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Imprint of sub-25 nm vias and trenches in polymers

Chou, Stephen Y., Krauss, Peter R., Renstrom, Preston J.·1995·Applied Physics Letters

Abstract

A nanoimprint process that presses a mold into a thin thermoplastic polymer film on a substrate to create vias and trenches with a minimum size of 25 nm and a depth of 100 nm in the polymer has been demonstrated. Furthermore, the imprint process has been used as a lithography process to fabricate sub-25 nm diameter metal dot arrays of a 100 nm period in a lift-off process. It was found that the nanostructures imprinted in the polymers conform completely with the geometry of the mold. At present, the imprinted size is limited by the size of the mold being used; with a suitable mold, the imprint process should mold sub-10 nm structures with a high aspect ratio in polymers. The nanoimprint process offers a low cost method for mass producing sub-25 nm structures and has the potential to become a key nanolithography method for future manufacturing of integrated circuits and integrated optics.

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Metadata

Authors
Chou, S. Y., Krauss, P. R., & Renstrom, P. J.
Venue
Applied Physics Letters
Published
1995-11-20
Volume
67
Issue
21
Pages
3114-3116
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2062074587
Cited by
2,706
References
0
FWCI
11.94
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Imprint of sub-25 nm vias and trenches in polymers. https://app.cochat.ai/papers/10.1063/1.114851
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Chou, S. Y., Krauss, P. R., & Renstrom, P. J. (1995). Imprint of sub-25 nm vias and trenches in polymers. Applied Physics Letters. https://doi.org/10.1063/1.114851

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