Cited by 703Face and Expression RecognitionDomain Adaptation and Few-Shot LearningAdvanced Neural Network Applications

Deep Metric Learning: A Survey

Open access
KAYA, Mahmut, BİLGE, Hasan Şakir·2019·Symmetry

Abstract

Metric learning aims to measure the similarity among samples while using an optimal distance metric for learning tasks. Metric learning methods, which generally use a linear projection, are limited in solving real-world problems demonstrating non-linear characteristics. Kernel approaches are utilized in metric learning to address this problem. In recent years, deep metric learning, which provides a better solution for nonlinear data through activation functions, has attracted researchers’ attention in many different areas. This article aims to reveal the importance of deep metric learning and the problems dealt with in this field in the light of recent studies. As far as the research conducted in this field are concerned, most existing studies that are inspired by Siamese and Triplet networks are commonly used to correlate among samples while using shared weights in deep metric learning. The success of these networks is based on their capacity to understand the similarity relationship among samples. Moreover, sampling strategy, appropriate distance metric, and the structure of the network are the challenging factors for researchers to improve the performance of the network model. This article is considered to be important, as it is the first comprehensive study in which these factors are systematically analyzed and evaluated as a whole and supported by comparing the quantitative results of the methods.

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.3390/sym11091066

Cites

6 of 6 references verified0 citation errors · 0 not checkable

Statistics

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Cites

Flagged first, then by citations

Research works printed but not linked: 95

  1. Samuel, A.L. Some studies in machine learning using the game of checkers. IBM J. Res. Dev. 2000, 44, 206-226. [CrossRef] · DOI · Paper page
  2. Géron, A. Hands-on Machine Learning with Scikit-Learn and TensorFlow: Concepts, Tools, and Techniques to Build Intelligent Systems, 1st ed.; O'Reilly Media: Sebastopol, CA, USA, 2017; pp. 1-9.
  3. Malik, S.; Kanwal, N.; Asghar, M.N.; Sadiq, M.A.A.; Karamat, I.; Fleury, M. Data Driven Approach for Eye Disease Classification with Machine Learning. Appl. Sci. 2019, 9, 2789. [CrossRef] · DOI
  4. Globerson, A.; Roweis, S. Metric learning by collapsing classes. In Proceedings of the 18th International Conference on Neural Information Processing Systems, Vancouver, BC, Canada, 5-8 December 2005; pp. 451-458.
  5. Wang, F.; Sun, J. Survey on distance metric learning and dimensionality reduction in data mining. Data Min. Knowl. Discov. 2015, 29, 534-564. [CrossRef] · DOI
  6. Weinberger, K.Q.; Saul, L.K. Distance metric learning for large margin nearest neighbor classification. J. Mach. Learn. Res. 2009, 10, 207-244.
  7. Schmidhuber, J. Deep learning in neural networks: An overview. Neural Netw. 2015, 61, 85-117. [CrossRef] [PubMed] · DOI · Paper page
  8. Tran, K.; Phan, T.; Tran, T.K.; Phan, T.T. Deep Learning Application to Ensemble Learning-The Simple, but Effective, Approach to Sentiment Classifying. Appl. Sci. 2019, 9, 2760. [CrossRef] · DOI
  9. Lu, J.; Hu, J.; Zhou, J. Deep Metric Learning for Visual Understanding: An Overview of Recent Advances. IEEE Signal Process. Mag. 2017, 34, 76-84. [CrossRef] · DOI
  10. Xing, E.P.; Jordan, M.I.; Russell, S.J.; Ng, A.Y. Distance metric learning with application to clustering with side-information. In Proceedings of the 15th International Conference on Neural Information Processing Systems, Vancouver, BC, Canada, 9-14 December 2002; pp. 521-528.
