Dry Etch Resistance of Organic Materials
Cited by (263)
Items 101–200 of 263
- Synthesis of Narrow Molecular Weight Distribution Norbornene-Lactone Functionalized Polymers by Nitroxide-Mediated Polymerization: Candidates for 193-nm Photoresist MaterialsZi Wang, Milan Marić · 2014 · Polymers
- Role of polymer structure and ceiling temperature in polymer roughening and degradation during plasma processing: a beam system study of P4MS and PαMSD. Nest, T-Y Chung, Joseph J. Végh · 2010 · Journal of Physics D Applied Physics
- Nanoimprint System for High Volume Semiconductor Manufacturing; Requirement for Resist MaterialsToshiki Ito, Keiji Emoto, Tsuneo Takashima · 2016 · Journal of Photopolymer Science and Technology
- Dichroic Plasmon Superstructures of Au Nanorods over Macroscopic Areas via Directed Self‐Assemblies of Diblock CopolymersHee‐Jung Kang, Sung‐Soo Kim, Seong Il Yoo · 2019 · Advanced Materials Interfaces
- A comparison of the electron beam sensitivities and relative oxygen plasma etch rates of various organosilicon polymersE. Babich, Jurij R. Paraszczak, Michael Hatzakis · 1985 · Microelectronic Engineering
- Resist design concepts for 193 nm lithography: Opportunities for innovation and inventionElsa Reichmanis, Omkaram Nalamasu, Francis M. Houlihan · 1997 · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena
- Functional flexible organic–inorganic hybrid polymer for two photon patterning of optical waveguidesSabine Bichler, Sonja Feldbacher, Rachel Woods · 2011 · Optical Materials
- Influence of top layer geometries on the electronic properties of pentacene and diindenoperylene thin filmsM. Scharnberg, Rainer Adelung, Franz Faupel · 2008 · physica status solidi (a)
- Fabrication of subwavelength structure for improvement in light-extraction efficiency of light-emitting devices using a self-assembled pattern of block copolymerKoji Asakawa, Akira Fujimoto · 2005 · Applied Optics
- Application of quantitative structure property relationship to the design of high refractive index 193i resistHeping Liu, Idriss Blakey, Willard E. Conley · 2008 · Journal of Micro/Nanopatterning Materials and Metrology
- Performance of a high resolution chemically amplified electron beam resist at various beam energiesDongxu Yang, Andreas Frommhold, Alexandra McClelland, J. Roth, Mark C. Rosamond, E. H. Linfield, Johann Osmond, Richard E. Palmer, Alex P. G. Robinson · 2016 · Microelectronic Engineering
- Chain scission efficiency and reactive‐ion etch resistance of alternating copolymers of styrene and olefins trisubstituted or tetrasubstituted with electron‐withdrawing groupsHiroshi Itô, Claudia Hrusa, Henry Kingston Hall · 1986 · Journal of Polymer Science Part A Polymer Chemistry
- Ar + bombardment of 193nm photoresist: Morphological effectsE. Pargon, D. Nest, David B. Graves · 2007 · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena
- Resists for microlithography: Present status and recent research trendsKazuyuki Sugita, Nobuo Ueno · 1992 · Progress in Polymer Science
- Novel Etch-Resistant Molecular Glass Photoresist Based on Pyrene Derivatives for Electron Beam LithographyXue Cong, Siliang Zhang, Jiaxing Gao, Xuewen Cui, Yurui Wu, Xudong Guo, Rui Hu, Shuangqing Wang, Jinping Chen, Yi Li et al. · 2024 · ACS Omega
- Towards Ordered Silicon Nanostructures through Self‐Assembling Mechanisms and ProcessesRosaria A. Puglisi · 2015 · Journal of Nanomaterials
- Synthesis of novel copolymer based on precipitation polymerization and its application in positive-tone photoresistXiangfei Zheng, Changwei Ji, Qingtao Zeng · 2017 · Journal of Polymer Research
- Suppression of 193-nm photoresist deformation by H2 addition to fluorocarbon plasma in via-hole etchingKazumasa Yonekura, Kazunori Yoshikawa, Yuji Fujiwara · 2006 · Thin Solid Films
- Role of the dense amorphous carbon layer in photoresist etchingAdam Pranda, Sandra A. Gutierrez Razo, Zuleykhan Tomova · 2017 · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
