The DOI matches its Crossref record.
Avalanche-Induced Negative Resistance in Thin Oxide Films
Abstract
A current-controlled negative resistance phenomenon, similar to that exhibited by a gas discharge tube, has been observed in suitably prepared thin oxide films of Nb, Ta, and Ti, sandwiched between thin-film metal electrodes, at frequencies up to 1 Mc/sec. The voltage required to sustain the negative resistance in both directions of current is independent of the electrode materials, apparent area and thickness (up to 500 Å) of the oxide film, and is about 0.4, 1.3, and 3.5 V for Ti, Nb, and Ta oxide films, respectively. The corresponding electric fields are approximately 0.8×106, 3×106, 9×106 V/cm. These values increase slightly with decrease of temperature. Experimental evidence supports the interpretation of the phenomenon in terms of avalanche multiplication of carriers in a thin region of the oxide film attended by space-charge-limited flow conditions.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Memristive switching mechanism for metal/oxide/metal nanodevices
Yang, J. J., Pickett, M. D., Li, X., Ohlberg, D. A. A., Stewart, D. R., & Williams, R. S. (2008) · Nature Nanotechnology · doi:10.1038/nnano.2008.160 · Cited by 2,987
Reproducible switching effect in thin oxide films for memory applications
Beck, A., Bednorz, J. G., Gerber, C., Rossel, C., & Widmer, D. (2000) · Applied Physics Letters · doi:10.1063/1.126902 · Cited by 1,122
Electrical phenomena in amorphous oxide films
Dearnaley, G., Stoneham, A. M., & Morgan, D. V. (1970) · Reports on Progress in Physics · doi:10.1088/0034-4885/33/3/306 · Cited by 731
Pickett, M. D., & Stanley Williams, R. (2012) · Nanotechnology · doi:10.1088/0957-4484/23/21/215202 · Cited by 385
Switching phenomena in titanium oxide thin films
Argall, F. (1968) · Solid-State Electronics · doi:10.1016/0038-1101(68)90092-0 · Cited by 308
Metadata
- Authors
- Chopra, K. L.
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 1965-01-01
- Volume
- 36
- Issue
- 1
- Pages
- 184-187
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W2018934262
- Cited by
- 158
- References
- 0
- FWCI
- 6.95
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Avalanche-Induced Negative Resistance in Thin Oxide Films. https://app.cochat.ai/papers/10.1063/1.1713870
- The paper
- Chopra, K. L. (1965). Avalanche-Induced Negative Resistance in Thin Oxide Films. Journal of Applied Physics. https://doi.org/10.1063/1.1713870
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
