The DOI matches its Crossref record; 24 of the 24 references it cites were found in a registry or an index.
A Two-Stage Industrial Defect Detection Framework Based on Improved-YOLOv5 and Optimized-Inception-ResnetV2 Models
Open accessAbstract
Aiming to address the currently low accuracy of domestic industrial defect detection, this paper proposes a Two-Stage Industrial Defect Detection Framework based on Improved-YOLOv5 and Optimized-Inception-ResnetV2, which completes positioning and classification tasks through two specific models. In order to make the first-stage recognition more effective at locating insignificant small defects with high similarity on the steel surface, we improve YOLOv5 from the backbone network, the feature scales of the feature fusion layer, and the multiscale detection layer. In order to enable second-stage recognition to better extract defect features and achieve accurate classification, we embed the convolutional block attention module (CBAM) attention mechanism module into the Inception-ResnetV2 model, then optimize the network architecture and loss function of the accurate model. Based on the Pascal Visual Object Classes 2007 (VOC2007) dataset, the public dataset NEU-DET, and the optimized dataset Enriched-NEU-DET, we conducted multiple sets of comparative experiments on the Improved-YOLOv5 and Inception-ResnetV2. The testing results show that the improvement is obvious. In order to verify the superiority and adaptability of the two-stage framework, we first test based on the Enriched-NEU-DET dataset, and further use AUBO-i5 robot, Intel RealSense D435 camera, and other industrial steel equipment to build actual industrial scenes. In experiments, a two-stage framework achieves the best performance of 83.3% mean average precision (mAP), evaluated on the Enriched-NEU-DET dataset, and 91.0% on our built industrial defect environment.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
The source backs part of the claim, not all of it — or backs it for a different population, condition or comparison.
In the citing paper
“In addition, in the actual production environment, the interference of the environment is serious such as uneven lighting, light reflection, noise, motion blur, the existence of many false defects, and a low contrast of background clutter, resulting in the recognition effect being often less than ideal [8].”
From Steel Surface Defect Recognition: A Survey (2022) · cites this paper as [8]
Experimental — accuracy not yet measured
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Deep Residual Learning for Image Recognition
He, K., Zhang, X., Ren, S., & Sun, J. (2016) · 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2016.90 · Cited by 235,474
Rethinking the Inception Architecture for Computer Vision
Szegedy, C., Vanhoucke, V., Ioffe, S., Shlens, J., & Wojna, Z. (2016) · 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2016.308 · Cited by 32,138
(2016) · Cited by 31,590
CBAM: Convolutional Block Attention Module
Woo, S., Park, J., Lee, J.-Y., & Kweon, I. S. (2018) · Lecture Notes in Computer Science · doi:10.1007/978-3-030-01234-2_1 · Cited by 25,853
SSD: Single Shot MultiBox Detector
Liu, W., Anguelov, D., Erhan, D., Szegedy, C., Reed, S., Fu, C.-Y., & Berg, A. C. (2016) · Lecture Notes in Computer Science · doi:10.1007/978-3-319-46448-0_2 · Cited by 22,128
The pascal visual object classes (VOC) challenge
Everingham, M., Van Gool, L., Williams, C. K. I., Winn, J., & Zisserman, A. (2010) · International Journal of Computer Vision · doi:10.1007/s11263-009-0275-4 · Cited by 19,599
Spatial Pyramid Pooling in Deep Convolutional Networks for Visual Recognition
He, K., Zhang, X., Ren, S., & Sun, J. (2015) · IEEE Transactions on Pattern Analysis and Machine Intelligence · doi:10.1109/tpami.2015.2389824 · Cited by 11,971