  11. Weinberger, K.Q.; Blitzer, J.; Saul, L.K. Distance metric learning for large margin nearest neighbor classification. In Proceedings of the Advances in Neural Information Processing Systems (NIPS), Vancouver, BC, Canada, 10 December 2005; pp. 1473-1480.
  12. Davis, J.V.; Kulis, B.; Jain, P.; Sra, S.; Dhillon, I.S. Information-theoretic metric learning. In Proceedings of the 24th International Conference on Machine Learning, Corvallis, OR, USA, 20-24 June 2007; pp. 209-216.
  13. Nguyen, H.V.; Bai, L. Cosine similarity metric learning for face verification. In Proceedings of the 10th Asian Conference on Computer Vision, Queenstown, New Zealand, 8-12 November 2010; pp. 709-720.
  14. Duan, Y.; Lu, J.; Feng, J.; Zhou, J. Deep Localized Metric Learning. IEEE Trans. Circuits Syst. Video Technol. 2018, 28, 2644-2656. [CrossRef] · DOI
  15. Bellet, A.; Habrard, A.; Sebban, M. A Survey on Metric Learning for Feature Vectors and Structured Data. arXiv 2014, arXiv:1306.6709. · arXiv
  16. Matusita, K. Decision Rules, Based on the Distance, for Problems of Fit, Two Samples, and Estimation. Ann. Math. Stat. 1955, 26, 631-640. [CrossRef] · DOI
  17. Thacker, N.A.; Aherne, F.J.; Rockett, P.I. The Bhattacharyya metric as an absolute similarity measure for frequency coded data. Kybernetika 1997, 34, 363-368.
  18. Elgammal, A.; Duraiswami, R.; Davis, L.S. Probabilistic tracking in joint feature-spatial spaces. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Madison, WI, USA, 16-22 June 2003; pp. 1-8.
  19. Yu, J.; Yang, X.; Gao, F.; Tao, D. Deep multimodal distance metric learning using click constraints for image ranking. IEEE Trans. Cybern. 2016, 47, 4014-4024. [CrossRef] [PubMed] · DOI
  20. Cai, X.; Wang, C.; Xiao, B.; Chen, X.; Zhou, J. Deep nonlinear metric learning with independent subspace analysis for face verification. In Proceedings of the 20th ACM International Conference on Multimedia, Nara, Japan, 29 October-2 November 2012; pp. 749-752.
  21. Dai, G.; Xie, J.; Zhu, F.; Fang, Y. Deep Correlated Metric Learning for Sketch-based 3D Shape Retrieval. In Proceedings of the Thirty-First AAAI Conference on Artificial Intelligence, San Francisco, CA, USA, 4-9 February 2017; pp. 4002-4008.
  22. Li, Z.; Tang, J. Weakly Supervised Deep Metric Learning for Community-Contributed Image Retrieval. IEEE Trans. Multimedia 2015, 17, 1989-1999. [CrossRef] · DOI
  23. Kumar, V.B.; Harwood, B.; Carneiro, G.; Reid, I.; Drummond, T. Smart Mining for Deep Metric Learning. In Proceedings of the IEEE International Conference on Computer Vision (ICCV), Venice, Italy, 22-29 October 2017; pp. 2821-2829.
  24. Gundogdu, E.; Solmaz, B.; Koç, A.; Yücesoy, V.; Alatan, A.A. Deep distance metric learning for maritime vessel identification. In Proceedings of the 25th Signal Processing and Communications Applications Conference (SIU), Antalya, Turkey, 15-18 May 2017; pp. 1-4.
  25. Liu, J.; Deng, Y.; Huang, C. Targeting Ultimate Accuracy: Face Recognition via Deep Embedding. arXiv 2015, arXiv:1506.07310. · arXiv
  26. Hoffer, E.; Ailon, N. Semi-supervised deep learning by metric embedding. In Proceedings of the 5th International Conference on Learning Representations, Toulon, France, 14-26 April 2017.
  27. Hadsell, R.; Chopra, S.; LeCun, Y. Dimensionality Reduction by Learning an Invariant Mapping. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), New York, NY, USA, 17-22 June 2006; pp. 1735-1742.
  28. Lim, I.; Gehre, A.; Kobbelt, L. Identifying Style of 3D Shapes using Deep Metric Learning. Comput. Graph. Forum 2016, 35, 207-215. [CrossRef] · DOI
