Cited by 74Silicon Carbide Semiconductor TechnologiesAdvanced DC-DC ConvertersHeat Transfer and Optimization

Impact of active thermal management on power electronics design

Open access
Andresen, M., Liserre, M.·2014·Microelectronics Reliability

Abstract

Power electronic system design is typically constrained by the thermal limitation so by the overall losses and the peak current. To stay within the maximum current, reached only during transients, the system is typically overrated. Active thermal management is used to control the maximum temperature and the temperature swing to reduce failures that are mostly caused by them. In this paper it is proposed to use the active thermal management to reduce the switching losses or to move them to less stressed devices, during transients, such as a module can reach an higher current, without violating thermal constraints, and the need of overdesign can be reduced. Hence an optimal and cost effective design of power electronics system is achieved.

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1016/j.microrel.2014.07.069

Cites

7 of 7 references verified0 citation errors · 0 not checkable

Statistics

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Cites

Flagged first, then by citations

Research works printed but not linked: 1

  1. Bartram M, Bloh J. Doubly-fed-machines in wind-turbine systems: is this application limiting the lifetime of IBTS-frequency-converters? In: IEEE Power Electron Special Conf 2004:2583-7.

Cited by

Sorted by citations

Authors
Andresen, M., & Liserre, M.
Affiliations
Christian-Albrechts-Universität zu Kiel (DE)
Corresponding author
Andresen, M.
Venue
Microelectronics Reliability
Publisher
Elsevier BV
Published
2014-09
Volume
54
Issue
9-10
Pages
1935-1939
ISSN
0026-2714 (ISSN-L)
OpenAlex
W1987046761
Cited by
74
References
7
Citations by year
2026: 8 · 2025: 6 · 2024: 8 · 2023: 6 · 2022: 4 · 2021: 15 · 2020: 8 · 2019: 2 · 2018: 5 · 2017: 5 · 2016: 5 · 2015: 2
FWCI
2.13
Type
journal article
Language
en
Open access
Locations
  • Microelectronics Reliability (publishedVersion, cc-by-nc-nd)
  • MACAU: Open Access Repository of Kiel University (University Library Kiel) (submittedVersion)
  • Multimedialen Archiv und Publikationsserver der Christian-Albrechts-Universität zu Kiel (Christian-Albrechts-Universität zu Kiel) (submittedVersion, other-oa)
Funders
European Commission (2007–2013, FP/2007-2013)/ERC, FP/2007/2013)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Silicon Carbide Semiconductor Technologies
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced DC-DC Converters
  • Physical Sciences › Engineering › Mechanical Engineering › Heat Transfer and Optimization
Keywords
active thermal control, power electronics design, switching losses, thermal constraints, transient current, temperature swing, power electronics reliability

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review