YOLOv4: Optimal Speed and Accuracy of Object Detection
Bochkovskiy, A., Wang, C.-Y., & Liao, H.-Y. M. (2020) · arXiv · doi:10.48550/arxiv.2004.10934 · Cited by 10,307
ECA-Net: Efficient Channel Attention for Deep Convolutional Neural Networks
Wang, Q., Wu, B., Zhu, P., Li, P., Zuo, W., & Hu, Q. (2020) · 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr42600.2020.01155 · Cited by 9,641
Inception-v4, Inception-ResNet and the Impact of Residual Connections on Learning
Szegedy, C., Ioffe, S., Vanhoucke, V., & Alemi, A. (2017) · Proceedings of the AAAI Conference on Artificial Intelligence · doi:10.1609/aaai.v31i1.11231 · Cited by 4,636
Flagged first, then by citations
Research works printed but not linked: 8
- Bo, 2019, Knowledge of ultra-high-strength steel used in aerospace and other industries, Heat Treat., 34, 61
- Zhang, 2019, Ultrasound image defect classification based on genetic algorithm optimized support vector machine, Acta Metrol., 40, 887
- Xu, 2019, A random forest classification algorithm for polarized SAR images with comprehensive multi-features, J. Remote Sens., 23, 685
- Wu, 2000, Machine vision and nondestructive inspection of steel plate surface defects, Nondestruct. Test., 22, 13
- Guo, 2013, Surface defect automatic detection algorithm based on principal component analysis, Comput. Eng., 39, 216
- Liu, 2019, Improved YOLOV3 target recognition algorithm based on adaptive eged optimization, Microelectron. Comput., 36, 59
- Rosebrock, 2017, Deep Learning for Computer Vision with Python Practitioner Bundle, Md. PyImage Search, 1, 57
- Akiba, T., Suzuki, S., and Fukuda, K. (2017). Extremely large minibatch SGD: Training ResNet-50 on ImageNet in 15 minutes. arXiv.
Cited by
Sorted by citations
Items 101–125 of 125
Zurita, M.-J., Riofrío, D., Pérez, N., Romo, D., Benítez, D. S., Moyano, R. F., Grijalva, F., & Baldeon-Calisto, M. (2023) · Communications in computer and information science · doi:10.1007/978-3-031-48415-5_7
Steel surface defect detection based on lightweight model
He, L., Huang, J., Li, X., & Guan, B. (2023) · Youth Academic Annual Conference of Chinese Association of Automation (YAC) · doi:10.1109/yac59482.2023.10401449
Detection of Suspicious Front Yard-View Burglary Aided with Moving Service
Wang, S., Leung, M. K. H., Khor, S. W., & Sultan, H. (2024) · Frontiers in artificial intelligence and applications · doi:10.3233/faia231397
Sensor Fusion-Based Target Prediction System for Virtual Testing of Automated Driving System
Weun, N. Y., Onn, L. K., Hong, C. J., & Aparow, V. R. (2024) · Lecture notes in networks and systems · doi:10.1007/978-981-99-8819-8_2
KGC-YOLOv5: A YOLOv5-based Method for Steel Surface Defects Detection
Chen, Y., Li, Z., & Meng, Y. (2023) · International Conference on Computer Science, Electronic Information Engineering and Intelligent Control Technology (CEI) · doi:10.1109/cei60616.2023.10528149
Self-citationSemi-supervised Lightweight Fabric Defect Detection
Dong, X., Liu, H., Luo, Y., Yan, Y., & Liang, J. (2024) · Lecture notes in computer science · doi:10.1007/978-981-97-8505-6_8
Zhang, X., Jia, Y., Zheng, Z., & Zheng, Y. (2025) · Communications in computer and information science · doi:10.1007/978-981-96-9949-0_39
Development of Shunt Connection Communication and Bimanual Coordination-Based Smart Orchard Robot
Yan, B., & Li, X. (2025) · Agronomy · doi:10.3390/agronomy15081801
Simulation of Industrial Product Surface Defect Detection Based on Faster R–CNN
Wen, H. (2025) · Journal of Advanced Manufacturing Systems · doi:10.1142/s0219686726500484
Research on Real-time Object Detection Algorithms for Elevator Intelligent Monitoring Scenarios
Huang, J., Lin, G., Dong, Z., & Feng, S. (2025) · International Conference on Computer and Multimedia Technology (ICCMT) · doi:10.1145/3757749.3757786
