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Measurement of the electron-phonon coupling factor dependence on film thickness and grain size in Au, Cr, and Al

Hostetler, John L., Smith, Andrew N., Czajkowsky, Daniel M., Norris, Pamela M.·1999·Applied Optics

Abstract

Femtosecond thermoreflectance data for thin films and bulk quantities of Au, Cr, and Al are compared with the parabolic two-step thermal diffusion model for the purpose of determining the electron-phonon coupling factor. The thin films were evaporated and sputtered onto different substrates to produce films that vary structurally. The measurement of the electron-phonon coupling factor is shown to be sensitive to grain size and film thickness. The thin-film thermoreflectance data are compared with that of the corresponding bulk material and to a theoretical model relating the coupling rate to the grain-boundary scattering and size effects on the mean free path of the relevant energy carrier.

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Metadata

Authors
Hostetler, J. L., Smith, A. N., Czajkowsky, D. M., & Norris, P. M.
Venue
Applied Optics
Published
1999-06-01
Volume
38
Issue
16
Pages
3614
ISSN
  • 0003-6935 (ISSN-L)
  • 1539-4522
OpenAlex
W2052902194
Cited by
176
References
0
FWCI
1.43
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Measurement of the electron-phonon coupling factor dependence on film thickness and grain size in Au, Cr, and Al. https://app.cochat.ai/papers/10.1364/ao.38.003614
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Hostetler, J. L., Smith, A. N., Czajkowsky, D. M., & Norris, P. M. (1999). Measurement of the electron-phonon coupling factor dependence on film thickness and grain size in Au, Cr, and Al. Applied Optics. https://doi.org/10.1364/ao.38.003614

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Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.