  29. Hu, J.; Lu, J.; Tan, Y.-P. Discriminative Deep Metric Learning for Face Verification in the Wild. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Columbus, OH, USA, 23-28 June 2014; pp. 1875-1882.
  30. Bromley, J.; Bentz, J.W.; Bottou, L.; Guyon, I.; LeCun, Y.; Moore, C.; Sackinger, E.; Shah, R. Signature verification using a "siamese" time delay neural network. Int. J. Pattern Recognit. Artif. Intell. 1993, 7, 669-688. [CrossRef] · DOI · Paper page
  31. Lee, J.; Abu-El-Haija, S.; Varadarajan, B.; Natsev, A. Collaborative Deep Metric Learning for Video Understanding. In Proceedings of the 24th ACM SIGKDD International Conference on Knowledge Discovery & Data Mining, London, UK, 19-23 August 2018; pp. 481-490.
  32. Huang, W.; Ding, H.; Chen, G. A novel deep multi-channel residual networks-based metric learning method for moving human localization in video surveillance. Signal Process. 2018, 142, 104-113. [CrossRef] · DOI
  33. Hu, J.; Lu, J.; Tan, Y.-P. Deep Metric Learning for Visual Tracking. IEEE Trans. Circuits Syst. Video Technol. 2016, 26, 2056-2068. [CrossRef] · DOI
  34. Zheng, L.; Yang, Y.; Hauptmann, A.G. Person Re-identification: Past, Present and Future. arXiv 2016, arXiv:1610.02984. · arXiv
  35. Chen, M.; Ge, Y.; Feng, X.; Xu, C.; Yang, D. Person Re-Identification by Pose Invariant Deep Metric Learning with Improved Triplet Loss. IEEE Access 2018, 6, 68089-68095. [CrossRef] · DOI
  36. Yang, X.; Zhou, P.; Wang, M. Person Reidentification via Structural Deep Metric Learning. IEEE Trans. Neural Netw. Learn. Syst. 2018, 1-12. [CrossRef] · DOI
  37. Hermans, A.; Beyer, L.; Leibe, B. In Defense of the Triplet Loss for Person Re-Identification. arXiv 2017, arXiv:1703.07737. · arXiv
  38. Ahmed, E.; Jones, M.; Marks, T.K. An improved deep learning architecture for person re-identification. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Boston, MA, USA, 7-12 June 2015; pp. 3908-3916.
  39. Ding, S.; Lin, L.; Wang, G.; Chao, H. Deep feature learning with relative distance comparison for person re-identification. Pattern Recognit. 2015, 48, 2993-3003. [CrossRef] · DOI
  40. Litjens, G.; Kooi, T.; Bejnordi, B.E.; Setio, A.A.A.; Ciompi, F.; Ghafoorian, M.; Van Der Laak, J.A.; Van Ginneken, B.; Sánchez, C.I. A survey on deep learning in medical image analysis. Med. Image Anal. 2017, 42, 60-88. [CrossRef] · DOI · Paper page
  41. Annarumma, M.; Montana, G. Deep metric learning for multi-labelled radiographs. In Proceedings of the 33rd Annual ACM Symposium on Applied Computing, Pau, France, 9-13 April 2018; pp. 34-37.
  42. Wang, F.; Kang, L.; Li, Y. Sketch-based 3D shape retrieval using Convolutional Neural Networks. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Boston, MA, USA, 7-12 June 2015; pp. 1875-1883.
  43. Dai, G.; Xie, J.; Fang, Y. Deep Correlated Holistic Metric Learning for Sketch-Based 3D Shape Retrieval. IEEE Trans. Image Process. 2018, 27, 3374-3386. [CrossRef] [PubMed] · DOI
  44. Xie, J.; Dai, G.; Zhu, F.; Shao, L.; Fang, Y. Deep Nonlinear Metric Learning for 3-D Shape Retrieval. IEEE Trans. Cybern. 2018, 48, 412-422. [CrossRef] · DOI
  45. He, X.; Zhou, Y.; Zhou, Z.; Bai, S.; Bai, X. Triplet-Center Loss for Multi-view 3D Object Retrieval. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Boston, MA, USA, 18-22 June 2018; pp. 1945-1954.
  46. Lu, J.; Hu, J.; Tan, Y.-P. Discriminative Deep Metric Learning for Face and Kinship Verification. IEEE Trans. Image Process. 2017, 26, 4269-4282. [CrossRef] · DOI
  47. Chen, X.; He, L.; Xu, C.; Liu, J. Distance-Dependent Metric Learning. IEEE Signal Process. Lett. 2019, 26, 357-361. [CrossRef] · DOI
