The DOI matches its Crossref record.
Optical Constants and Reflectance and Transmittance of Evaporated Aluminum in the Visible and Ultraviolet*
Abstract
The paper presents new measurements of the optical constants and of the reflectance and transmittance of evaporated aluminum films produced from the purest grade of aluminum with extremely fast evaporation at about 10−5 mm Hg. The optical constants were determined by Drude’s polarimetric method from opaque films and by reflectance, transmittance, and true thickness measurements of semitransparent films. The following results were obtained. λ (mμ)220260300340380436492546578650n0.140.190.250.310.370.470.640.820.931.30k2.352.853.333.804.254.845.505.996.337.11R%91.892.092.192.392.692.692.291.691.590.7For extremely fast evaporated films the optical constants were found to remain unchanged down to film thicknesses of less than 100 A. Data are given on the reflectance and transmittance of semitransparent aluminum films on glass and fused quartz as a function of wavelength from 220 mμ to 650 mμ.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Mihailetchi, V. D., Xie, H. X., de Boer, B., Koster, L. J. A., & Blom, P. W. M. (2006) · Advanced Functional Materials · doi:10.1002/adfm.200500420 · Cited by 1,283
Near-Field Scanning Optical Microscopy
Dunn, R. C. (1999) · Chemical Reviews · doi:10.1021/cr980130e · Cited by 508
Infrared Reflectance of Evaporated Aluminum Films
Bennett, H. E., Bennett, J. M., & Ashley, E. J. (1962) · Journal of the Optical Society of America · doi:10.1364/josa.52.001245 · Cited by 75
Ellipsometric Techniques to Study Surfaces and Thin Films
Rzhanov, A. V., & Svitashev, K. K. (1979) · Advances in Electronics and Electron Physics · doi:10.1016/s0065-2539(08)60765-9 · Cited by 17
Metadata
- Authors
- Hass, G., & Waylonis, J. E.
- Venue
- Journal of the Optical Society of America
- Publisher
- Optica Publishing Group
- Published
- 1961-07-01
- Volume
- 51
- Issue
- 7
- Pages
- 719
- ISSN
- 0030-3941 (ISSN-L)
- OpenAlex
- W2134951282
- Cited by
- 245
- References
- 0
- FWCI
- 8.37
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Optical Constants and Reflectance and Transmittance of Evaporated Aluminum in the Visible and Ultraviolet*. https://app.cochat.ai/papers/10.1364/josa.51.000719
- The paper
- Hass, G., & Waylonis, J. E. (1961). Optical Constants and Reflectance and Transmittance of Evaporated Aluminum in the Visible and Ultraviolet*. Journal of the Optical Society of America. https://doi.org/10.1364/josa.51.000719
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