- Outgassing Characteristics of Low-Molecular-Weight Resists for Extreme Ultraviolet LithographyHideo Hada, Taku Hirayama, Daiju Shiono · 2005 · Japanese Journal of Applied Physics
- Silicon Patterning Using Self‐assembled PS‐ b ‐PAA Diblock Copolymer Masks for Black Silicon Fabrication via Plasma EtchingXin Zhang, Andrei B. Sushkov, Christopher Metting · 2012 · Plasma Processes and Polymers
- Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopyPatrick Philipp, Lukasz Rzeznik, Tom Wirtz · 2016 · Beilstein Journal of Nanotechnology
- High‐aspect‐ratio oxide etching using CF4/C6F12O plasma in an inductively coupled plasma etching system with low‐frequency bias powerJinhyuk Kim, Gilyoung Choi, Kwang‐Ho Kwon · 2022 · Plasma Processes and Polymers
- Characterization and mechanism of He plasma pretreatment of nanoscale polymer masks for improved pattern transfer fidelityF. Weilnboeck, Dominik Metzler, Niranjan Kumar · 2011 · Applied Physics Letters
- The effect of direct PAG incorporation into the polymer main chain on reactive ion etch resistance of 193nm and EUV chemically amplified resistsCheng-Tsung Lee, Clifford L. Henderson, Mingxing Wang · 2008 · Microelectronic Engineering
- Traversing the “Top-Down/Bottom-Up” Divide: Molecular-Scale Lithography of Self-Assembled RibbonsJonas E. Jarvholm, Mohan Srinivasarao, Laren M. Tolbert · 2008 · Journal of the American Chemical Society
- Oxygen ion-beam etch resistance of metal-free and organosilicon resist materialsHiroshi GOKAN, Y. Ohnishi, Kazuhide Saigo · 1983 · Microelectronic Engineering
- Close-Packed Noncircular Nanodevice Pattern Generation by Self-Limiting Ion-Mill ProcessVishal Parekh, Ariel Ruiz, Paul Ruchhoeft · 2007 · Nano Letters
- Polymer pattern formation on SiO2 surfaces using surface monolayer initiated polymerizationXiaohua Chen, Laren M. Tolbert, Clifford L. Henderson · 2001 · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena
- Revolutionary and evolutionary resist design concepts for 193 nm lithographyO. Nalamasu, Tom Wallow, Elsa Reichmanis et al. · 1997 · Microelectronic Engineering
- Nano- and micro-fabrications of polystyrene having atactic and syndiotactic structures using focused ion beams lithographyAkihiro Oshima, Satoshi Okubo, G. Isoyama · 2012 · Radiation Physics and Chemistry
- Spin-on carbon based on fullerene derivatives as hardmask materials for high-aspect-ratio etchingAndreas Frommhold, Richard Edward Palmer, Alex P. G. Robinson · 2013 · Journal of Micro/Nanopatterning Materials and Metrology
- Environmentally Friendly Negative Resists Based on Acid‐Catalyzed Acetalization for 193‐nm LithographyJin-Baek Kim, Ji‐Hyun Jang, Jong‐Sung Ko · 2003 · Macromolecular Rapid Communications
- Chlorine-based inductively coupled plasma etching of GaAs wafer using tripodal paraffinic triptycene as an etching resist maskAkihiro Matsutani, Fumitaka Ishiwari, Yoshiaki Shoji · 2016 · Japanese Journal of Applied Physics
- Unique polymers via radical diene cyclization: polyspironorbornanes and their application to 193 nm microlithographyRobert P. Meagley, Dario Pasini, Linus Y. Park · 1999 · Chemical Communications
- ArF Chemically Amplified Positive Resist Based on Alicyclic Lactone PolymerKatsumi Maeda, Kaichiro Nakano, Shigeyuki Iwasa · 2001 · Japanese Journal of Applied Physics
- Highly selective etch gas chemistry design for precise DSAL dry development processMitsuhiro Omura, Takahiro Imamura, Hiroshi M Yamamoto · 2014 · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
- Chemically amplified resists for high-resolution lithographyС. А. Булгакова, M. M. Jons, А. Е. Пестов · 2013 · Russian Microelectronics
- Safety-oriented photolithography of water-soluble resist using water-coating and water-developable processes for edible pharmaceutical polymer filmsSatoshi Takei · 2018 · Applied Physics Express
