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Near-Field Microscopy Through a SiC Superlens
Abstract
The wave nature of light limits the spatial resolution in classical microscopy to about half of the illumination wavelength. Recently, a new approach capable of achieving subwavelength spatial resolution, called superlensing, was invented, challenging the already established method of scanning near-field optical microscopy (SNOM). We combine the advantages of both techniques and demonstrate a novel imaging system where the objects no longer need to be in close proxim-ity to a near-field probe, allowing for optical near-field microscopy of subsurface objects at sub-wavelength-scale lateral resolution.
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Cites
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Pendry, J. B. (2000) · Physical Review Letters · doi:10.1103/physrevlett.85.3966 · Cited by 12,159
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Metadata
- Authors
- Taubner, T., Korobkin, D., Urzhumov, Y., Shvets, G., & Hillenbrand, R.
- Venue
- Science
- Published
- 2006-09-15
- Volume
- 313
- Issue
- 5793
- Pages
- 1595-1595
- ISSN
- 0036-8075 (ISSN-L)
- 1095-9203
- OpenAlex
- W2075448644
- Cited by
- 597
- References
- 1
- FWCI
- 25.60
- Type
- journal article
- Language
- en
- Open access
- closed
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- Taubner, T., Korobkin, D., Urzhumov, Y., Shvets, G., & Hillenbrand, R. (2006). Near-Field Microscopy Through a SiC Superlens. Science. https://doi.org/10.1126/science.1131025
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.