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Cited by 488

The DOI matches its Crossref record; 24 of the 24 references it cites were found in a registry or an index.

Using Deep Learning to Detect Defects in Manufacturing: A Comprehensive Survey and Current Challenges

Open access
Yang, Jing, Li, Shaobo, Wang, Zheng, Dong, Hao, Wang, Jun, Tang, Shihao·2020·Materials

Abstract

The detection of product defects is essential in quality control in manufacturing. This study surveys stateoftheart deep-learning methods in defect detection. First, we classify the defects of products, such as electronic components, pipes, welded parts, and textile materials, into categories. Second, recent mainstream techniques and deep-learning methods for defects are reviewed with their characteristics, strengths, and shortcomings described. Third, we summarize and analyze the application of ultrasonic testing, filtering, deep learning, machine vision, and other technologies used for defect detection, by focusing on three aspects, namely method and experimental results. To further understand the difficulties in the field of defect detection, we investigate the functions and characteristics of existing equipment used for defect detection. The core ideas and codes of studies related to high precision, high positioning, rapid detection, small object, complex background, occluded object detection and object association, are summarized. Lastly, we outline the current achievements and limitations of the existing methods, along with the current research challenges, to assist the research community on defect detection in setting a further agenda for future studies.

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Metadata

Authors
Yang, J., Li, S., Wang, Z., Dong, H., Wang, J., & Tang, S.
Venue
Materials
Publisher
MDPI AG
Published
2020-12-16
Volume
13
Issue
24
Pages
5755
ISSN
1996-1944 (ISSN-L)
OpenAlex
W3111404230
Cited by
488
References
24
FWCI
38.68
Type
journal article
Language
en
Open access
gold

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CoChat. (2026). Citation check: Using Deep Learning to Detect Defects in Manufacturing: A Comprehensive Survey and Current Challenges. https://app.cochat.ai/papers/10.3390/ma13245755
The paper
Yang, J., Li, S., Wang, Z., Dong, H., Wang, J., & Tang, S. (2020). Using Deep Learning to Detect Defects in Manufacturing: A Comprehensive Survey and Current Challenges. Materials. https://doi.org/10.3390/ma13245755

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

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