J., He, H., 甘振业, He, Q., Cai, Y., Xue, Z., Wang, Y., Wang, C., Xie, L., & Liu, Y. (2025) · IEEE International Conference on Computer Vision Workshops · doi:10.1109/iccvw69036.2025.00373 · Cited by 8 · see citing works
Jiang, Z., Dou, X., Liu, X., Xue, C., Wang, A., & Zhang, G. (2024) · Sensors · doi:10.3390/s24175636 · Cited by 8 · see citing works
Self-citationA survey of generative models for image-based structural health monitoring in civil infrastructure
Gwon, G.-H., & Jung, H. (2025) · Journal of Infrastructure Intelligence and Resilience · doi:10.1016/j.iintel.2025.100138 · Cited by 8 · see citing works
Image Defect Recognition Method Based on Deep Learning Network
Di, X., & Li, L. (2022) · Mobile Information Systems · doi:10.1155/2022/5696334 · Cited by 8 · see citing works
RetractedAnomalyControl: Few-Shot Anomaly Generation by ControlNet Inpainting
Ali, M., Fioraio, N., Salti, S., & Stefano, L. D. (2024) · IEEE Access · doi:10.1109/access.2024.3520002 · Cited by 7 · see citing works
YOLOv8-SC: improving the YOLOv8 network for real-time detection of automotive coated surface defects
Ling, L., Zhu, C., Liu, M., Hu, J., Zhang, X., & Ge, M. (2025) · Measurement Science and Technology · doi:10.1088/1361-6501/adb05b · Cited by 7 · see citing works
Improving the Fairness of the Min-Max Game in GANs Training
Zhang, Z., Yang, H., Wang, H., & McLoone, S. (2024) · IEEE Winter Conference on Applications of Computer Vision · doi:10.1109/wacv57701.2024.00289 · Cited by 7 · see citing works
Towards Accurate Unified Anomaly Segmentation
Ma, W., Yao, Q., Zhang, X., Huang, Z., Jiang, Z., & Zhou, S. (2025) · IEEE Winter Conference on Applications of Computer Vision · doi:10.1109/wacv61041.2025.00138 · Cited by 7 · see citing works
Anomaly detection for surface of laptop computer based on PatchCore GAN algorithm
Zhu, H., Kang, Y., Zhao, Y., Yan, X., & Zhang, J. (2022) · Chinese Control Conference (CCC) · doi:10.23919/ccc55666.2022.9902712 · Cited by 7 · see citing works
Weakly Supervised Complex Texture Defect Detection Based on Nested U-Net Architecture
Huang, K., Zeng, Y., Zhao, J., Chai, S., & Yang, F. (2025) · Journal of Nondestructive Evaluation · doi:10.1007/s10921-025-01161-5 · Cited by 6 · see citing works
Liang, X., & Wang, H. (2025) · IEEE Transactions on Consumer Electronics · doi:10.1109/tce.2025.3563272 · Cited by 6 · see citing works
Generative Models Training Based on FEM Simulations Toward Improved Defect Detection
Tzelepakis, A., Dimitriou, N., Charalampous, P., Tsongas, K., Tzetzis, D., & Tzovaras, D. K. (2025) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2025.3568966 · Cited by 6 · see citing works
Multi-Flow: Multi-View-Enriched Normalizing Flows for Industrial Anomaly Detection
Kruse, M., & Rosenhahn, B. (2025) · IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) · doi:10.1109/cvprw67362.2025.00378 · Cited by 6 · see citing works
Ku, D., & Pahk, H.-J. (2024) · IEEE Access · doi:10.1109/access.2024.3380618 · Cited by 6 · see citing works
Advancing Architectural Design Through Generative Adversarial Network Deep Learning Technology
Huang, Y., & He, J. (2024) · International Journal of Distributed Systems and Technologies · doi:10.4018/ijdst.353305 · Cited by 6 · see citing works
Increasing the Generalization of Supervised Fabric Anomaly Detection Methods to Unseen Fabrics
Rippel, O., Zwinge, C., & Merhof, D. (2022) · Sensors · doi:10.3390/s22134750 · Cited by 6 · see citing works
Robust AD: A Real World Benchmark Dataset for Robustness in Industrial Anomaly Detection
Pemula, L., Zhang, D., & Dabeer, O. (2025) · IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) · doi:10.1109/cvprw67362.2025.00389 · Cited by 5 · see citing works
Xie, X., Li, C., Qing, R., Zhou, C., & Zhang, Z. (2024) · Digital Signal Processing · doi:10.1016/j.dsp.2024.104441 · Cited by 5 · see citing works
Utilizing generative AI for crack detection in the marble industry
Vrochidou, Ε., Sidiropoulos, G. K., Ouzounis, A. G., Tsimperidis, I., Kalpakis, V., Stamkos, A., & Papakostas, G. A. (2025) · Engineering Research Express · doi:10.1088/2631-8695/adaca7 · Cited by 6 · see citing works
Automatic Inspection of Seal Integrity in Sterile Barrier Packaging: A Deep Learning Approach
Diaz, J. Z., Farooq, M. A., & Corcoran, P. (2024) · IEEE Access · doi:10.1109/access.2023.3348779 · Cited by 5 · see citing works
Detection of Stain Defects in Textile Industry using State-of-Art Transfer Learning Models
Karegowda, A. G., Pooja, R., Rani, A. L., & Devika, G. (2024) · International Conference on Smart Systems for Applications in Electrical Sciences (ICSSES) · doi:10.1109/icsses62373.2024.10561384 · Cited by 5 · see citing works
