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Cited by 330

The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.

All-optical control and metrology of electron pulses

Open access
Kealhofer, C., Schneider, W., Ehberger, D., Ryabov, A., Krausz, F., Baum, P.·2016·Science

Abstract

Electron pulses under control: The ability to take snapshots of fast events can often provide insights into the dynamics of the processes involved: chemical reactions, electronic transport, structural transitions, and complex combinations involving of all of these processes. Kealhofer et al. describe an ultrafast optics approach for generating bunches of electrons and compressing them by more than an order of magnitude to just femtosecond time scales (see the Perspective by Ropers). The technique opens up the possibility of imaging ultrafast phenomena with atomic-scale spatial resolution. Science , this issue p. 429 ; see also p. 410

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Metadata

Authors
Kealhofer, C., Schneider, W., Ehberger, D., Ryabov, A., Krausz, F., & Baum, P.
Venue
Science
Published
2016-04-22
Volume
352
Issue
6284
Pages
429-433
ISSN
  • 0036-8075 (ISSN-L)
  • 1095-9203
OpenAlex
W2342222444
Cited by
330
References
2
FWCI
20.96
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: All-optical control and metrology of electron pulses. https://app.cochat.ai/papers/10.1126/science.aae0003
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Kealhofer, C., Schneider, W., Ehberger, D., Ryabov, A., Krausz, F., & Baum, P. (2016). All-optical control and metrology of electron pulses. Science. https://doi.org/10.1126/science.aae0003

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.