Microstructure and transport properties of sol–gel derived highly (100)-oriented lanthanum nickel oxide thin films on SiO2/Si substrate
Integrity signals
Registry
Cites
Statistics
Claims the paper makes
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
The creation of a well-defined columnar grain structure in CSD LNO films is challenging to achieve on an amorphous substrate.
“The creation of a well-defined columnar grain structure in CSD (Chemical Solution Deposition) LNO films is challenging to achieve on an amorphous substrate.”
From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [19]
The dependence of conductivity on oxygen deficiency δ is attributed to the change in nickel valence from Ni3+ to Ni2+ with increasing δ.
“The dependence of conductivity on oxygen deficiency δ is attributed to the change in nickel valence from Ni3+ to Ni2+ with increasing δ [19,20,21].”
From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [19]
Stoichiometric LNO films are characterized by metallic behavior, while oxygen-deficient LaNiO3-δ films exhibit a metal-insulator transition.
“Stoichiometric films are characterized by metallic behavior, while oxygen-deficient LaNiO3-δ films exhibit a metal–insulator transition [19].”
From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [19]
The electrical conductivity of LNO is extremely sensitive to the composition and structure of the films.
“The electrical conductivity of LNO is extremely sensitive to the composition and structure of the films.”
From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [19]
Most authors who studied CSD of LNO films on substrates of various structures reported films with a porous, polycrystalline structure and fine equiaxed grains.
“Most of the authors who studied the CSD of LNO films on substrates of various structures reported films with a porous, polycrystalline structure and fine equiaxed grains [19,24,41,42].”
From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [19]
CSD is widely used for deposition of LNO films on substrates of various materials, size, and shape, including standard silicon wafers.
“For this reason, chemical solution deposition (CSD) is widely used for the deposition of LNO films on substrates of various materials, size, and shape, including standard silicon wafers [15,19,31].”
From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [19]
Oxygen deficiency is the reason for resistivity increase attributed to change in nickel valence.
“As it is known, oxygen deficiency is the reason for the resistivity increase attributed to the change in nickel valence [19,20,21,59].”
From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [19]
Films with equiaxed grains have somewhat higher resistivity values ρ = 900-1050 μOhm·cm for the CSD technique.
“Films with equiaxed grains have somewhat higher resistivity values ρ = 900–1050 µOhm·cm for the CSD technique [19,42], this work.”
From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [19]
Cited by
Sorted by citations
Duan, Z., Cui, Y., Yang, Z., Li, K., Wan, Y., Lu, Z., Xie, Y., & Zhang, J. (2018) · Ceramics International · doi:10.1016/j.ceramint.2017.09.230 · Cited by 32 · see citing works
Control of Columnar Grain Microstructure in CSD LaNiO3 Films
Atanova, A. V., Seregin, D. S., Zhigalina, O. M., Khmelenin, D. N., Orlov, G. A., Turkina, D. I., Sigov, A. S., & Vorotilov, K. A. (2023) · Molecules · doi:10.3390/molecules28041938 · Cited by 5 · see citing works
- Authors
- Zhu, M. W., Wang, Z. J., Chen, Y. N., & Zhang, Z. D.
- Affiliations
- Chinese Academy of Sciences (CN)
- ORCID
- Venue
- Journal of Crystal Growth
- Publisher
- Elsevier BV
- Published
- 2011-12
- Volume
- 336
- Issue
- 1
- Pages
- 44-49
- ISSN
- 0022-0248 (ISSN-L)
- OpenAlex
- W2046671127
- Cited by
- 8
- References
- 0
- Citations by year
- 2023: 1 · 2019: 1 · 2017: 1 · 2016: 1 · 2014: 1 · 2013: 1 · 2012: 2
- FWCI
- 0.51
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Journal of Crystal Growth (publishedVersion)
- Topics
- Physical Sciences › Materials Science › Electronic, Optical and Magnetic Materials › Magnetic and transport properties of perovskites and related materials
- Physical Sciences › Materials Science › Materials Chemistry › Electronic and Structural Properties of Oxides
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Electrical and Thermal Properties of Materials
- Keywords
- lanthanum nickel oxide, thin films, sol-gel synthesis, (100) orientation, columnar grains, equiaxed grains, pyrolysis, heat treatment, metal-insulator transition, electrical transport properties, internal stress, crystallinity, SiO2/Si substrate
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
