Liu, Jingcun

Stability, Reliability, and Robustness of GaN Power Devices: A Review

Kozak, J. P., Zhang, R., Porter, M., Song, Q., Liu, J., Wang, B., Wang, R., Saito, W., & Zhang, Y. (2023) · IEEE Transactions on Power Electronics

GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies

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Surge-Energy and Overvoltage Ruggedness of P-Gate GaN HEMTs

Zhang, R., Kozak, J. P., Xiao, M., Liu, J., & Zhang, Y. (2020) · IEEE Transactions on Power Electronics

GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies

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Pulsed Overcurrent Capability of Power Semiconductor Devices in Solid-State Circuit Breakers: SiC MOSFET vs. Si IGBT

Yang, X., Liu, J., Wang, B., & Zhang, G. (2022) · 2022 IEEE Applied Power Electronics Conference and Exposition (APEC)

Silicon Carbide Semiconductor TechnologiesHVDC Systems and Fault Protection

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