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Fundamentals of Modern VLSI Devices
Abstract
Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally renowned authors highlight the intricate interdependencies and subtle trade-offs between various practically important device parameters, and provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices. Equations and parameters provided are checked continuously against the reality of silicon data, making the book equally useful in practical transistor design and in the classroom. Every chapter has been updated to include the latest developments, such as MOSFET scale length theory, high-field transport model and SiGe-base bipolar devices.
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Cited by
Progress, Challenges, and Opportunities in Two-Dimensional Materials Beyond Graphene
Butler, S. Z., Hollen, S. M., Cao, L., Cui, Y., Gupta, J. A., Gutiérrez, H. R., Heinz, T. F., Hong, S. S., Huang, J., Ismach, A. F., et al. (2013) · ACS Nano · doi:10.1021/nn400280c · Cited by 4,878
Organic Thin Film Transistors for Large Area Electronics
Dimitrakopoulos, C. D., & Malenfant, P. R. L. (2002) · Advanced Materials · doi:10.1002/1521-4095(20020116)14:2<99::aid-adma99>3.0.co;2-9 · Cited by 4,878
Leakage current mechanisms and leakage reduction techniques in deep-submicrometer CMOS circuits
Roy, K., Mukhopadhyay, S., & Mahmoodi-Meimand, H. (2003) · Proceedings of the IEEE · doi:10.1109/jproc.2002.808156 · Cited by 2,368
Essential physics of carrier transport in nanoscale MOSFETs
Lundstrom, M., & Ren, Z. (2002) · IEEE Transactions on Electron Devices · doi:10.1109/16.974760 · Cited by 554
Scaling the gate dielectric: Materials, integration, and reliability
Buchanan, D. A. (1999) · IBM Journal of Research and Development · doi:10.1147/rd.433.0245 · Cited by 367
Metadata
- Authors
- Taur, Y., & Ning, T. H.
- Venue
- Cambridge University Press eBooks
- Publisher
- Cambridge University Press
- Published
- 2009-08-06
- OpenAlex
- W1661368752
- Cited by
- 2,922
- References
- 0
- FWCI
- 103.11
- Type
- book
- Language
- pt
- Open access
- closed
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