The DOI matches its Crossref record; 12 of the 12 references it cites were found in a registry or an index.
Effect of roughness as determined by atomic force microscopy on the wetting properties of PTFE thin films
Abstract
The influence of film roughness on the wetting properties of vacuum‐deposited polytetrafluorethylene (PTFE) thin films has been investigated using atomic force microscopy (AFM) and contact angle goniometry. Surface roughness has been characterized by atomic force microscopy in terms of RMS roughness (R q) and fractal dimensions. A contact angle correlation with surface roughness, as determined by AFM, is evident from these results, which are discussed on the basis of wetting theory. The results also confirm that the high water contact angles (as high as 150°) recently observed at the surface of a new water repulsive coating material (mixture of PTFE and binder) are because of surface roughness. Such measurements clarify the effect of nanometer‐size surface asperities on the wetting properties of hydrophobic coating.
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Cites
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Cited by
Ultrahydrophobic Surfaces. Effects of Topography Length Scales on Wettability
Öner, D., & McCarthy, T. J. (2000) · Langmuir · doi:10.1021/la000598o · Cited by 1,754
Bioinspired Surfaces with Superwettability: New Insight on Theory, Design, and Applications
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Model for Contact Angles and Hysteresis on Rough and Ultraphobic Surfaces
Extrand, C. W. (2002) · Langmuir · doi:10.1021/la025769z · Cited by 631
A Super‐Hydrophobic and Super‐Oleophilic Coating Mesh Film for the Separation of Oil and Water
Feng, L., Zhang, Z., Mai, Z., Ma, Y., Liu, B., Jiang, L., & Zhu, D. (2004) · Angewandte Chemie · doi:10.1002/ange.200353381 · Cited by 361
Criteria for Ultralyophobic Surfaces
Extrand, C. W. (2004) · Langmuir · doi:10.1021/la036481s · Cited by 326
Metadata
- Authors
- Miller, J. D., Veeramasuneni, S., Drelich, J., Yalamanchili, M. R., & Yamauchi, G.
- Venue
- Polymer Engineering & Science
- Publisher
- Wiley
- Published
- 1996-07
- Volume
- 36
- Issue
- 14
- Pages
- 1849-1855
- ISSN
- 0032-3888 (ISSN-L)
- 1548-2634
- OpenAlex
- W2092978213
- Cited by
- 263
- References
- 12
- FWCI
- 5.57
- Type
- journal article
- Language
- en
- Open access
- closed
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- Miller, J. D., Veeramasuneni, S., Drelich, J., Yalamanchili, M. R., & Yamauchi, G. (1996). Effect of roughness as determined by atomic force microscopy on the wetting properties of PTFE thin films. Polymer Engineering & Science. https://doi.org/10.1002/pen.10580
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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