Cited by 77Advanced Thermoelectric Materials and DevicesChalcogenide Semiconductor Thin FilmsSemiconductor materials and interfaces

Amphoteric nature of copper impurities in Bi2Se3 crystals

Vaško, A., Tichý, L., Horák, J., Weissenstein, J.·1974·Applied Physics

Integrity signals

Registry

Crossref · 10.1007/bf00928132

Cites

8 of 8 references verified0 citation errors · 0 not checkable

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Cites

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1 of the 9 references couldn’t be matched to a known paper.

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Authors
Vaško, A., Tichý, L., Horák, J., & Weissenstein, J.
Venue
Applied Physics
Published
1974-12
Volume
5
Issue
3
Pages
217-221
ISSN
  • 0947-8396 (ISSN-L)
  • 0340-3793
  • 1432-0630
OpenAlex
W2015855374
Cited by
77
References
9
Citations by year
2026: 2 · 2025: 2 · 2024: 1 · 2023: 5 · 2022: 3 · 2021: 6 · 2020: 4 · 2019: 4 · 2018: 3 · 2017: 2 · 2016: 4 · 2015: 3 · 2014: 7 · 2013: 3 · 2012: 5
FWCI
0.00
Type
journal article
Language
en
Open access
closed
Locations
Applied Physics A (publishedVersion)
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Advanced Thermoelectric Materials and Devices
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Chalcogenide Semiconductor Thin Films
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Semiconductor materials and interfaces
Keywords
Bi2Se3, copper doping, copper impurities, amphoteric impurities, infrared reflectivity, plasma resonance, Hall constant, effective mass, free carrier concentration, point defects, interstitial copper, donor and acceptor defects

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

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