The DOI matches its Crossref record; 17 of the 17 references it cites were found in a registry or an index.
Self-consistent optical constants of SiO_2 and Ta_2O_5 films
Open accessAbstract
16 págs.; 8 figs.; 1 tab. ; OCIS codes: (120.4530) Optical constants; (310.6860) Thin films, optical properties; (230.4170) Multilayers; \n(260.7210) Ultraviolet, vacuum; (260.7190) Ultraviolet; (260.7200) Ultraviolet, extreme
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Cites
Kischkat, J., Peters, S., Gruska, B., Semtsiv, M., Chashnikova, M., Klinkmüller, M., Fedosenko, O., Machulik, S., Aleksandrova, A., Monastyrskyi, G., et al. (2012) · Applied Optics · doi:10.1364/ao.51.006789 · Cited by 1,019
IMD—Software for modeling the optical properties of multilayer films
Windt, D. L. (1998) · Computers in Physics · doi:10.1063/1.168689 · Cited by 947
Shiles, E., Sasaki, T., Inokuti, M., & Smith, D. Y. (1980) · Physical Review B · doi:10.1103/physrevb.22.1612 · Cited by 420
Exploitation of multiple incidences spectrometric measurements for thin film reverse engineering
Gao, L., Lemarchand, F., & Lequime, M. (2012) · Optics Express · doi:10.1364/oe.20.015734 · Cited by 336
Transmission, photoconductivity, and the experimental band gap of thermally grown SiO2films
Weinberg, Z. A., Rubloff, G. W., & Bassous, E. (1979) · Physical Review B · doi:10.1103/physrevb.19.3107 · Cited by 215
Infrared optical properties of amorphous and nanocrystalline Ta2O5 thin films
Bright, T. J., Watjen, J. I., Zhang, Z. M., Muratore, C., Voevodin, A. A., Koukis, D. I., Tanner, D. B., & Arenas, D. J. (2013) · Journal of Applied Physics · doi:10.1063/1.4819325 · Cited by 186
Demiryont, H., Sites, J. R., & Geib, K. (1985) · Applied Optics · doi:10.1364/ao.24.000490 · Cited by 169
Thielsch, R., Gatto, A., Heber, J. D., & Kaiser, N. (2002) · Thin Solid Films · doi:10.1016/s0040-6090(02)00208-0 · Cited by 146
Altarelli, M., & Smith, D. Y. (1974) · Physical review. B, Solid state · doi:10.1103/physrevb.9.1290 · Cited by 144
Optical properties and environmental stability of oxide coatings deposited by reactive sputtering
Edlou, S. M., Smajkiewicz, A., & Al-Jumaily, G. A. (1993) · Applied Optics · doi:10.1364/ao.32.005601 · Cited by 124
Cited by
(INVITED)Planar Microcavities: Materials and Processing for Light Control
Megahd, H., Comoretto, D., & Lova, P. (2022) · Optical Materials: X · doi:10.1016/j.omx.2021.100130 · Cited by 19
Stress and Refractive Index Control of SiO2 Thin Films for Suspended Waveguides
Wostbrock, N., & Busani, T. (2020) · Nanomaterials · doi:10.3390/nano10112105 · Cited by 12
Metadata
- Authors
- Rodríguez-de Marcos, L. V., Larruquert, J. I., Méndez, J. A., & Aznárez, J. A.
- Venue
- Optical Materials Express
- Publisher
- Optica Publishing Group
- Published
- 2016-10-26
- Volume
- 6
- Issue
- 11
- Pages
- 3622
- ISSN
- 2159-3930 (ISSN-L)
- OpenAlex
- W2540323365
- Cited by
- 323
- References
- 17
- FWCI
- 4.41
- Type
- journal article
- Language
- en
- Open access
- gold
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- Rodríguez-de Marcos, L. V., Larruquert, J. I., Méndez, J. A., & Aznárez, J. A. (2016). Self-consistent optical constants of SiO_2 and Ta_2O_5 films. Optical Materials Express. https://doi.org/10.1364/ome.6.003622
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
