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Scan speed limit in atomic force microscopy
Abstract
SUMMARY: The scan speed limit of atomic force microscopes has been calculated. It is determined by the spring constant of the cantilever k, its effective mass m, the damping constant D of the cantilever in the surrounding medium and the stiffness of the sample. Techniques to measure k, k/m and D/m are described. In liquids the damping constant and the effective mass of the cantilever increase. A consequence of this is that the transfer function always depends on the scan speed when imaging in liquids. The practical scan speed limit for atomic resolution in vacuum is 0·1 μm/s while in water it increases to about 2 μm/s due to the additional damping of cantilever movements. Sample stiffness or damping of cantilever movements by the sample increase these limits. For soft biological materials imaged in water at a desired resolution of 1 nm the scan speed should not exceed 2 μm/s.
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Citations
Cited by
Calculation of thermal noise in atomic force microscopy
Butt, H. J., & Jaschke, M. (1995) · Nanotechnology · doi:10.1088/0957-4484/6/1/001 · Cited by 1,589
Self-citationMicromechanical cantilever-based biosensors
Raiteri, R., Grattarola, M., Butt, H.-J., & Skládal, P. (2001) · Sensors and Actuators B: Chemical · doi:10.1016/s0925-4005(01)00856-5 · Cited by 734
Self-citationShort cantilevers for atomic force microscopy
Walters, D. A., Cleveland, J. P., Thomson, N. H., Hansma, P. K., Wendman, M. A., Gurley, G., & Elings, V. (1996) · Review of Scientific Instruments · doi:10.1063/1.1147177 · Cited by 494
Comparison of calibration methods for atomic-force microscopy cantilevers
Burnham, N. A., Chen, X., Hodges, C. S., Matei, G. A., Thoreson, E. J., Roberts, C. J., Davies, M. C., & Tendler, S. J. B. (2003) · Nanotechnology · doi:10.1088/0957-4484/14/1/301 · Cited by 458
Ziegler, C. (2004) · Analytical and Bioanalytical Chemistry · doi:10.1007/s00216-004-2694-y · Cited by 414
Metadata
- Authors
- BUTT, H. ‐., SIEDLE, P., SEIFERT, K., FENDLER, K., SEEGER, T., BAMBERG, E., WEISENHORN, A. L., GOLDIE, K., & ENGEL, A.
- Venue
- Journal of Microscopy
- Publisher
- Wiley
- Published
- 1993-01
- Volume
- 169
- Issue
- 1
- Pages
- 75-84
- ISSN
- 0022-2720 (ISSN-L)
- 1365-2818
- OpenAlex
- W2165761746
- Cited by
- 233
- References
- 0
- FWCI
- 7.12
- Type
- journal article
- Language
- en
- Open access
- closed
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- BUTT, H. ‐., SIEDLE, P., SEIFERT, K., FENDLER, K., SEEGER, T., BAMBERG, E., WEISENHORN, A. L., GOLDIE, K., & ENGEL, A. (1993). Scan speed limit in atomic force microscopy. Journal of Microscopy. https://doi.org/10.1111/j.1365-2818.1993.tb03280.x
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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