Analytical Solutions to Estimate the Stress Induced Polarization Shift and the Temperature Sensitivity of Optical Waveguides
Abstract
Polarization shift and temperature sensitivity are important issues in optical waveguides. Applying stresses is a promising method to control these optical parameters. In this article, analytical solutions are obtained to estimate the stress effects on these optical parameters. Because the refractive index variation induced by the stresses is very small, the linear approximation is used to obtain the closed-form solutions to estimate the stress induced effective index change in a slab waveguide. The solutions are, then, extended to estimate the stress induced effective index change, polarization shift, and the temperature sensitivity of a channel waveguide by use of effective index method. As an example, the optical parameters controlled by the thermal stresses, which are induced by attaching an Al plate on the bottom of the substrate, are analyzed. The results show that the polarization shift and the temperature sensitivity of the central wavelength can be tuned in a large range by varying the Al plate thickness and the curing temperature. The effects can be modified by changing the shape of the Al plate.
Integrity signals
Registry
Cites
Statistics
Claims the paper makes
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
Stress-induced birefringence can alter polarisation and distort device temperature sensitivity.
“At the same time, stress-induced birefringence, which appears due to the elastic-optic effect, can alter the polarisation and distort the device temperature sensitivity [157].”
From Metal Oxide Thin Films for Advanced Photonic Applications (2026) · cites this paper as [157]
Cites
Nishihara, H. (1980) · The Review of Laser Engineering · doi:10.2184/lsj.8.632 · Cited by 365 · see citing works
Stress effects on the performance of optical waveguides
Huang, M. (2003) · International Journal of Solids and Structures · doi:10.1016/s0020-7683(03)00037-4 · Cited by 253 · see citing works
Self-citationAcousto-optic devices: principles, design, and applications
Xu, J., & Stroud, R. W. (1992) · Medical Entomology and Zoology · Cited by 244 · see citing works
Takahashi, H., Hibino, Y., Ohmori, Y., & Kawachi, M. (1993) · IEEE Photonics Technology Letters · doi:10.1109/68.219718 · Cited by 92 · see citing works
Kilian, A., Kirchhof, J., Przyrembel, G., & Wischmann, W. (2000) · Journal of Lightwave Technology · doi:10.1109/50.822792 · Cited by 77 · see citing works
Polarisation-insensitive arrayed-waveguide gratingmultiplexer with SiO 2 -on-SiO 2 structure
Suzuki, S. W., Inoue, Y., & Ohmori, Y. (1994) · Electronics Letters · doi:10.1049/el:19940440 · Cited by 68 · see citing works
Polarization insensitive, low-loss, low-crosstalk wavelength multiplexer modules
Nadler, C. K., Wildermuth, E., Lanker, M., Hunziker, W., & Melchior, H. M. (1999) · IEEE Journal of Selected Topics in Quantum Electronics · doi:10.1109/2944.806898 · Cited by 48 · see citing works
Simple method of fabricating polarisation-insensitiveand very low crosstalkAWG grating devices
Ojha, S. M., Cureton, C. G., Bricheno, T., Day, S., Moule, D. J., Bell, A. J., & Taylor, J. (1998) · Electronics Letters · doi:10.1049/el:19980079 · Cited by 41 · see citing works
Ooba, N., Hibino, Y., Inoue, Y., & Sugita, A. (2000) · Electronics Letters · doi:10.1049/el:20001267 · Cited by 38 · see citing works
Thermal-stress effects on the temperature sensitivity of optical waveguides
Huang, M., & Yan, X. (2003) · Journal of the Optical Society of America B · doi:10.1364/josab.20.001326 · Cited by 37 · see citing works
Self-citationSilicon-dioxide waveguides with low birefringence
de Peralta, L. G., Bernussi, A. A., Temkin, H., Kakhki, M. B., & Doucette, D. E. (2003) · IEEE Journal of Quantum Electronics · doi:10.1109/jqe.2003.813194 · Cited by 24 · see citing works
Cohen, D. A., Heimbuch, M. E., & Coldren, L. A. (1996) · Applied Physics Letters · doi:10.1063/1.118137 · Cited by 17 · see citing works
Thermal stresses in optical waveguides
Huang, M. (2003) · Optics Letters · doi:10.1364/ol.28.002327 · Cited by 14 · see citing works
Self-citationEnhanced wavelength tuning of an InGaAsP-InP laser with a thermal-strain-magnifying trench
Cohen, D. A., Mason, B., Dolan, J., Burns, C., & Coldren, L. A. (2000) · Applied Physics Letters · doi:10.1063/1.1319527 · Cited by 10 · see citing works
Flagged first, then by citations
Cited by
Sorted by citations
Analytical solutions for thermal stresses in buried channel waveguides
Huang, M. (2004) · IEEE Journal of Quantum Electronics · doi:10.1109/jqe.2004.835716 · Cited by 20 · see citing works
Self-citationSun, D., Sun, Q., Xing, W., Sun, Z., Shang, H., Chang, L., Wang, X., Liu, P., & Hall, T. (2018) · AIP Advances · doi:10.1063/1.5045516 · Cited by 7 · see citing works
Huang, M. (2006) · IEEE Photonics Technology Letters · doi:10.1109/lpt.2006.876746 · Cited by 5 · see citing works
Self-citationHuang, H., Liu, W., & Huang, D. (2008) · IEEE Journal of Quantum Electronics · doi:10.1109/jqe.2008.2005357 · Cited by 2 · see citing works
Explicit formulas for the identification of a small defect in a planar waveguide
He, S., Liao, R., & Romanov, V. G. (2005) · Journal of the Optical Society of America A · doi:10.1364/josaa.22.001414 · Cited by 2 · see citing works
Metal Oxide Thin Films for Advanced Photonic Applications
Stîngescu, M.-L., Șopronyi, M.-A., Antohe, Ș., & Scărișoreanu, N.-D. (2026) · Crystals · doi:10.3390/cryst16030164 · Cited by 2 · see citing works
“At the same time, stress-induced birefringence, which appears due to the elastic–optic effect, can alter the polarisation and distort the device temperature sensitivity [157].”
Khan, T., Asif, M., Jabar, A., & Jung, I. H. (2026) · Chaos Solitons & Fractals · doi:10.1016/j.chaos.2026.118324 · Cited by 1 · see citing works
Analytical method for the identification of a thin-strip defect in a planar waveguide
Liao, R., Romanov, V. G., & He, S. (2006) · Journal of the Optical Society of America A · doi:10.1364/josaa.23.002650
Huang, H., Huang, D., Liu, W., & Cheng, Z. (2008) · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · doi:10.1117/12.802506
LabVIEW-based Control System for Magnetic Resonance Sounding Instrument
Wu, D. Y., & Meng, J. (2015) · Advances in intelligent systems research/Advances in Intelligent Systems Research · doi:10.2991/lemcs-15.2015.166
- Authors
- Huang, M., & Yan, X.
- Affiliations
- Princeton University (US)
- TelASIC Communications, 1940 East Mariposa, El Segundo, California 90245
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 2004-03-01
- Volume
- 95
- Issue
- 5
- Pages
- 2820-2826
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W2084427083
- Cited by
- 9
- References
- 14
- Citations by year
- 2026: 1 · 2018: 1 · 2015: 1
- FWCI
- 1.30
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Journal of Applied Physics (publishedVersion)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Photonic and Optical Devices
- Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Photorefractive and Nonlinear Optics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Fiber Optic Sensors
- Keywords
- temperature sensitivity, optical waveguides, thermal stress, channel waveguides, planar waveguides, aluminum plate, curing temperature, wavelength tuning, analytical solution
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
