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Cited by 106Thermal properties of materialsThermoelastic and Magnetoelastic PhenomenaGraphene research and applications

Temperature-Dependent Mean Free Path Spectra of Thermal Phonons Along the c-Axis of Graphite

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Zhang, Hang, Chen, Xiangwen, Jho, Young-Dahl, Minnich, Austin J.·2016·Nano Letters
DOI 10.1021/acs.nanolett.5b04499
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Abstract

Heat conduction in graphite has been studied for decades because of its exceptionally large thermal anisotropy. While the bulk thermal conductivities along the in-plane and cross-plane directions are well-known, less understood are the microscopic properties of the thermal phonons responsible for heat conduction. In particular, recent experimental and computational works indicate that the average phonon mean free path (MFP) along the c-axis is considerably larger than that estimated by kinetic theory, but the distribution of MFPs remains unknown. Here, we report the first quantitative measurements of c-axis phonon MFP spectra in graphite at a variety of temperatures using time-domain thermoreflectance measurements of graphite flakes with variable thickness. Our results indicate that c-axis phonon MFPs have values of a few hundred nanometers at room temperature and a much narrower distribution than in isotropic crystals. At low temperatures, phonon scattering is dominated by grain boundaries separating crystalline regions of different rotational orientation. Our study provides important new insights into heat transport and phonon scattering mechanisms in graphite and other anisotropic van der Waals solids.

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  • Over the past two decades, TDTR has emerged and evolved as a reliable, powerful, and versatile technique to measure thermal properties of a wide range of bulk and thin film materials and their interfaces.

    “Over the past two decades, ultrafast laser-based time-domain thermoreflectance (TDTR) has emerged and evolved as a reliable, powerful, and versatile technique to measure the thermal properties of a wide range of bulk and thin film materials and their interfaces.”

    From Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials (2018) · cites this paper as [31]

    The paper calls TDTR a standard thermal-characterization method and uses it to measure thermal conductivity in graphite films (p. 3). It also fits interface thermal conductance in a multilayer sample (p. 4). It does not establish the claimed two-decade evolution or use across a wide range of bulk and thin-film materials. (LLM, conf=0.85)

