Cited by 1,194Graphene research and applicationsForce Microscopy Techniques and ApplicationsAdvanced Sensor and Energy Harvesting Materials

Mechanical Properties of Monolayer Graphene Oxide

Suk, Ji Won, Piner, Richard D., An, Jinho, Ruoff, Rodney S.·2010·ACS Nano

Abstract

Mechanical properties of ultrathin membranes consisting of one layer, two overlapped layers, and three overlapped layers of graphene oxide platelets were investigated by atomic force microscopy (AFM) imaging in contact mode. In order to evaluate both the elastic modulus and prestress of thin membranes, the AFM measurement was combined with the finite element method (FEM) in a new approach for evaluating the mechanics of ultrathin membranes. Monolayer graphene oxide was found to have a lower effective Young's modulus (207.6 ± 23.4 GPa when a thickness of 0.7 nm is used) as compared to the value reported for "pristine" graphene. The prestress (39.7-76.8 MPa) of the graphene oxide membranes obtained by solution-based deposition was found to be 1 order of magnitude lower than that obtained by others for mechanically cleaved graphene. The novel AFM imaging and FEM-based mapping methods presented here are of general utility for obtaining the elastic modulus and prestress of thin membranes.

Integrity signals

Registry

Crossref · 10.1021/nn101781v

Cites

59 of 59 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

This paper’s full text isn’t openly available, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

Cites

Flagged first, then by citations

2 of the 61 references couldn’t be matched to a known paper.

Cited by

Sorted by citations

Authors
Suk, J. W., Piner, R. D., An, J., & Ruoff, R. S.
Affiliations
Texas Materials Institute (US)
Corresponding author
Ruoff, Rodney S.
Venue
ACS Nano
Published
2010-10-13
Volume
4
Issue
11
Pages
6557-6564
ISSN
  • 1936-0851 (ISSN-L)
  • 1936-086X
OpenAlex
W1965460216
Cited by
1,194
References
61
Citations by year
2026: 46 · 2025: 68 · 2024: 85 · 2023: 77 · 2022: 95 · 2021: 99 · 2020: 125 · 2019: 120 · 2018: 96 · 2017: 94 · 2016: 85 · 2015: 55 · 2014: 49 · 2013: 40 · 2012: 44
FWCI
15.69
Type
journal article
Language
en
Open access
closed
Locations
  • ACS Nano (publishedVersion)
  • PubMed (publishedVersion)
  • Scholarworks@UNIST (Ulsan National Institute of Science and Technology) (submittedVersion)
Funders
Division of Civil, Mechanical and Manufacturing Innovation
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Graphene research and applications
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Force Microscopy Techniques and Applications
  • Physical Sciences › Engineering › Biomedical Engineering › Advanced Sensor and Energy Harvesting Materials
Keywords
ultrathin membranes, elastic modulus, prestressing, Young's modulus, solution-based deposition, AFM imaging, finite element analysis, membrane mechanics
MeSH terms
Graphite, Membranes, Artificial, Oxides, Stress, Mechanical, Microscopy, Atomic Force, Finite Element Analysis, Nanostructures, Elastic Modulus, Mechanical Phenomena

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review