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Measurement of the electron-phonon coupling factor dependence on film thickness and grain size in Au, Cr, and Al
Abstract
Femtosecond thermoreflectance data for thin films and bulk quantities of Au, Cr, and Al are compared with the parabolic two-step thermal diffusion model for the purpose of determining the electron-phonon coupling factor. The thin films were evaporated and sputtered onto different substrates to produce films that vary structurally. The measurement of the electron-phonon coupling factor is shown to be sensitive to grain size and film thickness. The thin-film thermoreflectance data are compared with that of the corresponding bulk material and to a theoretical model relating the coupling rate to the grain-boundary scattering and size effects on the mean free path of the relevant energy carrier.
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Citations
Cited by
Lin, Z., Zhigilei, L. V., & Celli, V. (2008) · Physical Review B · doi:10.1103/physrevb.77.075133 · Cited by 1,444
Combined atomistic-continuum modeling of short-pulse laser melting and disintegration of metal films
Ivanov, D. S., & Zhigilei, L. V. (2003) · Physical Review B · doi:10.1103/physrevb.68.064114 · Cited by 788
Thermometry and Thermal Transport in Micro/Nanoscale Solid-State Devices and Structures
Cahill, D. G., Goodson, K., & Majumdar, A. (2002) · Journal of Heat Transfer · doi:10.1115/1.1454111 · Cited by 611
Different sized luminescent gold nanoparticles
Zheng, J., Zhou, C., Yu, M., & Liu, J. (2012) · Nanoscale · doi:10.1039/c2nr31192e · Cited by 600
Regner, K. T., Wei, L. C., & Malen, J. A. (2015) · Journal of Applied Physics · doi:10.1063/1.4937995 · Cited by 26
Metadata
- Authors
- Hostetler, J. L., Smith, A. N., Czajkowsky, D. M., & Norris, P. M.
- Venue
- Applied Optics
- Publisher
- Optica Publishing Group
- Published
- 1999-06-01
- Volume
- 38
- Issue
- 16
- Pages
- 3614
- ISSN
- 0003-6935 (ISSN-L)
- 1539-4522
- OpenAlex
- W2052902194
- Cited by
- 176
- References
- 0
- FWCI
- 1.43
- Type
- journal article
- Language
- en
- Open access
- closed
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- CoChat. (2026). Citation check: Measurement of the electron-phonon coupling factor dependence on film thickness and grain size in Au, Cr, and Al. https://app.cochat.ai/papers/10.1364/ao.38.003614
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- Hostetler, J. L., Smith, A. N., Czajkowsky, D. M., & Norris, P. M. (1999). Measurement of the electron-phonon coupling factor dependence on film thickness and grain size in Au, Cr, and Al. Applied Optics. https://doi.org/10.1364/ao.38.003614
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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