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Cited by 597

The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.

Near-Field Microscopy Through a SiC Superlens

Taubner, Thomas, Korobkin, Dmitriy, Urzhumov, Yaroslav, Shvets, Gennady, Hillenbrand, Rainer·2006·Science

Abstract

The wave nature of light limits the spatial resolution in classical microscopy to about half of the illumination wavelength. Recently, a new approach capable of achieving subwavelength spatial resolution, called superlensing, was invented, challenging the already established method of scanning near-field optical microscopy (SNOM). We combine the advantages of both techniques and demonstrate a novel imaging system where the objects no longer need to be in close proxim-ity to a near-field probe, allowing for optical near-field microscopy of subsurface objects at sub-wavelength-scale lateral resolution.

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Crossref · 10.1126/science.1131025

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Metadata

Authors
Taubner, T., Korobkin, D., Urzhumov, Y., Shvets, G., & Hillenbrand, R.
Venue
Science
Published
2006-09-15
Volume
313
Issue
5793
Pages
1595-1595
ISSN
  • 0036-8075 (ISSN-L)
  • 1095-9203
OpenAlex
W2075448644
Cited by
597
References
1
FWCI
25.60
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Near-Field Microscopy Through a SiC Superlens. https://app.cochat.ai/papers/10.1126/science.1131025
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Taubner, T., Korobkin, D., Urzhumov, Y., Shvets, G., & Hillenbrand, R. (2006). Near-Field Microscopy Through a SiC Superlens. Science. https://doi.org/10.1126/science.1131025

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.