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  1. [1]Minnich, A. J. Phys. Rev. B 2015 , 91 , 085206.
  2. [2]Jang, W.; Bao, W.; Jing, L.; Lau, C. N.; Dames, C. Applied Physics Letters 2013 , 103 , 133102.
  3. [3]Dresselhaus, M. MRS Bulletin 1987 , 12 , 24-28.
  4. [4]Chiritescu, C.; Cahill, D. G.; Nguyen, N.; Johnson, D.; Bodapati, A.; Keblinski, P.; Zschack, P. Science 2007 , 315 , 351-353.
  5. [5]Yan, Z.; Liu, G.; Khan, J. M.; Balandin, A. A. Nat Commun 2012 , 3 , 827.
  6. [6]Losego, M. D.; Blitz, I. P.; Vaia, R. A.; Cahill, D. G.; Braun, P. V. Nano Letters 2013 , 13 , 2215-2219, PMID: 23594105.
  7. [7]Schmidt, A. J.; Chen, X.; Chen, G. Review of Scientific Instruments 2008 , 79 , 114902.
  8. [8]Luckyanova, M. N.; Johnson, J. A.; Maznev, A. A.; Garg, J.; Jandl, A.; Bulsara, M. T.; Fitzgerald, E. A.; Nelson, K. A.; Chen, G. Nano Letters 2013 , 13 , 3973-3977, PMID: 23952943.
  9. [9]Minnich, A. J. arXiv.org 2015 , DOI: http://arxiv.org/abs/1508.00611. · arXiv
  10. [10]Foley, B. M.; Herndez, S. C.; Duda, J. C.; Robinson, J. T.; Walton, S. G.; Hopkins, P. E. Nano Letters 2015 , 15 , 4876-4882, PMID: 26125524.
  11. [11]Yang, J.; Shen, M.; Yang, Y.; Evans, W. J.; Wei, Z.; Chen, W.; Zinn, A. A.; Chen, Y.; Prasher, R.; Xu, T. T.; Keblinski, P.; Li, D. Phys. Rev. Lett. 2014 , 112 , 205901.
  12. [12]Fu, Q.; Yang, J.; Chen, Y.; Li, D.; Xu, D. Applied Physics Letters 2015 , 106 , 031905.
  13. [14]Taylor, R. Philosophical Magazine 1966 , 13 , 157-166.
  14. [15]Jang, W.; Chen, Z.; Bao, W.; Lau, C. N.; Dames, C. Nano Letters 2010 , 10 , 3909-3913, PMID: 20836537.
  15. [16]Ghosh, S.; Bao, W.; Nika, D. L.; Subrina, S.; Pokatilov, E. P.; Lau, C. N.; Balandin, A. A. Nat Mater 2010 , 9 , 555-558.
  16. [17]Seol, J. H.; Jo, I.; Moore, A. L.; Lindsay, L.; Aitken, Z. H.; Pettes, M. T.; Li, X.; Yao, Z.; Huang, R.; Broido, D.; Mingo, N.; Ruoff, R. S.; Shi, L. Science 2010 , 328 , 213-216.
  17. [18]Bonini, N.; Garg, J.; Marzari, N. Nano Letters 2012 , 12 , 2673-2678, PMID: 22591411.
  18. [20]Paulatto, L.; Mauri, F.; Lazzeri, M. Phys. Rev. B 2013 , 87 , 214303.
  19. [21]Bae, M.-H.; Li, Z.; Aksamija, Z.; Martin, P. N.; Xiong, F.; Ong, Z.-Y.; Knezevic, I.; Pop, E. Nat Commun 2013 , 4 , 1734.
  20. [22]Xu, X.; Pereira, L. F. C.; Wang, Y.; Wu, J.; Zhang, K.; Zhao, X.; Bae, S.; Tinh Bui, C.; Xie, R.; Thong, J. T. L.; Hong, B. H.; Loh, K. P.; Donadio, D.; Li, B.; zyilmaz, B. Nat Commun 2014 , 5 , 4689.
  21. [23]Ghosh, S.; Calizo, I.; Teweldebrhan, D.; Pokatilov, E. P.; Nika, D. L.; Balandin, A. A.; Bao, W.; Miao, F.; Lau, C. N. Applied Physics Letters 2008 , 92 , 151911.
  22. [24]Chen, Z.; Jang, W.; Bao, W.; Lau, C. N.; Dames, C. Applied Physics Letters 2009 , 95 , 161910.
  23. [25]Shen, M.; Schelling, P. K.; Keblinski, P. Phys. Rev. B 2013 , 88 , 045444.
  24. [26]Tanaka, T.; Suzuki, H. Carbon 1972 , 10 , 253 - 257.
  25. [27]Sadeghi, M. M.; Jo, I.; Shi, L. Proceedings of the National Academy of Sciences 2013 , 110 , 16321-16326.
  26. [28]Harb, M.; von Korff Schmising, C.; Enquist, H.; Jurgilaitis, A.; Maximov, I.; Shvets, P. V.; Obraztsov, A. N.; Khakhulin, D.; Wulff, M.; Larsson, J. Applied Physics Letters 2012 , 101 , 233108.
  27. [29]Wei, Z.; Yang, J.; Chen, W.; Bi, K.; Li, D.; Chen, Y. Applied Physics Letters 2014 , 104 , 081903.
  28. [30]Cahill, D. G. Review of Scientific Instruments 2004 , 75 , 5119-5122.
  29. [31]Kang, K.; Koh, Y. K.; Chiritescu, C.; Zheng, X.; Cahill, D. G. Review of Scientific Instruments 2008 , 79 , 114901.
  30. [32]Ho, C. Y.; Powell, R. W.; Liley, P. E. Journal of Physical and Chemical Reference Data 1972 , 1 , 279-421.
  31. [33]Fugallo, G.; Cepellotti, A.; Paulatto, L.; Lazzeri, M.; Marzari, N.; Mauri, F. Nano Letters 2014 , 14 , 6109-6114, PMID: 25343716.
  32. [34]Park, S.; Floresca, H. C.; Suh, Y.; Kim, M. J. Carbon 2010 , 48 , 797 - 804.
  33. [35]Minnich, A. J. Phys. Rev. Lett. 2012 , 109 , 205901.
  34. [36]Zhang, H.; Hua, C.; Ding, D.; Minnich, A. J. Sci. Rep. 2015 , 5 , 9121.
  35. [37]Hua, C.; Minnich, A. J. Journal of Applied Physics 2015 , 117 , 175306.
  36. [38]Fuchs, K. Mathematical Proceedings of the Cambridge Philosophical Society 1938 , 34 , 100-
  37. [39]Sondheimer, E. Advances in Physics 1952 , 1 , 1-42.
  38. [40]Ward, A.; Broido, D. A. Phys. Rev. B 2010 , 81 , 085205.
  39. [41]Esfarjani, K.; Chen, G.; Stokes, H. T. Phys. Rev. B 2011 , 84 , 085204.
  40. [42]Dolling, G.; Brockhouse, B. N. Phys. Rev. 1962 , 128 , 1120-1123.
  41. [43]Xiang, J.; Drzal, L. T. Carbon 2011 , 49 , 773 - 778.
  42. [44]Veca, L. M.; Meziani, M. J.; Wang, W.; Wang, X.; Lu, F.; Zhang, P.; Lin, Y.; Fee, R.; Connell, J. W.; Sun, Y.-P. Advanced Materials 2009 , 21 , 2088-2092.
  43. [45]Tian, X.; Itkis, M. E.; Bekyarova, E. B.; Haddon, R. C. Sci. Rep. 2013 , 3 , 1710.
  44. [46]Lu, J.; Zheng, Y.; Sorkin, A.; Loh, K. P. Small 2012 , 8 , 3728-3732.
  45. [47]Dubrovkin, A. M.; Tao, J.; Chao Yu, X.; Zheludev, N. I.; Jie Wang, Q. Sci. Rep. 2015 , 5 , 9837.