  48. Liu, X.; Kumar, B.V.K.V.; You, J.; Jia, P. Adaptive Deep Metric Learning for Identity-Aware Facial Expression Recognition. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), Honolulu, HI, USA, 21-26 July 2017; pp. 522-531.
  49. Liu, H.; Lu, J.; Feng, J.; Zhou, J. Label-Sensitive Deep Metric Learning for Facial Age Estimation. IEEE Trans. Inf. Forensics Secur. 2018, 13, 292-305. [CrossRef] · DOI
  50. Mueller, J.; Thyagarajan, A. Siamese recurrent architectures for learning sentence similarity. In Proceedings of the Thirtieth AAAI Conference on Artificial Intelligence, Phoenix, AZ, USA, 12-17 February 2016; pp. 2786-2792.
  51. Benajiba, Y.; Sun, J.; Zhang, Y.; Jiang, L.; Weng, Z.; Biran, O. Siamese Networks for Semantic Pattern Similarity. In Proceedings of the IEEE 13th International Conference on Semantic Computing (ICSC), Newport Beach, CA, USA, 30 January-1 February 2019; pp. 191-194.
  52. Zhu, W.; Yao, T.; Ni, J.; Wei, B.; Lu, Z. Dependency-based Siamese long short-term memory network for learning sentence representations. PLoS ONE 2018, 13, e0193919. [CrossRef] [PubMed] · DOI
  53. Ein-Dor, L.; Mass, Y.; Halfon, A.; Venezian, E.; Shnayderman, I.; Aharonov, R.; Slonim, N. Learning Thematic Similarity Metric Using Triplet Networks. In Proceedings of the 56th Annual Meeting of the Association for Computational Linguistics (ACL 2018), Melbourne, Australia, 15-20 July 2018; pp. 49-54.
  54. Narayanaswamy, V.S.; Thiagarajan, J.J.; Song, H.; Spanias, A. Designing an Effective Metric Learning Pipeline for Speaker Diarization. arXiv 2018, arXiv:1811.00183. · arXiv
  55. Wang, J.; Wang, K.-C.; Law, M.T.; Rudzicz, F.; Brudno, M. Centroid-based Deep Metric Learning for Speaker Recognition. In Proceedings of the IEEE International Conference on Acoustics, Speech and Signal Processing, Brighton, UK, 12-17 May 2019; pp. 3652-3656.
  56. Snell, J.; Swersky, K.; Zemel, R.S. Prototypical Networks for Few-shot Learning. In Proceedings of the Advances in Neural Information Processing Systems (NIPS), Long Beach, CA, USA, 4-9 December 2017; pp. 4077-4087.
  57. Lu, R.; Wu, K.; Duan, Z.; Zhang, C. Deep ranking: Triplet MatchNet for music metric learning. In Proceedings of the IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP), New Orleans, LA, USA, 5-9 March 2017; pp. 121-125.
  58. Wang, Q.; Wan, J.; Yuan, Y. Deep Metric Learning for Crowdedness Regression. IEEE Trans. Circuits Syst. Video Technol. 2018, 28, 2633-2643. [CrossRef] · DOI
  59. Liu, Y.; Zhao, K.; Cong, G. Efficient Similar Region Search with Deep Metric Learning. In Proceedings of the 24th ACM SIGKDD International Conference on Knowledge Discovery & Data Mining, London, UK, 19-23 August 2018; pp. 1850-1859.
  60. Wang, X.; Liu, M. Multi-View Deep Metric Learning for Volumetric Image Recognition. In Proceedings of the IEEE International Conference on Multimedia and Expo (ICME), San Diego, CA, USA, 23-27 July 2018; pp. 1-6.
  61. Fathi, A.; Wojna, Z.; Rathod, V.; Wang, P.; Song, H.O.; Guadarrama, S.; Murphy, K.P. Semantic Instance Segmentation via Deep Metric Learning. arXiv 2017, arXiv:1703.10277. · arXiv
  62. Cai, S.; Huang, J.; Ding, X.; Zeug, D. Semantic edge detection based on deep metric learning. In Proceedings of the International Symposium on Intelligent Signal Processing and Communication Systems (ISPACS), Xiamen, China, 6-9 November 2017; pp. 707-712.
  63. Xing, Y.; Wang, M.; Yang, S.; Jiao, L. Pan-sharpening via deep metric learning. ISPRS J. Photogramm. Remote. Sens. 2018, 145, 165-183. [CrossRef] · DOI
  64. Wang, J.; Zhou, F.; Wen, S.; Liu, X.; Lin, Y. Deep Metric Learning with Angular Loss. In Proceedings of the IEEE International Conference on Computer Vision (ICCV), Venice, Italy, 22-29 October 2017; pp. 2593-2601.