Ravi, A., & Kumari, G. R. N. (2025) · International Conference on Soft Computing for Security Applications (ICSCSA) · doi:10.1109/icscsa66339.2025.11171237
Muduli, D., Rahul, K. V., Durga, K. V., Naidu, A. V. S. C., Kumar, M. J., & Sharma, S. K. (2025) · Lecture notes in networks and systems · doi:10.1007/978-3-031-78922-9_27
DPFD-DETR: Directional Prior Guided Frequency Decomposition with Axial-Spatial Context Alignment
Zhang, C., Wu, W., Niu, H., Bao, S., & Wu, N. (2025) · Lecture notes in computer science · doi:10.1007/978-981-95-4378-6_7
Vitoonkijvanit, K., Sukvichai, K., Marukatat, S., & Isshiki, T. (2025) · Research, Invention, and Innovation Congress: Innovative Electricals and Electronics (RI2C) · doi:10.1109/ri2c67120.2025.11282592
Tao, Z., Wang, S., Ma, L., Gao, S., Liu, J., & Tuo, Y. (2026) · Lecture notes in electrical engineering · doi:10.1007/978-981-95-4053-2_26
Ran, X., Zhang, P., Zhao, L., Li, Z., & Zhong, K. (2026) · International Conference on Electrical Automation and Artificial Intelligence (ICEAAI) · doi:10.1109/iceaai68945.2026.11442583
Self-citationCEG-YOLO: A lightweight edge-optimized framework for in-field rice panicle counting
Gao, F., Gao, G., Guan, X., Xuan, G., Shao, Y., & Huang, X. (2026) · Smart Agricultural Technology · doi:10.1016/j.atech.2026.102205
Umamaheshwari, S., Krishanveni, R., Lingeswaran, G., Akshaya, V. S., Rajendran, A., & Shuriya, B. (2026) · International Conference on Artificial Intelligence and Machine Learning Applications Theme: Healthcare and Internet of Things (AIMLA) · doi:10.1109/aimla67915.2026.11522406
LOCALIZATION OF DEFECTIVE ZONES ON METAL SURFACES VIA CUMULATIVE PIXEL INTENSITY PROJECTION ANALYSIS
Vipshovsky, Y., & Hrytsiuk, Y. I. (2026) · Management Information System and Devises · doi:10.30837/0135-1710.2026.189.128
Dong, B., Zhang, X., Yan, C., Zhu, W., 侯灵敏, Feng, Y., & Lin, L. (2026) · Processes · doi:10.3390/pr14121892
Development of a Potato Seedling Detection Method and Platform for Field Emergence Monitoring
Lv, D., Wu, M., Zhang, T., Yang, R., Zhang, J., & Liu, W. (2026) · American Journal of Potato Research · doi:10.1007/s12230-026-10078-2
Maitri, S. N., & Chakre, R. R. (2026) · Psychiatry Research Neuroimaging · doi:10.1016/j.pscychresns.2026.112341
Seeing the unseen: unsupervised steel surface defect detection via image inpainting autoencoders
Bekiryazıcı, T., Aydemır, G., Avcı, A., Gürkan, H., Hanilçi, C., Akbaş, Y., & Öper, M. (2026) · Signal Image and Video Processing · doi:10.1007/s11760-026-05807-3
Cediel-Méndez, J. E., Hernández-Salazar, C. A., & González-Estrada, O. A. (2026) · Journal of Physics Conference Series · doi:10.1088/1742-6596/3344/1/012007
Metadata
- Authors
- Li, Z., Tian, X., Liu, X., Liu, Y., & Shi, X.
- Affiliations
- Shandong University (CN)
- Nankai University (CN)
- China National Heavy Duty Truck Group (China) (CN)
- Corresponding author
- Tian, Xincheng
- Venue
- Applied Sciences
- Publisher
- MDPI AG
- Published
- 2022-01-14
- Volume
- 12
- Issue
- 2
- Pages
- 834
- ISSN
- 2076-3417 (ISSN-L)
- OpenAlex
- W4206765025
- Cited by
- 126
- References
- 21
- Citations by year
- 2026: 12 · 2025: 24 · 2024: 29 · 2023: 42 · 2022: 19
- FWCI
- 13.09
- Type
- journal article
- Language
- en
- Open access
- gold
- doi.org
- Licence
- Locations
- Applied Sciences (publishedVersion, cc-by)
- DOAJ (DOAJ: Directory of Open Access Journals) (submittedVersion, cc-by-sa)
- Topics
- Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
- Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Advanced Neural Network Applications
- Physical Sciences › Engineering › Civil and Structural Engineering › Infrastructure Maintenance and Monitoring
- Keywords
- industrial defect detection, steel surface defects, two-stage detection framework, InceptionResNetV2, CBAM attention mechanism, defect classification, NEU-DET dataset
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review