The DOI matches its Crossref record; 24 of the 24 references it cites were found in a registry or an index.
Using Deep Learning to Detect Defects in Manufacturing: A Comprehensive Survey and Current Challenges
Open accessAbstract
The detection of product defects is essential in quality control in manufacturing. This study surveys stateoftheart deep-learning methods in defect detection. First, we classify the defects of products, such as electronic components, pipes, welded parts, and textile materials, into categories. Second, recent mainstream techniques and deep-learning methods for defects are reviewed with their characteristics, strengths, and shortcomings described. Third, we summarize and analyze the application of ultrasonic testing, filtering, deep learning, machine vision, and other technologies used for defect detection, by focusing on three aspects, namely method and experimental results. To further understand the difficulties in the field of defect detection, we investigate the functions and characteristics of existing equipment used for defect detection. The core ideas and codes of studies related to high precision, high positioning, rapid detection, small object, complex background, occluded object detection and object association, are summarized. Lastly, we outline the current achievements and limitations of the existing methods, along with the current research challenges, to assist the research community on defect detection in setting a further agenda for future studies.
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Cites
Deep Residual Learning for Image Recognition
He, K., Zhang, X., Ren, S., & Sun, J. (2016) · 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2016.90 · Cited by 235,474
ImageNet classification with deep convolutional neural networks
Krizhevsky, A., Sutskever, I., & Hinton, G. E. (2017) · Communications of the ACM · doi:10.1145/3065386 · Cited by 112,155
Faster R-CNN: Towards Real-Time Object Detection with Region Proposal Networks
Ren, S., He, K., Girshick, R., & Sun, J. (2017) · IEEE Transactions on Pattern Analysis and Machine Intelligence · doi:10.1109/tpami.2016.2577031 · Cited by 73,472
Faster R-CNN: Towards Real-Time Object Detection with Region Proposal Networks
Ren, S., He, K., Girshick, R., & Sun, J. (2015) · arXiv · doi:10.48550/arxiv.1506.01497 · Cited by 70,812
Gradient-based learning applied to document recognition
Lecun, Y., Bottou, L., Bengio, Y., & Haffner, P. (1998) · Proceedings of the IEEE · doi:10.1109/5.726791 · Cited by 58,805
You Only Look Once: Unified, Real-Time Object Detection
Redmon, J., Divvala, S., Girshick, R., & Farhadi, A. (2016) · 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2016.91 · Cited by 53,803
Feature Pyramid Networks for Object Detection
Lin, T.-Y., Dollar, P., Girshick, R., He, K., Hariharan, B., & Belongie, S. (2017) · 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2017.106 · Cited by 30,939
Girshick, R. (2015) · 2015 IEEE International Conference on Computer Vision (ICCV) · doi:10.1109/iccv.2015.169 · Cited by 28,105
Deformable Convolutional Networks
Dai, J., Qi, H., Xiong, Y., Li, Y., Zhang, G., Hu, H., & Wei, Y. (2017) · 2017 IEEE International Conference on Computer Vision (ICCV) · doi:10.1109/iccv.2017.89 · Cited by 7,513
Generative Adversarial Networks: An Overview
Creswell, A., White, T., Dumoulin, V., Arulkumaran, K., Sengupta, B., & Bharath, A. A. (2018) · IEEE Signal Processing Magazine · doi:10.1109/msp.2017.2765202 · Cited by 4,540
Cited by
Hussain, M. (2023) · Machines · doi:10.3390/machines11070677 · Cited by 1,217
Surface Defect Detection Methods for Industrial Products: A Review
Chen, Y., Ding, Y., Zhao, F., Zhang, E., Wu, Z., & Shao, L. (2021) · Applied Sciences · doi:10.3390/app11167657 · Cited by 457
Artificial intelligence-based smart quality inspection for manufacturing
Sundaram, S., & Zeid, A. (2023) · Micromachines · doi:10.3390/mi14030570 · Cited by 260
Modeling of CO2 capture ability of [Bmim][BF4] ionic liquid using connectionist smart paradigms
Daryayehsalameh, B., Nabavi, M., & Vaferi, B. (2021) · Environmental Technology & Innovation · doi:10.1016/j.eti.2021.101484 · Cited by 111
Metadata
- Authors
- Yang, J., Li, S., Wang, Z., Dong, H., Wang, J., & Tang, S.
- Venue
- Materials
- Publisher
- MDPI AG
- Published
- 2020-12-16
- Volume
- 13
- Issue
- 24
- Pages
- 5755
- ISSN
- 1996-1944 (ISSN-L)
- OpenAlex
- W3111404230
- Cited by
- 488
- References
- 24
- FWCI
- 38.68
- Type
- journal article
- Language
- en
- Open access
- gold
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