  65. Wah, C.; Branson, S.; Welinder, P.; Perona, P.; Belongie, S. The Caltech-UCSD Birds-200-2011 Dataset; Computation & Neural Systems Technical Report, CNS-TR-2011-001; California Institute of Technology: Pasadena, CA, USA, 2011; pp. 1-8.
  66. Song, H.O.; Savarese, S.; Xiang, Y.; Jegelka, S. Deep Metric Learning via Lifted Structured Feature Embedding. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Las Vegas, NV, USA, 27-30 June 2016; pp. 4004-4012.
  67. Sohn, K. Improved deep metric learning with multi-class n-pair loss objective. In Proceedings of the Advances in Neural Information Processing Systems (NIPS), Barcelona, Spain, 5-10 December 2016; pp. 1857-1865.
  68. Song, H.O.; Jegelka, S.; Rathod, V.; Murphy, K. Deep Metric Learning via Facility Location. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Honolulu, HI, USA, 21-26 July 2017; pp. 2206-2214.
  69. Ge, W.; Huang, W.; Dong, D.; Scott, M.R. Deep Metric Learning with Hierarchical Triplet Loss. In Proceedings of the European Conference on Computer Vision (ECCV), Munich, Germany, 8-14 September 2018; pp. 272-288.
  70. Krause, J.; Stark, M.; Deng, J.; Fei-Fei, L. 3D Object Representations for Fine-Grained Categorization. In Proceedings of the IEEE International Conference on Computer Vision Workshops (ICCVW), Sydney, Australia, 1-8 December 2013; pp. 554-561.
  71. Zheng, L.; Shen, L.; Tian, L.; Wang, J.; Tian, Q. Scalable person re-identification: A benchmark. In Proceedings of the IEEE International Conference on Computer Vision (ICCV), Santiago, Chile, 11-18 December 2015; pp. 1116-1124.
  72. Ustinova, E.; Lempitsky, V. Learning Deep Embeddings with Histogram Loss. In Proceedings of the Advances in Neural Information Processing Systems (NIPS), Barcelona, Spain, 5-10 December 2016; pp. 4170-4178.
  73. Yao, H.; Zhang, S.; Hong, R.; Zhang, Y.; Xu, C.; Tian, Q. Deep Representation Learning with Part Loss for Person Re-Identification. IEEE Trans. Image Process. 2019, 28, 2860-2871. [CrossRef] · DOI
  74. Li, W.; Zhao, R.; Xiao, T.; Wang, X. DeepReID: Deep Filter Pairing Neural Network for Person Re-identification. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Columbus, OH, USA, 23-28 June 2014; pp. 152-159.
  75. Li, B.; Lu, Y.; Godil, A.; Schreck, T.; Bustos, B.; Ferreira, A.; Furuya, T.; Fonseca, M.J.; Johan, H.; Matsuda, T.; et al. A comparison of methods for sketch-based 3D shape retrieval. Comput. Vis. Image Underst. 2014, 119, 57-80. [CrossRef] · DOI
  76. Li, B.; Lu, Y.; Li, C.; Godil, A.; Schreck, T.; Aono, M.; Burtscher, M.; Chen, Q.; Chowdhury, N.K.; Fang, B.; et al. A comparison of 3D shape retrieval methods based on a large-scale benchmark supporting multimodal queries. Comput. Vis. Image Underst. 2015, 131, 1-27. [CrossRef] · DOI
  77. Howell, A.J.; Buxton, H. Towards unconstrained face recognition from image sequences. In Proceedings of the Second International Conference on Automatic Face and Gesture Recognition, Killington, VT, USA, 14-16 April 1996; pp. 224-229.
  78. Hu, J.; Lu, J.; Tan, Y.-P. Sharable and Individual Multi-View Metric Learning. IEEE Trans. Pattern Anal. Mach. Intell. 2018, 40, 2281-2288. [CrossRef] · DOI
  79. Wolf, L.; Hassner, T.; Maoz, I. Face recognition in unconstrained videos with matched background similarity. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Colorado Springs, CO, USA, 21-23 June 2011; pp. 529-534.
  80. Marelli, M.; Bentivogli, L.; Baroni, M.; Bernardi, R.; Menini, S.; Zamparelli, R. SemEval-2014 Task 1: Evaluation of Compositional Distributional Semantic Models on Full Sentences through Semantic Relatedness and Textual Entailment. In Proceedings of the 8th International Workshop on Semantic Evaluation (SemEval 2014), Dublin, Ireland, 23-29 August 2014; pp. 1-8.
