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Scanning Single-Electron Transistor Microscopy: Imaging Individual Charges
Abstract
A single-electron transistor scanning electrometer (SETSE)—a scanned probe microscope capable of mapping static electric fields and charges with 100-nanometer spatial resolution and a charge sensitivity of a small fraction of an electron—has been developed. The active sensing element of the SETSE, a single-electron transistor fabricated at the end of a sharp glass tip, is scanned in close proximity across the sample surface. Images of the surface electric fields of a GaAs/Al x Ga 1− x As heterostructure sample show individual photo-ionized charge sites and fluctuations in the dopant and surface-charge distribution on a length scale of 100 nanometers. The SETSE has been used to image and measure depleted regions, local capacitance, band bending, and contact potentials at submicrometer length scales on the surface of this semiconductor sample.
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Citations
Cited by
Degen, C. L., Reinhard, F., & Cappellaro, P. (2017) · Reviews of Modern Physics · doi:10.1103/revmodphys.89.035002 · Cited by 4,045
Single-electron devices and their applications
Likharev, K. K. (1999) · Proceedings of the IEEE · doi:10.1109/5.752518 · Cited by 1,453
The Radio-Frequency Single-Electron Transistor (RF-SET): A Fast and Ultrasensitive Electrometer
Schoelkopf, R. J., Wahlgren, P., Kozhevnikov, A. A., Delsing, P., & Prober, D. E. (1998) · Science · doi:10.1126/science.280.5367.1238 · Cited by 772
Metric Engineering of Soft Molecular Host Frameworks
Holman, K. T., Pivovar, A. M., Swift, J. A., & Ward, M. D. (2001) · Accounts of Chemical Research · doi:10.1021/ar970272f · Cited by 585
A nanometre-scale mechanical electrometer
Cleland, A. N., & Roukes, M. L. (1998) · Nature · doi:10.1038/32373 · Cited by 512
Metadata
- Authors
- Yoo, M. J., Fulton, T. A., Hess, H. F., Willett, R. L., Dunkleberger, L. N., Chichester, R. J., Pfeiffer, L. N., & West, K. W.
- Venue
- Science
- Published
- 1997-04-25
- Volume
- 276
- Issue
- 5312
- Pages
- 579-582
- ISSN
- 0036-8075 (ISSN-L)
- 1095-9203
- OpenAlex
- W2019176261
- Cited by
- 323
- References
- 0
- FWCI
- 17.55
- Type
- journal article
- Language
- en
- Open access
- closed
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- Yoo, M. J., Fulton, T. A., Hess, H. F., Willett, R. L., Dunkleberger, L. N., Chichester, R. J., Pfeiffer, L. N., & West, K. W. (1997). Scanning Single-Electron Transistor Microscopy: Imaging Individual Charges. Science. https://doi.org/10.1126/science.276.5312.579
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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