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Spatially Resolved Raman Spectroscopy of Single- and Few-Layer Graphene
Open accessAbstract
We present Raman spectroscopy measurements on single- and few-layer graphene flakes. By using a scanning confocal approach, we collect spectral data with spatial resolution, which allows us to directly compare Raman images with scanning force micrographs. Single-layer graphene can be distinguished from double- and few-layer by the width of the D' line: the single peak for single-layer graphene splits into different peaks for the double-layer. These findings are explained using the double-resonant Raman model based on ab initio calculations of the electronic structure and of the phonon dispersion. We investigate the D line intensity and find no defects within the flake. A finite D line response originating from the edges can be attributed either to defects or to the breakdown of translational symmetry.
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Metadata
- Authors
- Graf, D., Molitor, F., Ensslin, K., Stampfer, C., Jungen, A., Hierold, C., & Wirtz, L.
- Venue
- Nano Letters
- Publisher
- American Chemical Society (ACS)
- Published
- 2007-01-13
- Volume
- 7
- Issue
- 2
- Pages
- 238-242
- ISSN
- 1530-6984 (ISSN-L)
- 1530-6992
- OpenAlex
- W2125631448
- Cited by
- 2,540
- References
- 5
- FWCI
- 53.02
- Type
- journal article
- Language
- en
- Open access
- green
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