- Enhancement of Dry-Etching Durabilities by Energy or Etchant Quenching1999 · Japanese Journal of Applied Physics
- Healing surface roughness of lithographic nanopatterns through sub-10 nm aqueous-dispersible polymeric particles with excellent dry etch durabilityZhen Jiang, Han‐Hao Cheng, Idriss Blakey · 2018 · Molecular Systems Design & Engineering
- Reactive ion etching of selected polymers in O2 and in CF4/O2Browne Hand, Timothy J. H. Long, Bernard C. Dems · 1993 · Journal of Applied Polymer Science
- Molecular design and biosynthesis of biodegradable polyestersKumar Sudesh, Yoshiharu Doi · 2000 · Polymers for Advanced Technologies
- Polymer Sequence Alters Sensitivity and Resolution in Chemically Amplified Polypeptoid PhotoresistsCameron P. Adams, Carolyn Henein, Xiangxi Meng, Chenyun Yuan, Javier Read de Alaniz, Christopher Kemper Ober, Rachel A. Segalman · 2025 · ACS Macro Letters
- Poly(2‐vinylnaphthalene)‐block‐poly(acrylic acid) Block Copolymer: Self‐Assembled Pattern Formation, Alignment, and Transfer into Silicon via Plasma EtchingXin Zhang, Christopher Metting, Robert M. Briber · 2011 · Macromolecular Chemistry and Physics
- Graphene-Based Etch Resist for Semiconductor Device FabricationSang Won Kim, Minsu Seol, Yeonchoo Cho et al. · 2020 · ACS Applied Nano Materials
- PolymersVijay Kumar, Manu Pallapa, Pouya Rezai, P.R. Selvaganapathy · 2015 · Elsevier eBooks
- Investigations of the Adhesion of Maleic Anhydride/Cyclic Olefin Alternating Copolymers to Silicon Substrates: Improved Materials for 193 nm LithographyAnthony J. Pasquale, Timothy E. Long, Hoa Truong · 2002 · The Journal of Adhesion
- Alicyclic photoresists for CO2-based next-generation microlithography: A tribute to James E. McGrathMary Kate Boggiano, David G. Vellenga, Ruben Carbonell · 2006 · Polymer
- Synthesis and evaluation of methyl methacrylate copolymers and terpolymers as electron beam resists. II. Methyl methacrylate copolymers and terpolymers containing aromatic ringsIvan Gitsov, Olga G. Todorova · 1992 · Journal of Applied Polymer Science
- Fabrication technique of a nonlinear optical structure using optical polymeric films by direct electron-beam irradiationHideki Nakayama, H. Fujimura, Chikara Egami · 1998 · Applied Optics
- Fluorinated Chemically Amplified Dissolution Inhibitors for 157 nm NanolithographyZachary M. Fresco, Nicolas Bensel, Itai Suez · 2003 · Journal of Photopolymer Science and Technology
- Review on interfacial bonding enhancement of inorganic thin film on polymer substrate by ion and plasma sourceRuo Xuen Lim, Meow Siang Khor, Kuan Yew Cheong · 2023 · International Journal of Adhesion and Adhesives
- EUVL compatible LER solutions using functional block copolymersHan‐Hao Cheng, Imelda Keen, Anguang Yu, Ya‐Mi Chuang, Idriss Blakey, Kevin S. Jack, Michael J. Leeson, Todd R. Younkin, Andrew K. Whittaker · 2012 · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
- Polybenzoxazole/graphene nanocomposite for etching hardmaskS.W. Shin, Jong Seon Kim, Seon Joon Kim · 2019 · Journal of Industrial and Engineering Chemistry
- Dry-Etching Durability of Copolymers and Polymer Blends of Vinylnaphthalene or α-Methylstyrene with Methyl MethacrylateMasahito Kushida, Yoshiaki Imaizumi, Kieko Harada · 1995 · Japanese Journal of Applied Physics
- Enhancing the dry etch resistance of polymethyl methacrylate patterned with electron beam lithographyDaniel J. Carbaugh, Sneha G. Pandya, Jason T. Wright, Savaş Kaya, Faiz Rahman · 2017 · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
- Visualization of organic/inorganic hybridization of UV-cured films with trimethylaluminum by scanning transmission electron microscopy and energy dispersive x-ray spectroscopyMasaru Nakagawa, Takuya Uehara, Yuki Ozaki · 2018 · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