  81. Greenberg, C.; Banse, D.; Doddington, G.; GarciaRomero, D.; Godfrey, J.; Kinnunen, T.; Martin, A.; McCree, A.; Przybocki, M.; Reynolds, D. The NIST 2014 Speaker Recognition i-Vector Machine Learning Challenge. In Proceedings of the Odyssey 2014: The Speaker and Language Recognition Workshop, Joensuu, Finland, 16-19 June 2014.
  82. Hoffer, E.; Ailon, N. Deep Metric Learning Using Triplet Network. In Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications; Springer: Berlin/Heidelberg, Germany, 2015; Volume 9370, pp. 84-92.
  83. Bell, S.; Bala, K. Learning visual similarity for product design with convolutional neural networks. ACM Trans. Graph. 2015, 34, 98. [CrossRef] · DOI
  84. Simo-Serra, E.; Trulls, E.; Ferraz, L.; Kokkinos, I.; Fua, P.; Moreno-Noguer, F. Discriminative learning of deep convolutional feature point descriptors. In Proceedings of the IEEE International Conference on Computer Vision (ICCV), Santiago, Chile, 11-18 December 2015; pp. 118-126.
  85. Bucher, M.; Herbin, S.; Jurie, F. Hard Negative Mining for Metric Learning Based Zero-Shot Classification. In Proceedings of the European Conference on Computer Vision (ECCV), Amsterdam, The Netherlands, 11-14 October 2016; pp. 524-531.
  86. Lin, Y.; Cui, Y.; Zhou, F.; Belongie, S. Fine-Grained Categorization and Dataset Bootstrapping Using Deep Metric Learning with Humans in the Loop. In Proceedings of the IEEE International Conference on Computer Vision (ICCV), Venice, Italy, 22-29 October 2017; pp. 1153-1162.
  87. Movshovitz-Attias, Y.; Toshev, A.; Leung, T.K.; Ioffe, S.; Singh, S. No Fuss Distance Metric Learning Using Proxies. In Proceedings of the IEEE International Conference on Computer Vision (ICCV), Venice, Italy, 22-29 October 2017; pp. 360-368.
  88. Manmatha, R.; Wu, C.-Y.; Smola, A.J.; Krähenbühl, P. Sampling matters in deep embedding learning. In Proceedings of the IEEE International Conference on Computer Vision (ICCV), Venice, Italy, 22-29 October 2017; pp. 2840-2848.
  89. Chopra, S.; Hadsell, R.; LeCun, Y. Learning a similarity metric discriminatively, with application to face verification. In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), San Diego, CA, USA, 20-25 June 2005; pp. 539-546.
  90. Filković, I.; Kalafatić, Z.; Hrkać, T. Deep metric learning for person Re-identification and De-identification. In Proceedings of the 2016 39th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO), Opatija, Croatia, 30 May-3 June 2016; pp. 1360-1364.
  91. Jeong, Y.; Lee, S.; Park, D.; Park, K.H. Accurate Age Estimation Using Multi-Task Siamese Network-Based Deep Metric Learning for Frontal Face Images. Symmetry 2018, 10, 385. [CrossRef] · DOI
  92. Yi, D.; Lei, Z.; Liao, S.; Li, S.Z. Deep Metric Learning for Person Re-identification. In Proceedings of the 2014 22nd International Conference on Pattern Recognition, Stockholm, Sweden, 24-28 August 2014; pp. 34-39.
  93. Shi, H.; Zhu, X.; Liao, S.; Lei, Z.; Yang, Y.; Li, S.Z. Constrained deep metric learning for person re-identification. arXiv 2015, arXiv:1511.07545. · arXiv
  94. Netzer, Y.; Wang, T.; Coates, A.; Bissacco, A.; Wu, B.; Ng, A.Y. Reading digits in natural images with unsupervised feature learning. In Proceedings of the Workshop on Deep Learning and Unsupervised Feature Learning, Granada, Spain, 16 December 2011; pp. 1-9. 109.
  95. Gray, D.; Brennan, S.; Tao, H. Evaluating appearance models for recognition, reacquisition, and tracking. In Proceedings of the IEEE International Workshop on Performance Evaluation for Tracking and Surveillance (PETS), Rio de Janeiro, Brazil, 14 October 2007; pp. 1-7.

