Imaging Performance Of A Normal Incidence X-Ray Telescope Measured At 0.18 keV:
Abstract
Normal incidence offers several advantages over the traditional grazing incidence designs of X-ray optics, but an actual normal incidence device had never previously been made. We describe the results of our measurements of the imaging performance of a normal incidence soft X-ray telescope at BKa (0.183 keV, 67.6 Å). The performance is quite good, and indicates that it is practical to consider normal incidence optics in the design of soft X-ray imaging systems. We describe our planned future tests and a possible astronomical application.
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Extreme ultraviolet lithography
Kazazis, D., Santaclara, J. G., van Schoot, J., Mochi, I., & Ekinci, Y. (2024) · Nature Reviews Methods Primers · doi:10.1038/s43586-024-00361-z · Cited by 149 · see citing works
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- Authors
- Henry, J. P., Spiller, E., & Weisskopf, M.
- Affiliations
- Center for Astrophysics Harvard & Smithsonian (US)
- IBM Research - Thomas J. Watson Research Center (US)
- Marshall Space Flight Center (US)
- ORCID
- Weisskopf, Martin
- Venue
- SPIE Proceedings
- Publisher
- SPIE
- Published
- 1982-03-24
- ISSN
- 0277-786X (ISSN-L)
- OpenAlex
- W2054722498
- Cited by
- 8
- References
- 0
- Citations by year
- 2024: 1 · 2018: 2 · 2013: 1
- FWCI
- 2.34
- Type
- conference paper
- Language
- en
- Open access
- closed
- Locations
- Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (publishedVersion)
- Funders
- National Aeronautics and Space Administration
- Topics
- Physical Sciences › Physics and Astronomy › Radiation › Advanced X-ray Imaging Techniques
- Physical Sciences › Physics and Astronomy › Instrumentation › Astronomy and Astrophysical Research
- Physical Sciences › Physics and Astronomy › Astronomy and Astrophysics › Astrophysical Phenomena and Observations
- Keywords
- normal incidence optics, X-ray telescopes, soft X-ray imaging, imaging performance, X-ray optics
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