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Electromechanical Impedance Modeling for Adhesively Bonded Piezo-Transducers

Bhalla, Suresh, Soh, Chee Kiong·2004·Journal of Intelligent Material Systems and Structures

Abstract

The electromechanical impedance (EMI) technique for structural health monitoring (SHM) and nondestructive evaluation (NDE) employs piezoelectric-ceramic (PZT) patches, which are surface bonded to the monitored structures using adhesives. The adhesive forms a finitely thick, permanent interfacial layer between the host structure and the patch. Hence, the force transmission between the structure and the patch occurs through the bond layer, via shear mechanism, invariably causing shear lag. However, the impedance models developed so far ignore the associated shear lag and idealize the force transfer to occur at the ends of the patch. This paper analyses the mechanism of force transfer through the bond layer and presents a step-by-step derivation to integrate the shear lag effect into impedance formulations, both one-dimensional and two-dimensional. Further, using the integrated model, the influence of various parameters (associated with the bond layer) on the electromechanical admittance response is studied by means of a parametric study. It is found that the bond layer can significantly modify the measured electromechanical admittance if not carefully controlled during the installation of the PZT patch.

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Metadata

Authors
Bhalla, S., & Soh, C. K.
Venue
Journal of Intelligent Material Systems and Structures
Published
2004-12
Volume
15
Issue
12
Pages
955-972
ISSN
  • 1045-389X (ISSN-L)
  • 1530-8138
OpenAlex
W2061749878
Cited by
231
References
0
FWCI
7.30
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Electromechanical Impedance Modeling for Adhesively Bonded Piezo-Transducers. https://app.cochat.ai/papers/10.1177/1045389x04046309
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Bhalla, S., & Soh, C. K. (2004). Electromechanical Impedance Modeling for Adhesively Bonded Piezo-Transducers. Journal of Intelligent Material Systems and Structures. https://doi.org/10.1177/1045389x04046309

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