Cited by 124Optical measurement and interference techniquesDigital Holography and MicroscopyOptical Coherence Tomography Applications

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Simultaneous measurement of refractive index and thickness by combining low-coherence interferometry and confocal optics

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Kim, Seokhan, Na, Jihoon, Kim, Myoung Jin, Lee, Byeong Ha·2008·Optics Express

DOI 10.1364/oe.16.005516

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Abstract

We propose and demonstrate novel methods that enable simultaneous measurements of the phase index, the group index, and the geometrical thickness of an optically transparent object by combining optical low-coherence interferometer and confocal optics. The low-coherence interferometer gives information relating the group index with the thickness, while the confocal optics allows access to the phase index related with the thickness of the sample. To relate these, two novel methods were devised. In the first method, the dispersion-induced broadening of the low-coherence envelop signal was utilized, and in the second method the frequency derivative of the phase index was directly obtained by taking the confocal measurements at several wavelengths. The measurements were made with eight different samples; B270, CaF2, two of BK7, two of fused silica, cover glass, and cigarette cover film. The average measurement errors of the first and the second methods were 0.123% and 0.061% in the geometrical thickness, 0.133% and 0.066% in the phase index, and 0.106% and 0.057% in the group index, respectively.

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Authors: Kim, S., Na, J., Kim, M. J., & Lee, B. H.
Affiliations: Gwangju Institute of Science and Technology (KR)
ORCID: Na, Jihoon
Lee, Byeong Ha
Venue: Optics Express
Publisher: Optica Publishing Group
Published: 2008-04-04
Volume: 16
Issue: 8
Pages: 5516
ISSN: 1094-4087 (ISSN-L)
DOI: 10.1364/oe.16.005516
OpenAlex: W2151863407
Cited by: 123
References: 11
Citations by year: 2026: 2 · 2025: 4 · 2024: 6 · 2023: 6 · 2022: 6 · 2021: 7 · 2020: 6 · 2019: 10 · 2018: 9 · 2017: 13 · 2016: 4 · 2015: 11 · 2014: 8 · 2013: 13 · 2012: 4
FWCI: 6.71
Type: journal article
Language: en
Open access: gold
doi.org
Licence: doi.org/10.1364/OA_License_v1#VOR-OA (vor)
opg.optica.org/policies/opg-tdm-policy.json (tdm)
Locations: Optics Express (publishedVersion)
PubMed (publishedVersion)
Topics: Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Optical measurement and interference techniques
Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Digital Holography and Microscopy
Physical Sciences › Engineering › Biomedical Engineering › Optical Coherence Tomography Applications
Keywords: refractive index measurement, optical thickness measurement, low-coherence interferometry, group index, simultaneous measurement, transparent objects
MeSH terms: Computer Simulation, Equipment Design, Interferometry, Lenses, Materials Testing, Models, Theoretical, Refractometry, Computer-Aided Design, Microscopy, Confocal, Equipment Failure Analysis

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Simultaneous measurement of refractive index and thickness by combining low-coherence interferometry and confocal optics

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