The DOI matches its Crossref record; 16 of the 16 references it cites were found in a registry or an index.
Celebrating the 100th anniversary of the Stoney equation for film stress: Developments from polycrystalline steel strips to single crystal silicon wafers
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Citations
Cites
Timoshenko, S. P., & Woinowsky-Krieger, S. (1959) · UCLA Biblioteca de Ingenieria Civil · Cited by 12,112
LANDAU, L. D., & LIFSHITZ, E. M. (1951) · Cited by 5,843
The tension of metallic films deposited by electrolysis
Stoney, G. G. (1909) · Proceedings of the Royal Society of London. Series A, Containing Papers of a Mathematical and Physical Character · doi:10.1098/rspa.1909.0021 · Cited by 4,872
Materials Science of Thin Films
Ohring, M. (2002) · Elsevier eBooks · doi:10.1016/b978-0-12-524975-1.x5000-9 · Cited by 2,931
Single Crystal Elastic Constants and Calculated Aggregate Properties. A Handbook
Simmons, G., & Wang, H. F. (1971) · Medical Entomology and Zoology · Cited by 2,646
Mechanical properties of thin films
Nix, W. D. (1989) · Metallurgical Transactions A · doi:10.1007/bf02666659 · Cited by 2,546
Mittelstedt, C. (2023) · Springer eBooks · doi:10.1007/978-3-662-66805-4 · Cited by 1,492
Young's Modulus, Shear Modulus, and Poisson's Ratio in Silicon and Germanium
Wortman, J. J., & Evans, R. A. (1965) · Journal of Applied Physics · doi:10.1063/1.1713863 · Cited by 1,327
Calculated elastic constants for stress problems associated with semiconductor devices
Brantley, W. A. (1973) · Journal of Applied Physics · doi:10.1063/1.1661935 · Cited by 1,203
Theory of Elasticity: Vol. 7 of Course of Theoretical Physics
Landau, L. D., Lifshitz, E. M., Sykes, J. B., Reid, W. H., & Dill, E. H. (1960) · Physics Today · doi:10.1063/1.3057037 · Cited by 1,075
Cited by
Harris, K. D., Elias, A. L., & Chung, H.-J. (2016) · Journal of Materials Science · doi:10.1007/s10853-015-9643-3 · Cited by 403
Extreme Mechanics: Self-Folding Origami
Santangelo, C. D. (2017) · Annual Review of Condensed Matter Physics · doi:10.1146/annurev-conmatphys-031016-025316 · Cited by 81
Physics and technology development of multilayer EUV reflective optics
Louis, E. (2022) · doi:10.3990/1.9789090271637 · Cited by 6
Metadata
- Authors
- Janssen, G. C. A. M., Abdalla, M. M., van Keulen, F., Pujada, B. R., & van Venrooy, B.
- Venue
- Thin Solid Films
- Publisher
- Elsevier BV
- Published
- 2009-01
- Volume
- 517
- Issue
- 6
- Pages
- 1858-1867
- ISSN
- 0040-6090 (ISSN-L)
- OpenAlex
- W2141808559
- Cited by
- 710
- References
- 16
- FWCI
- 26.70
- Type
- journal article
- Language
- en
- Open access
- closed
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- CoChat. (2026). Citation check: Celebrating the 100th anniversary of the Stoney equation for film stress: Developments from polycrystalline steel strips to single crystal silicon wafers. https://app.cochat.ai/papers/10.1016/j.tsf.2008.07.014
- The paper
- Janssen, G. C. A. M., Abdalla, M. M., van Keulen, F., Pujada, B. R., & van Venrooy, B. (2009). Celebrating the 100th anniversary of the Stoney equation for film stress: Developments from polycrystalline steel strips to single crystal silicon wafers. Thin Solid Films. https://doi.org/10.1016/j.tsf.2008.07.014
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.