- UV Characteristics and Performance as Positive-Working Deep, Mid, and Near UV Resists of Phenyl Isopropenyl Ketone CopolymersKazuyuki Sugita, Nobuo Ueno, Kieko Harada · 1993 · Polymer Journal
- Status and future of DUV photoresists for the semiconductor industryJames W. Thackeray · 1998 · Microelectronic Engineering
- Ag-Diffusion in the Organic Semiconductor DiindenoperyleneM. Scharnberg, Jingping Hu, Jörn Kanzow · 2005 · Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum
- Energy Quenching Effects on Dry-Etching Durability of Copolymers and Polymer Blends of Vinylnaphthalene or α-Methyl Styrene with Methyl MethacrylateMasahito Kushida, Y Yoshida, Kieko Harada · 1998 · Japanese Journal of Applied Physics
- Material Characterization Required for Designing Satellites from Fiber-Reinforced PolymersEsha Esha, Joachim M. Hausmann · 2023 · Journal of Composites Science
- Evaluating spin-on carbon materials at low temperatures for high wiggling resistanceMichael Weigand, Vandana N. Krishnamurthy, Yubao Wang · 2013 · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
- Novel Diamantane Polymer Platform for Resist ApplicationsMurirathna Padmanaban, Srinivasan Chakrapani, Guanyang Lin et al. · 2007 · Journal of Photopolymer Science and Technology
- Differences in erosion mechanism and selectivity between Ti and TiN in fluorocarbon plasmas for dielectric etchF. Weilnboeck, Elliot A. J. Bartis, Sivan Shachar · 2012 · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
- Relationship between deprotection and film thickness loss during plasma etching of positive tone chemically amplified resistsArpan P. Mahorowala, David R. Medeiros · 2001 · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
- Molecular Design of o-Nitrobenzyl Phenol Ether for Photo-deprotection Resist; Challenge to half-pitch 22nm using Near-field LithographyToshiki Ito, Akira Terao, Yasuhisa Inao · 2007 · Journal of Photopolymer Science and Technology
- Patterning Challenges in MicroelectronicsSébastien Barnola, N. Possémé, S. Landis · 2017 · Elsevier eBooks
- Etch considerations for directed self-assembly patterning using capacitively coupled plasmaVinayak Rastogi, Peter L. G. Ventzek, Alok Ranjan · 2018 · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
- Perpendicular SiO2 cylinders fabricated from a self-assembled block copolymer as an adaptable platformYuri Yamada, Kota Ito, Atsushi Miura · 2018 · European Polymer Journal
- Ion Bombardment-Induced Nanoarchitectonics on Polyetheretherketone Surfaces for Enhanced Nanoporous Bioactive ImplantsTeresa Aditya, Andrea Mesa Restrepo, Ana Civantos, Ming Kit Cheng, Camilo Jaramillo, Viviana M. Posada, Zachariah Koyn, Jean Paul Allain · 2023 · ACS Applied Bio Materials
- Enhancing the dry-etch durability of photoresist masks: A review of the main approachesС. В. Зеленцов, Nadezda V. Zelentsova, A. N. Kolesov · 2007 · Russian Microelectronics
- Pattern Transfer of Nanomasks Based on Diblock Copolymers Self-Assembling through Reactive Ion EtchingCristina Garozzo, Corrado Bongiorno, Antonino La Magna · 2012 · ECS Journal of Solid State Science and Technology
- Experimental and Numerical Study of Submonolayer Sputter Deposition of Polystyrene Fragments on Silver for the Storing Matter TechniqueCanan Turgut, Godhuli Sinha, Lotta Mether · 2014 · Analytical Chemistry
- Optical and electrical characterizations of a single step ion beam milling mesa devices of chloride passivated PbS colloidal quantum dots based filmElad Hechster, Arthur Shapiro, Efrat Lifshitz · 2016 · AIP Advances
- Carbon Nanotubes as Etching Masks for the Formation of Polymer NanostructuresWoongbin Yim, S. J. Park, Sung Yong Han · 2017 · ACS Applied Materials & Interfaces
- Synthesis and self-assembly of high-χ poly(4-tertbutylstyrene)-block-poly(2-hydroxyethylmethacrylate)Caleb L. Breaux, Brandon L. Sharp, Peter J. Ludovice, Clifford L. Henderson, Haibo Li, Bing Li, Mark O. Neisser · 2019 · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
