The DOI matches its Crossref record; 35 of the 35 references it cites were found in a registry or an index.
Ellipsometry at the Nanoscale
Overview
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Citations
Cites
The mean free path of electrons in metals
Sondheimer, E. H. (1952) · Advances in Physics · doi:10.1080/00018735200101151 · Cited by 2,614
Parameterization of the optical functions of amorphous materials in the interband region
Jellison, G. E., & Modine, F. A. (1996) · Applied Physics Letters · doi:10.1063/1.118064 · Cited by 2,337
Spectroscopic Ellipsometry: Principles and Applications
Fujiwara, H. (2007) · Cited by 1,558
Interpretation of Mueller matrices based on polar decomposition
Lu, S.-Y., & Chipman, R. A. (1996) · Journal of the Optical Society of America A · doi:10.1364/josaa.13.001106 · Cited by 1,409
Mueller matrix dual-rotating retarder polarimeter
Goldstein, D. H. (1992) · Applied Optics · doi:10.1364/ao.31.006676 · Cited by 375
Compain, E., Poirier, S., & Drevillon, B. (1999) · Applied Optics · doi:10.1364/ao.38.003490 · Cited by 369
Optimization of retardance for a complete Stokes polarimeter
Sabatke, D. S., Descour, M. R., Dereniak, E. L., Sweatt, W. C., Kemme, S. A., & Phipps, G. S. (2000) · Optics Letters · doi:10.1364/ol.25.000802 · Cited by 366
Tyo, J. S. (2002) · Applied Optics · doi:10.1364/ao.41.000619 · Cited by 347
Data analysis for spectroscopic ellipsometry
Jellison, G. E. (1993) · Thin Solid Films · doi:10.1016/0040-6090(93)90298-4 · Cited by 339
Azzam, R. M. A. (1978) · Journal of the Optical Society of America · doi:10.1364/josa.68.001756 · Cited by 277
Metadata
- Venue
- Springer eBooks
- Publisher
- Springer Berlin Heidelberg
- Published
- 2013
- OpenAlex
- W599844041
- Cited by
- 267
- References
- 35
- FWCI
- 14.70
- Type
- book
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
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How to cite
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- CoChat. (2026). Citation check: Ellipsometry at the Nanoscale. https://app.cochat.ai/papers/10.1007/978-3-642-33956-1
- The paper
- Ellipsometry at the Nanoscale. (2013). Springer eBooks. https://doi.org/10.1007/978-3-642-33956-1
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
