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Cited by 177

The DOI matches its Crossref record; 11 of the 11 references it cites were found in a registry or an index.

Ultrathin Topological Insulator Bi2Se3 Nanoribbons Exfoliated by Atomic Force Microscopy

Open access
Hong, Seung Sae, Kundhikanjana, Worasom, Cha, Judy J., Lai, Keji, Kong, Desheng, Meister, Stefan, Kelly, Michael A., Shen, Zhi-Xun, Cui, Yi·2010·Nano Letters

Abstract

Ultrathin topological insulator nanostructures, in which coupling between top and bottom surface states takes place, are of great intellectual and practical importance. Due to the weak van der Waals interaction between adjacent quintuple layers (QLs), the layered bismuth selenide (Bi(2)Se(3)), a single Dirac-cone topological insulator with a large bulk gap, can be exfoliated down to a few QLs. In this paper, we report the first controlled mechanical exfoliation of Bi(2)Se(3) nanoribbons (>50 QLs) by an atomic force microscope (AFM) tip down to a single QL. Microwave impedance microscopy is employed to map out the local conductivity of such ultrathin nanoribbons, showing drastic difference in sheet resistance between 1-2 QLs and 4-5 QLs. Transport measurement carried out on an exfoliated ( 50 QLs) ribbons. These AFM-exfoliated thin nanoribbons afford interesting candidates for studying the transition from quantum spin Hall surface to edge states.

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Metadata

Authors
Hong, S. S., Kundhikanjana, W., Cha, J. J., Lai, K., Kong, D., Meister, S., Kelly, M. A., Shen, Z.-X., & Cui, Y.
Venue
Nano Letters
Published
2010-07-12
Volume
10
Issue
8
Pages
3118-3122
ISSN
  • 1530-6984 (ISSN-L)
  • 1530-6992
OpenAlex
W1975084501
Cited by
177
References
11
FWCI
8.96
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: Ultrathin Topological Insulator Bi2Se3 Nanoribbons Exfoliated by Atomic Force Microscopy. https://app.cochat.ai/papers/10.1021/nl101884h
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Hong, S. S., Kundhikanjana, W., Cha, J. J., Lai, K., Kong, D., Meister, S., Kelly, M. A., Shen, Z.-X., & Cui, Y. (2010). Ultrathin Topological Insulator Bi2Se3 Nanoribbons Exfoliated by Atomic Force Microscopy. Nano Letters. https://doi.org/10.1021/nl101884h

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