The DOI matches its Crossref record; 9 of the 9 references it cites were found in a registry or an index.
Vertical scaling of carbon nanotube field-effect transistors using top gate electrodes
Abstract
We have fabricated single-wall carbon nanotube field-effect transistors (CNFETs) in a conventional metal–oxide–semiconductor field-effect transistor (MOSFET) structure, with gate electrodes above the conduction channel separated from the channel by a thin dielectric. These top gate devices exhibit excellent electrical characteristics, including steep subthreshold slope and high transconductance, at gate voltages close to 1 V—a significant improvement relative to previously reported CNFETs which used the substrate as a gate and a thicker gate dielectric. Our measured device performance also compares very well to state-of-the-art silicon devices. These results are observed for both p- and n-type devices, and they suggest that CNFETs may be competitive with Si MOSFETs for future nanoelectronic applications.
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Cites
Crystalline Ropes of Metallic Carbon Nanotubes
Thess, A., Lee, R., Nikolaev, P., Dai, H., Petit, P., Robert, J., Xu, C., Lee, Y. H., Kim, S. G., Rinzler, A. G., et al. (1996) · Science · doi:10.1126/science.273.5274.483 · Cited by 5,580
Room-temperature transistor based on a single carbon nanotube
Tans, S. J., Verschueren, A. R. M., & Dekker, C. (1998) · Nature · doi:10.1038/29954 · Cited by 5,425
American Institute of Physics Handbook
Dayton, I. E. (1964) · American Journal of Physics · doi:10.1119/1.1970399 · Cited by 3,000
Single- and multi-wall carbon nanotube field-effect transistors
Martel, R., Schmidt, T., Shea, H. R., Hertel, T., & Avouris, P. (1998) · Applied Physics Letters · doi:10.1063/1.122477 · Cited by 2,812
Self-citationLogic Circuits with Carbon Nanotube Transistors
Bachtold, A., Hadley, P., Nakanishi, T., & Dekker, C. (2001) · Science · doi:10.1126/science.1065824 · Cited by 2,616
Device scaling limits of Si MOSFETs and their application dependencies
Frank, D. J., Dennard, R. H., Nowak, E., Solomon, P. M., Taur, Y., & Wong, H.-S. P. (2001) · Proceedings of the IEEE · doi:10.1109/5.915374 · Cited by 1,572
Carbon Nanotube Inter- and Intramolecular Logic Gates
Derycke, V., Martel, R., Appenzeller, J., & Avouris, P. (2001) · Nano Letters · doi:10.1021/nl015606f · Cited by 1,053
Self-citationWork Functions and Surface Functional Groups of Multiwall Carbon Nanotubes
Ago, H., Kugler, T., Cacialli, F., Salaneck, W. R., Shaffer, M. S. P., Windle, A. H., & Friend, R. H. (1999) · The Journal of Physical Chemistry B · doi:10.1021/jp991659y · Cited by 969
Ambipolar Electrical Transport in Semiconducting Single-Wall Carbon Nanotubes
Martel, R., Derycke, V., Lavoie, C., Appenzeller, J., Chan, K. K., Tersoff, J., & Avouris, P. (2001) · Physical Review Letters · doi:10.1103/physrevlett.87.256805 · Cited by 803
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Cited by
High-Performance Carbon Nanotube Field-Effect Transistor With Tunable Polarities
Lin, Y.-M., Appenzeller, J., Knoch, J., & Avouris, P. (2005) · IEEE Transactions On Nanotechnology · doi:10.1109/tnano.2005.851427 · Cited by 499
Self-citationA review on inkjet printing of nanoparticle inks for flexible electronics
Nayak, L., Mohanty, S., Nayak, S. K., & Ramadoss, A. (2019) · Journal of Materials Chemistry C · doi:10.1039/c9tc01630a · Cited by 497
Metadata
- Authors
- Wind, S. J., Appenzeller, J., Martel, R., Derycke, V., & Avouris, P.
- Venue
- Applied Physics Letters
- Publisher
- AIP Publishing
- Published
- 2002-05-20
- Volume
- 80
- Issue
- 20
- Pages
- 3817-3819
- ISSN
- 0003-6951 (ISSN-L)
- 1077-3118
- OpenAlex
- W2054201028
- Cited by
- 668
- References
- 9
- FWCI
- 50.53
- Type
- journal article
- Language
- en
- Open access
- closed
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.