Shirley, J.H.

NIST-F1: recent improvements and accuracy evaluations

Heavner, T. P., Jefferts, S. R., Donley, E. A., Shirley, J. H., & Parker, T. E. (2005) · Metrologia

Advanced Frequency and Time StandardsScientific Measurement and Uncertainty Evaluation

Cited by 355

Precision Atomic Spectroscopy for Improved Limits on Variation of the Fine Structure Constant and Local Position Invariance

Fortier, T. M., Ashby, N., Bergquist, J. C., Delaney, M. J., Diddams, S. A., Heavner, T. P., Hollberg, L., Itano, W. M., Jefferts, S. R., Kim, K., et al. (2007) · Physical Review Letters

Advanced Frequency and Time StandardsAtomic and Molecular Physics

Cited by 226

First accuracy evaluation of NIST-F2

Heavner, T. P., Donley, E. A., Levi, F., Costanzo, G., Parker, T. E., Shirley, J. H., Ashby, N., Barlow, S., & Jefferts, S. R. (2014) · Metrologia

Advanced Frequency and Time StandardsScientific Measurement and Uncertainty Evaluation

Cited by 205

Recent improvements in NIST-F1 and a resulting accuracy of /spl delta/f/f=0.61/spl times/10/sup -15/

Heavner, T. P., Jefferts, S. R., Donley, E. A., Shirley, J. H., & Parker, T. E. (2005) · IEEE Transactions on Instrumentation and Measurement

Advanced Frequency and Time StandardsScientific Measurement and Uncertainty Evaluation

Cited by 22

Systematic errors in cesium beam frequency standards introduced by digital control of the microwave excitation

Lee, W. D., Shirley, J. H., Walls, F. L., & Drullinger, R. E. (2002) · Proceedings of the 1995 IEEE International Frequency Control Symposium (49th Annual Symposium)

Advanced Frequency and Time StandardsAdvanced Electrical Measurement Techniques

Cited by 10