Cited by 655Thermal properties of materialsThermography and Photoacoustic TechniquesThermoelastic and Magnetoelastic Phenomena

Pulse accumulation, radial heat conduction, and anisotropic thermal conductivity in pump-probe transient thermoreflectance

Schmidt, Aaron J., Chen, Xiaoyuan, Chen, Gang·2008·Review of Scientific Instruments

Abstract

The relationship between pulse accumulation and radial heat conduction in pump-probe transient thermoreflectance (TTR) is explored. The results illustrate how pulse accumulation allows TTR to probe two thermal length scales simultaneously. In addition, the conditions under which radial transport effects are important are described. An analytical solution for anisotropic heat flow in layered structures is given, and a method for measuring both cross-plane and in-plane thermal conductivities of thermally anisotropic thin films is described. As verification, the technique is used to extract the cross-plane and in-plane thermal conductivities of highly ordered pyrolytic graphite. Results are found to be in good agreement with literature values.

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Crossref · 10.1063/1.3006335

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19 of 19 references verified0 citation errors · 0 not checkable

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  • TDTR has been applied to measure materials with thermal conductivity values ranging from about 2000 W m−1 K−1 (e.g., diamond and graphite) to as low as 0.03 W m−1 K−1 (e.g., disordered WSe2 films).

    “In particular, time-domain thermoreflectance (TDTR) technique has been applied for measuring materials with thermal conductivity values ranging from a high end at ~2000 W m -1 K -1 (like diamond 36 and graphite 24, 37 ) to as low as 0.03 W m -1 K -1 (e.g., disordered WSe2 films 26 ).”
  • Over the past two decades, TDTR has emerged and evolved as a reliable, powerful, and versatile technique to measure thermal properties of a wide range of bulk and thin film materials and their interfaces.

    “Over the past two decades, ultrafast laser-based time-domain thermoreflectance (TDTR) has emerged and evolved as a reliable, powerful, and versatile technique to measure the thermal properties of a wide range of bulk and thin film materials and their interfaces.”
  • The transient thermoreflectance technique can be implemented as both the TDTR method and the frequency-domain thermoreflectance (FDTR) method.

    “The transient thermoreflectance technique can be implemented as both the TDTR method 22, 24, 25 and the frequency-domain thermoreflectance (FDTR) method 93, 94 (see Section III(A) for more details of FDTR).”
  • Schmidt further extended the model for anisotropic heat conduction where thin films are very likely anisotropic due to the size effect of energy carriers.

    “Schmidt 24 further extended the model for anisotropic heat conduction where thin films are very likely anisotropic due to the size effect of energy carriers.”

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Authors
Schmidt, A. J., Chen, X., & Chen, G.
Affiliations
Massachusetts Institute of Technology (US)
Venue
Review of Scientific Instruments
Published
2008-11-01
Volume
79
Issue
11
Pages
114902-114902
ISSN
  • 0034-6748 (ISSN-L)
  • 1089-7623
OpenAlex
W2025194570
Cited by
655
References
19
Citations by year
2026: 31 · 2025: 46 · 2024: 47 · 2023: 26 · 2022: 42 · 2021: 38 · 2020: 47 · 2019: 43 · 2018: 54 · 2017: 59 · 2016: 44 · 2015: 41 · 2014: 26 · 2013: 27 · 2012: 29
FWCI
9.35
Type
journal article
Language
en
Open access
closed
Locations
  • Review of Scientific Instruments (publishedVersion)
  • PubMed (publishedVersion)
Funders
  • National Science Foundation
  • U.S. Department of Defense
  • University of Illinois at Urbana-Champaign
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
  • Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
  • Physical Sciences › Engineering › Mechanics of Materials › Thermoelastic and Magnetoelastic Phenomena
Keywords
transient thermoreflectance, pulse accumulation, radial heat conduction, anisotropic thermal conductivity, through-plane thermal conductivity, in-plane thermal conductivity, thin films, layered structure, pyrolytic graphite, analytical solution

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