Cited by 554Advancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesQuantum and electron transport phenomena

Essential physics of carrier transport in nanoscale MOSFETs

Lundstrom, M., Ren, Z.·2002·IEEE Transactions on Electron Devices

Abstract

The device physics of nanoscale MOSFETs is explored by numerical simulations of a model transistor. The physics of charge control, source velocity saturation due to thermal injection, and scattering in ultrasmall devices are examined. The results show that the essential physics of nanoscale MOSFETs can be understood in terms of a conceptually simple scattering model.

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Crossref · 10.1109/16.974760

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27 of 27 references verified0 citation errors · 0 not checkable

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Authors
Lundstrom, M., & Ren, Z.
Affiliations
Purdue University West Lafayette (US)
Venue
IEEE Transactions on Electron Devices
Published
2002
Volume
49
Issue
1
Pages
133-141
ISSN
0018-9383 (ISSN-L)
OpenAlex
W2109617856
Cited by
554
References
29
Citations by year
2026: 8 · 2025: 5 · 2024: 8 · 2023: 8 · 2022: 12 · 2021: 17 · 2020: 16 · 2019: 12 · 2018: 18 · 2017: 22 · 2016: 18 · 2015: 29 · 2014: 19 · 2013: 29 · 2012: 24
FWCI
36.75
Type
journal article
Language
en
Open access
closed
Locations
IEEE Transactions on Electron Devices (publishedVersion)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advancements in Semiconductor Devices and Circuit Design
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Semiconductor materials and devices
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Quantum and electron transport phenomena
Keywords
nanoscale MOSFETs, carrier transport, charge control, velocity saturation, thermal injection, scattering model, device physics

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