Unbalanced Feature Transport for Exemplar-based Image TranslationPreprint
Zhan, F. (2021) · doi:10.31219/osf.io/f6vur · Cited by 5 · see citing works
Component-Aware Unsupervised Logical Anomaly Generation for Industrial Anomaly Detection
Tong, X., Chang, Y., Zhao, Q., Yu, J., Wang, B., Lin, J., Lin, Y., Mai, X., Wang, H., Tao, Z., et al. (2025) · Proceedings - IEEE International Conference on Robotics and Automation/Proceedings · doi:10.1109/icra55743.2025.11127296 · Cited by 4 · see citing works
DefectGen: Few-Shot Defect Image Generation using Stable Diffusion for Steel Surface Analysis
Tayeb, A. M., Nakayiza, H. L., Shin, H., Lee, S., Lee, C., Lee, Y. S., Kim, D., & Lee, J. M. (2024) · International Conference on Information and Communication Technology Convergence (ICTC) · doi:10.1109/ictc62082.2024.10827273 · Cited by 4 · see citing works
Synth4Seg—Learning Defect Data Synthesis for Defect Segmentation Using Bi-Level Optimization
Mou, S., Vemulapalli, R., Li, S., Liu, Y., Thomas, C., Cao, M., Bai, H., Tuzel, O., Huang, P., Shan, J., et al. (2025) · IEEE Transactions on Automation Science and Engineering · doi:10.1109/tase.2025.3583713 · Cited by 4 · see citing works
MST: Multiscale Flow-Based Student–Teacher Network for Unsupervised Anomaly Detection
Yang, Y., Yang, Y., Zhou, S., Gao, Y., Zhu, Y., Wan, X., Hu, W., & Jiang, X. (2024) · Electronics · doi:10.3390/electronics13163224 · Cited by 4 · see citing works
Font conversion for steel product number recognition: A conditioned diffusion model approach
Lee, T.-H., Choi, H., Kim, B. J., Jang, H., Lee, D., & Kim, S. W. (2025) · Advanced Engineering Informatics · doi:10.1016/j.aei.2025.103368 · Cited by 4 · see citing works
Comparison of unsupervised image anomaly detection models for sheet metal glue lines
Chen, S., Bandaru, S., Marti, S., Bekar, E. T., & Skoogh, A. (2025) · Engineering Applications of Artificial Intelligence · doi:10.1016/j.engappai.2025.110740 · Cited by 4 · see citing works
Applications and Limits of Image-to-Image Translation Models
Coscia, P., Genovese, A., Scotti, F., & Piuri, V. (2023) · IEEE International Conference on Digital Signal Processing (DSP) · doi:10.1109/dsp58604.2023.10167879 · Cited by 4 · see citing works
Sequential PatchCore: Anomaly Detection for Surface Inspection Using Synthetic Impurities
Mao, R., Fulir, J., Garth, C., & Gospodnetić, P. (2025) · Lecture notes in computer science · doi:10.1007/978-3-031-92805-5_23 · Cited by 3 · see citing works
Ding, H., Chen, J., Ye, H., & Chen, Y. (2025) · Applied Sciences · doi:10.3390/app15147887 · Cited by 3 · see citing works
DefFiller: mask-conditioned generation with diffusion prior for saliency-based defect detection
Tai, Y., Huang, Z., Peng, T., & Zhang, Z. (2025) · The Visual Computer · doi:10.1007/s00371-025-04078-2 · Cited by 3 · see citing works
F-ADMD: Fast anomaly detection via multi-scale guided denoising diffusion model
An, C., Wu, J., & Zhang, H. (2025) · Neurocomputing · doi:10.1016/j.neucom.2025.131305 · Cited by 3 · see citing works
Accurate Industrial Anomaly Detection and Localization Using Weakly-Supervised Residual Transformers
Li, H., Wu, J., Liu, D., Wu, L. Y., Chen, H., & Shen, C. (2026) · IEEE Transactions on Image Processing · doi:10.1109/tip.2026.3659337 · Cited by 3 · see citing works
- Authors
- Zhang, G., Cui, K., Hung, T.-Y., & Lu, S.
- Affiliations
- Nanyang Technological University (SG)
- Delta Research Center,Singapore
- Venue
- 2021 IEEE Winter Conference on Applications of Computer Vision (WACV)
- Publisher
- IEEE
- Published
- 2021-01
- Pages
- 2523-2533
- ISSN
- 2472-6737 (ISSN-L)
- OpenAlex
- W3120387510
- Cited by
- 200
- References
- 80
- Citations by year
- 2026: 48 · 2025: 59 · 2024: 43 · 2023: 21 · 2022: 22 · 2021: 7
- FWCI
- 31.92
- Type
- conference paper
- Language
- en
- Open access
- green
- arxiv.org
- Locations
- IEEE Winter Conference on Applications of Computer Vision (publishedVersion)
- arXiv (Cornell University) (submittedVersion)
- DR-NTU (Nanyang Technological University) (submittedVersion)
- arXiv (Cornell University)
- Funders
- National Research Foundation
- Topics
- Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
- Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Generative Adversarial Networks and Image Synthesis
- Physical Sciences › Engineering › Civil and Structural Engineering › Infrastructure Maintenance and Monitoring
- Keywords
- automated defect detection, generative adversarial networks, data scarcity, industrial defect detection
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review