The DOI matches its Crossref record; 15 of the 15 references it cites were found in a registry or an index.
Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever
Open accessAbstract
We propose a method for mapping the composition of a surface by using an amplitude modulation atomic force microscope operated without tip-surface mechanical contact. The method consists in exciting the first two modes of the microcantilever. The nonlinear dynamics of the tip motion, the coupling of its first two modes, and the sensitivity of the second mode to long-range attractive forces allows us to use this mode to probe compositional changes while the signal from the first mode is used to image the sample surface. We demonstrate that the second mode has a sensitivity to surface force variations below 10−11 N.
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Citations
Cites
Intermolecular and Surface Forces
(2011) · Intermolecular and Surface Forces · doi:10.1016/b978-0-12-391927-4.10024-6 · Cited by 16,923
Dynamic atomic force microscopy methods
García, R. (2002) · Surface Science Reports · doi:10.1016/s0167-5729(02)00077-8 · Cited by 2,076
Self-citationCalculation of thermal noise in atomic force microscopy
Butt, H. J., & Jaschke, M. (1995) · Nanotechnology · doi:10.1088/0957-4484/6/1/001 · Cited by 1,589
Sader, J. E. (1998) · Journal of Applied Physics · doi:10.1063/1.368002 · Cited by 1,410
Energy dissipation in tapping-mode atomic force microscopy
Cleveland, J. P., Anczykowski, B., Schmid, A. E., & Elings, V. B. (1998) · Applied Physics Letters · doi:10.1063/1.121434 · Cited by 881
True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive Forces
Ohnesorge, F., & Binnig, G. (1993) · Science · doi:10.1126/science.260.5113.1451 · Cited by 700
Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy
García, R., & San Paulo, A. (1999) · Physical Review B · doi:10.1103/physrevb.60.4961 · Cited by 570
Self-citationTamayo, J., & Garcı́a, R. (1997) · Applied Physics Letters · doi:10.1063/1.120039 · Cited by 292
Self-citationSan Paulo, A., & García, R. (2000) · Biophysical Journal · doi:10.1016/s0006-3495(00)76712-9 · Cited by 286
Self-citationReiter, G., Castelein, G., Sommer, J.-U., Röttele, A., & Thurn-Albrecht, T. (2001) · Physical Review Letters · doi:10.1103/physrevlett.87.226101 · Cited by 198
Metadata
- Authors
- Rodrı́guez, T. R., & Garcı́a, R.
- Venue
- Applied Physics Letters
- Publisher
- AIP Publishing
- Published
- 2004-01-19
- Volume
- 84
- Issue
- 3
- Pages
- 449-451
- ISSN
- 0003-6951 (ISSN-L)
- 1077-3118
- OpenAlex
- W2055840666
- Cited by
- 295
- References
- 15
- FWCI
- 5.53
- Type
- journal article
- Language
- en
- Open access
- green
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- Rodrı́guez, T. R., & Garcı́a, R. (2004). Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever. Applied Physics Letters. https://doi.org/10.1063/1.1642273
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