The DOI matches its Crossref record; 9 of the 11 references it cites were found in a registry or an index.
Simultaneous measurement of refractive index and thickness by combining low-coherence interferometry and confocal optics
Open accessAbstract
We propose and demonstrate novel methods that enable simultaneous measurements of the phase index, the group index, and the geometrical thickness of an optically transparent object by combining optical low-coherence interferometer and confocal optics. The low-coherence interferometer gives information relating the group index with the thickness, while the confocal optics allows access to the phase index related with the thickness of the sample. To relate these, two novel methods were devised. In the first method, the dispersion-induced broadening of the low-coherence envelop signal was utilized, and in the second method the frequency derivative of the phase index was directly obtained by taking the confocal measurements at several wavelengths. The measurements were made with eight different samples; B270, CaF2, two of BK7, two of fused silica, cover glass, and cigarette cover film. The average measurement errors of the first and the second methods were 0.123% and 0.061% in the geometrical thickness, 0.133% and 0.066% in the phase index, and 0.106% and 0.057% in the group index, respectively.
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Refractive index tomography of turbid media by bifocal optical coherence refractometry
Zvyagin, A. V., Silva, D., Alexandrov, S., Hillman, T. R., Armstrong, J. J., Tsuzuki, T., & Sampson, D. D. (2003) · Optics Express · doi:10.1364/oe.11.003503 · Cited by 64
Bifocal optical coherenc refractometry of turbid media
Alexandrov, S., Zvyagin, A. V., Silva, D., & Sampson, D. D. (2003) · Optics Letters · doi:10.1364/ol.28.000117 · Cited by 32
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Cited by
A Review of Thickness Measurements of Thick Transparent Layers Using Optical Interferometry
Park, J., Kim, J.-A., Ahn, H., Bae, J., & Jin, J. (2019) · International Journal of Precision Engineering and Manufacturing · doi:10.1007/s12541-019-00105-0 · Cited by 114
Optical Coherence Tomography Enabling Non Destructive Metrology of Layered Polymeric GRIN Material
Meemon, P., Yao, J., Lee, K., Thompson, K. P., Ponting, M. T., Baer, E., & Rolland, J. P. (2013) · Scientific Reports · doi:10.1038/srep01709 · Cited by 63
Na, J., Choi, H. Y., Choi, E. S., Lee, C., & Lee, B. H. (2009) · Applied Optics · doi:10.1364/ao.48.002461 · Cited by 62
Self-citationZhou, Y., Chan, K. K. H., Lai, T., & Tang, S. (2012) · Biomedical Optics Express · doi:10.1364/boe.4.000038 · Cited by 62
Thickness measurement of transparent plates by a self-mixing interferometer
Fathi, M. T., & Donati, S. (2010) · Optics Letters · doi:10.1364/ol.35.001844 · Cited by 53
Metadata
- Authors
- Kim, S., Na, J., Kim, M. J., & Lee, B. H.
- Affiliations
- Gwangju Institute of Science and Technology (KR)
- Venue
- Optics Express
- Publisher
- Optica Publishing Group
- Published
- 2008-04-04
- Volume
- 16
- Issue
- 8
- Pages
- 5516
- ISSN
- 1094-4087 (ISSN-L)
- OpenAlex
- W2151863407
- Cited by
- 123
- References
- 11
- Citations by year
- 2026: 2 · 2025: 4 · 2024: 6 · 2023: 6 · 2022: 6 · 2021: 7 · 2020: 6 · 2019: 10 · 2018: 9 · 2017: 13 · 2016: 4 · 2015: 11 · 2014: 8 · 2013: 13 · 2012: 4
- FWCI
- 6.71
- Type
- journal article
- Language
- en
- Open access
- gold
- doi.org
- Locations
- Optics Express (publishedVersion)
- PubMed (publishedVersion)
- Topics
- Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Optical measurement and interference techniques
- Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Digital Holography and Microscopy
- Physical Sciences › Engineering › Biomedical Engineering › Optical Coherence Tomography Applications
- Keywords
- refractive index measurement, optical thickness measurement, low-coherence interferometry, group index, simultaneous measurement, transparent objects
- MeSH terms
- Computer Simulation, Equipment Design, Interferometry, Lenses, Materials Testing, Models, Theoretical, Refractometry, Computer-Aided Design, Microscopy, Confocal, Equipment Failure Analysis
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