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Authors
Zhang, H., Chen, X., Jho, Y.-D., & Minnich, A. J.
Affiliations
  • California Institute of Technology (US)
  • Gwangju Institute of Science and Technology (KR)
Corresponding author
Minnich, Austin J.
ORCID
Venue
Nano Letters
Publisher
American Chemical Society (ACS)
Published
2016-02-16
Volume
16
Issue
3
Pages
1643-1649
ISSN
  • 1530-6984 (ISSN-L)
  • 1530-6992
DOI
10.1021/acs.nanolett.5b04499
OpenAlex
W2252334324
Cited by
106
References
46
Citations by year
2026: 8 · 2025: 12 · 2024: 15 · 2023: 7 · 2022: 10 · 2021: 9 · 2020: 11 · 2019: 8 · 2018: 13 · 2017: 9 · 2016: 4
FWCI
5.05
Type
journal article
Language
en
Open access
Locations
  • Nano Letters (publishedVersion)
  • PubMed (publishedVersion)
  • arXiv (Cornell University) (submittedVersion)
  • CaltechAUTHORS (California Institute of Technology) (submittedVersion)
  • arXiv (Cornell University)
Funders
  • Division of Chemical, Bioengineering, Environmental, and Transport Systems (CBET 1254213)
  • California Institute of Technology
  • Chinese Academy of Sciences
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
  • Physical Sciences › Engineering › Mechanics of Materials › Thermoelastic and Magnetoelastic Phenomena
  • Physical Sciences › Materials Science › Materials Chemistry › Graphene research and applications
Keywords
graphite, phonon mean free path, thermal phonons, thermal anisotropy, time-domain thermoreflectance, grain boundary scattering, phonon scattering, van der Waals solids, flake graphite, temperature dependence, heat transport

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