Cited by 41Advancements in Photolithography TechniquesAdvanced optical system designVLSI and FPGA Design Techniques

The DOI matches its Crossref record; 29 of the 29 references it cites were found in a registry or an index.

Initialization for robust inverse synthesis of phase-shifting masks in optical projection lithography

Open access

Abstract

The continuous shrinkage of minimum feature size in integrated circuit (IC) fabrication incurs more and more serious distortion in the optical projection lithography process, generating circuit patterns that deviate significantly from the desired ones. Conventional resolution enhancement techniques (RETs) are facing critical challenges in compensating such increasingly severe distortion. In this paper, we adopt the approach of inverse lithography in the mask design, which is a branch of design methodology to treat it as an inverse mathematical problem. We focus on using pixel-based algorithms to design alternating phase-shifting masks with minimally distorted output, with the goal that the patterns generated should have high contrast and low dose sensitivity. This is achieved with a dynamic-programming-based initialization scheme to pre-assign phases to the layout when alternating phase-shifting masks are used. Pattern fidelity and worst case slopes are shown to improve with this initialization scheme, which are important for robustness considerations.

Overview

Integrity signals

Registry

Crossref · 10.1364/oe.16.014746

Cites

29 of 29 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Verification

Claims the paper makes

We couldn’t retrieve this paper’s full text, so its claims and self-check weren’t run. The registry and citation checks still apply.

Citations

Cites

Show all 29 references

Research works printed but not linked: 4

  1. Mack, 2004, Proc. SPIE, 5754, 1
  2. Liu, 1990, Proc. SPIE, 1264, 410
  3. Abrams, 2006, Proc. SPIE, 6154, 534
  4. Berman, 2000, IEEE Trans., 19, 175

Cited by

Sorted by citations

See all 41

Metadata

Authors
Chan, S. H., Wong, A. K., & Lam, E. Y.
Affiliations
University of Hong Kong (HK)
Venue
Optics Express
Published
2008-09-04
Volume
16
Issue
19
Pages
14746
ISSN
1094-4087 (ISSN-L)
OpenAlex
W2065950608
Cited by
41
References
29
Citations by year
2026: 1 · 2024: 3 · 2023: 2 · 2022: 3 · 2021: 1 · 2020: 1 · 2014: 2 · 2013: 2 · 2012: 7
FWCI
5.68
Type
journal article
Language
en
Open access
Locations
  • Optics Express (publishedVersion)
  • PubMed (publishedVersion)
  • The HKU Scholars Hub (University of Hong Kong) (submittedVersion)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advancements in Photolithography Techniques
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Advanced optical system design
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › VLSI and FPGA Design Techniques
Keywords
inverse lithography technology, phase-shifting masks, alternating phase-shifting masks, optical projection lithography, mask design, initialization scheme, dynamic programming, resolution enhancement techniques, pattern fidelity, dosage sensitivity, pattern distortion, inverse problems
MeSH terms
Algorithms, Image Interpretation, Computer-Assisted, Lasers, Lighting, Photography

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Initialization for robust inverse synthesis of phase-shifting masks in optical projection lithography. https://app.cochat.ai/papers/10.1364/oe.16.014746
The paper
Chan, S. H., Wong, A. K., & Lam, E. Y. (2008). Initialization for robust inverse synthesis of phase-shifting masks in optical projection lithography. Optics Express. https://doi.org/10.1364/oe.16.014746