The DOI matches its Crossref record; 9 of the 9 references it cites were found in a registry or an index.
Silicon qubit fidelities approaching incoherent noise limits via pulse engineering
Open accessAbstract
Spin qubits created from gate-defined silicon metal–oxide–semiconductor quantum dots are a promising architecture for quantum computation. The high single qubit fidelities possible in these systems, combined with quantum error correcting codes, could potentially offer a route to fault-tolerant quantum computing. To achieve fault tolerance, however, gate error rates must be reduced to below a certain threshold and, in general, correlated errors must be removed. Here we show that pulse engineering techniques can be used to reduce the average Clifford gate error rates for silicon quantum dot spin qubits down to 0.043%. This represents a factor of three improvement over state-of-the-art silicon quantum dot devices and extends the randomized benchmarking coherence time to 9.4 ms. By including tomographically complete measurements in our randomized benchmarking, we infer a higher-order feature of the noise called the unitarity, which measures the coherence of noise. This, in turn, allows us to theoretically predict that average gate error rates as low as 0.026% may be achievable with further pulse improvements. These spin qubit fidelities are ultimately limited by incoherent noise, which we attribute to charge noise from the silicon device structure or the environment.Pulse engineering techniques can be used to reduce the average Clifford gate error rates for silicon quantum dot spin qubits down to 0.043%, a factor of three improvement over state-of-the-art silicon devices.
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Cites
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Superconducting quantum circuits at the surface code threshold for fault tolerance
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“Process (3) is a simple five-repetition sequence of (1) + (2) + calibration; this is repeated on the y axis in Fig.”
BackgroundMethodInfluentialRandomized benchmarking of quantum gates
Knill, E., Leibfried, D., Reichle, R., Britton, J., Blakestad, R. B., Jost, J. D., Langer, C., Ozeri, R., Seidelin, S., & Wineland, D. J. (2008) · Physical Review A · doi:10.1103/physreva.77.012307 · Cited by 1,019
High-Fidelity Quantum Logic Gates Using Trapped-Ion Hyperfine Qubits
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Bounding the average gate fidelity of composite channels using the unitarity
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Cited by
Quantum logic with spin qubits crossing the surface code threshold
Xue, X., Russ, M., Samkharadze, N., Undseth, B., Sammak, A., Scappucci, G., & Vandersypen, L. M. K. (2022) · Nature · doi:10.1038/s41586-021-04273-w · Cited by 524
Fast universal quantum gate above the fault-tolerance threshold in silicon
Noiri, A., Takeda, K., Nakajima, T., Kobayashi, T., Sammak, A., Scappucci, G., & Tarucha, S. (2022) · Nature · doi:10.1038/s41586-021-04182-y · Cited by 471
Universal control of a six-qubit quantum processor in silicon
Philips, S. G. J., Mądzik, M. T., Amitonov, S. V., de Snoo, S. L., Russ, M., Kalhor, N., Volk, C., Lawrie, W. I. L., Brousse, D., Tryputen, L., et al. (2022) · Nature · doi:10.1038/s41586-022-05117-x · Cited by 410
Operation of a silicon quantum processor unit cell above one kelvin
Yang, C. H., Leon, R. C. C., Hwang, J. C. C., Saraiva, A., Tanttu, T., Huang, W., Camirand Lemyre, J., Chan, K. W., Tan, K. Y., Hudson, F. E., et al. (2020) · Nature · doi:10.1038/s41586-020-2171-6 · Cited by 369
Self-citationSemiconductor qubits in practice
Chatterjee, A., Stevenson, P., De Franceschi, S., Morello, A., de Leon, N. P., & Kuemmeth, F. (2021) · Nature Reviews Physics · doi:10.1038/s42254-021-00283-9 · Cited by 359
Self-citation
Metadata
- Authors
- Yang, C. H., Chan, K. W., Harper, R., Huang, W., Evans, T., Hwang, J. C. C., Hensen, B., Laucht, A., Tanttu, T., Hudson, F. E., Flammia, S. T., Itoh, K. M., Morello, A., Bartlett, S. D., & Dzurak, A. S.
- Venue
- Nature Electronics
- Published
- 2019-04-15
- Volume
- 2
- Issue
- 4
- Pages
- 151-158
- ISSN
- 2520-1131 (ISSN-L)
- OpenAlex
- W2938382017
- Cited by
- 201
- References
- 9
- FWCI
- 12.67
- Type
- journal article
- Language
- en
- Open access
- green
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