Cited by

Sorted by citations

Authors
KAYA, M., & BİLGE, H. Ş.
Affiliations
  • Siirt Üniversitesi (TR)
  • Department of Electrical - Electronics Engineering, Engineering Faculty, Gazi University, Ankara 06570, Turkey
Corresponding author
KAYA, Mahmut
Venue
Symmetry
Publisher
MDPI AG
Published
2019-08-21
Volume
11
Issue
9
Pages
1066
ISSN
2073-8994 (ISSN-L)
OpenAlex
W2969656782
Cited by
703
References
6
Citations by year
2026: 68 · 2025: 105 · 2024: 152 · 2023: 146 · 2022: 112 · 2021: 83 · 2020: 35 · 2019: 2
FWCI
25.92
Type
journal article
Language
en
Open access
Locations
  • Symmetry (publishedVersion, cc-by)
  • DOAJ (DOAJ: Directory of Open Access Journals) (submittedVersion, cc-by-sa)
Topics
  • Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Face and Expression Recognition
  • Physical Sciences › Computer Science › Artificial Intelligence › Domain Adaptation and Few-Shot Learning
  • Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Advanced Neural Network Applications
Keywords
deep metric learning, similarity learning, Siamese network, triplet network, parameter sharing, metric learning, kernel methods, sampling strategy, nonlinear data, activation functions

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review