Deposition of Highly Oriented Lanthanum Nickel Oxide Thin Film on Silicon Wafer by CSD
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Interplanar distances 2.43 and 1.46 Å may indicate presence of residual amount of NiO, while 3.27 and 1.68 Å correspond to La2O3 often observed in LNO films obtained by CSD.
“Interplanar distances of 2.43 Å and 1.46 Å may indicate the presence of a residual amount of NiO (s.g. Fm3¯m, ICSD ID 9866, d = 2.43 and 1.49 Å), while 3.27 Å and 1.68 Å correspond to La2O3 (s.g. Ia3¯, PDF 00-022-0369, d= 3.27, 1.70, 1.66 Å), often observed in LNO films obtained by CSD [15,57,58].”
From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [57]
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Duan, Z., Cui, Y., Yang, Z., Li, K., Wan, Y., Lu, Z., Xie, Y., & Zhang, J. (2018) · Ceramics International · doi:10.1016/j.ceramint.2017.09.230 · Cited by 32 · see citing works
Orientation Control Growth of Lanthanum Nickelate Thin Films Using Chemical Solution Deposition
Chen, S., Wang, G., Zhang, Y., Yang, L., & Dong, X. (2007) · Journal of the American Ceramic Society · doi:10.1111/j.1551-2916.2007.01912.x · Cited by 25 · see citing works
Control of Columnar Grain Microstructure in CSD LaNiO3 Films
Atanova, A. V., Seregin, D. S., Zhigalina, O. M., Khmelenin, D. N., Orlov, G. A., Turkina, D. I., Sigov, A. S., & Vorotilov, K. A. (2023) · Molecules · doi:10.3390/molecules28041938 · Cited by 5 · see citing works
- Authors
- Suzuki, H., Naoe, T., Miyazaki, H., & Ota, T.
- Affiliations
- Shizuoka University (JP)
- Shimane University (JP)
- Nagoya Institute of Technology (JP)
- Corresponding author
- Suzuki, H.
- Venue
- Journal of the European Ceramic Society
- Publisher
- Elsevier BV
- Published
- 2007-01
- Volume
- 27
- Issue
- 13-15
- Pages
- 3769-3773
- ISSN
- 0955-2219 (ISSN-L)
- OpenAlex
- W2020290457
- Cited by
- 27
- References
- 0
- Citations by year
- 2025: 1 · 2023: 1 · 2022: 1 · 2019: 2 · 2017: 1 · 2016: 2 · 2015: 1 · 2014: 2 · 2013: 4 · 2012: 3
- FWCI
- 0.92
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Journal of the European Ceramic Society (publishedVersion)
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Electronic and Structural Properties of Oxides
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Electrical and Thermal Properties of Materials
- Physical Sciences › Materials Science › Electronic, Optical and Magnetic Materials › Magnetic and transport properties of perovskites and related materials
- Keywords
- lanthanum nickel oxide, LaNiO3 thin films, chemical solution deposition, spin coating, annealing temperature, mixed solvents, 2-methoxyethanol, monoethanolamine, electrical resistivity, film density
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