- Interaction of long‐lived reactive species from cold atmospheric pressure plasma with polymers: Role of macromolecular structure and deep modification of aromatic polymersPingshan Luan, Gottlieb S. Oehrlein · 2019 · Plasma Processes and Polymers
- Plasma etch properties of organic BARCsRunhui Huang, Michael Weigand · 2008 · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
- Effect of a deprotection group on acrylic photoresistShih-Chi Fu, K. H. Hsieh, L. A. Wang · 1999 · Journal of Polymer Research
- High Selective Plasma Etching of PMMA to PSKazuma Shimomukai, Hiroaki Kawata, Masaaki Yasuda · 2015 · Journal of Photopolymer Science and Technology
- Photoresists and Advanced PatterningCliff Henderson · 2012 · Elsevier eBooks
- Improvement of the wiggling profile of spin-on carbon hard mask by H2 plasma treatmentM. Tadokoro, Kazumasa Yonekura, Kazunori Yoshikawa · 2008 · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena
- Thermolysis of Polymethacrylates for 193 nm ResistToshiyuki Ogata, Kohei Kasai, Shogo Matsumaru · 2006 · Journal of Photopolymer Science and Technology
- Selective Laser Ablation in Resists and Block Copolymers for High Resolution Lithographic PatterningDeirdre L. Olynick, Pradeep N. Perera, Adam M. Schwartzberg et al. · 2015 · Journal of Photopolymer Science and Technology
- First Demonstration of Single-Mode Polymer Optical Waveguides with Circular Cores for Fiber-to-Waveguide Coupling in 3D Glass Photonic InterposersRui Zhang, Fuhan Liu, Venky Sundaram, Rao Tummala · 2017 · IEEE Electronic Components and Technology Conference (ECTC)
- Fullerene Nanocomposite Resists for NanolithographyT. Ishii, Kiyotaka Shigehara · 2009 · Springer eBooks
- Synthesis of well-defined norbornene–lactone-functionalized polymers via ATRPTakuma Miyazaki, Boyong Xue, Kazufumi Kohno · 2009 · Polymer Bulletin
- Polymers of norbornenyl‐4‐phenol: Dissolution rate characteristics, positive tone photo‐patterning, and polymer propertiesPaul J. Evans, Chad Brick, Andrew Bell · 2017 · Journal of Applied Polymer Science
- Hybrid dendritic-linear graft copolymers: Steric considerations in ?coupling to? approachArchana Desai, Nathan Atkinson, Felix Rivera, Wayne Devonport, Ian D. Rees, Steven E. Branz, Craig J. Hawker · 2000 · Journal of Polymer Science Part A Polymer Chemistry
- Dry development for a directed self-assembly lithography hole-shrink process using CO/H2 plasmaMitsuhiro Omura, Tsubasa Imamura, Hiroshi M Yamamoto · 2015 · Journal of Micro/Nanopatterning Materials and Metrology
- Lithographic ResistsWilliam D. Hinsberg, Gregory M. Wallraff · 2012 · Encyclopedia of Polymer Science and Technology
- Characterization of a new polarity switching negative tone e-beam resist for 14nm and 10nm logic node mask fabrication and beyondTom Faure, Amy E. Zweber, Luisa D. Bozano et al. · 2014 · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
- Design considerations for ultraviolet-nanoimprint lithography resistsKazuyuki Usuki, Satoshi Wakamatsu, Tadashi Oomatsu · 2012 · Journal of Micro/Nanopatterning Materials and Metrology
- Effect of oxygen plasma treatments on the structural and optical properties of polyimide filmsAhmed A. Atta, Sobhia M. El-Sayed · 2015 · Journal of Engineering and Technology
- Advanced LithographyAlberto Roncaglia · 2022 · Springer handbooks
- Etching Efficiency of Polymethacrylates for Monochromatic Low Energy Ion BeamsShu Seki, Satoshi Kawachi, Seiichi Tagawa · 2005 · Journal of Photopolymer Science and Technology
- Synthesis and characterization of chiral polyacrylates and their applications as positive tone photoresistsHsien‐Jung Hung, Po‐Chih Yang, Jui‐Hsiang Liu · 2008 · Journal of Applied Polymer Science
- Novel electron beam resist material using hydrophilic protecting groupSatoshi Saito, Tetsuro Nakasugi · 2005 · Microelectronic Engineering