The DOI matches its Crossref record; 8 of the 8 references it cites were found in a registry or an index.
Quintuple-layer epitaxy of thin films of topological insulator Bi2Se3
Open accessAbstract
Atomically smooth, single crystalline Bi2Se3 thin films were prepared on Si(111) by molecular beam epitaxy. Scanning tunneling microscopy, low-energy electron diffraction, x-ray photoelectron emission spectroscopy, and Raman spectroscopy were used to characterize the stoichiometry and crystallinity of the film. The films grow in a self-organized quintuple layer by quintuple-layer mode, and atomically smooth films can be obtained, with controllable thickness down to one quintuple layer (∼1 nm).
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Topological insulators in Bi2Se3, Bi2Te3 and Sb2Te3 with a single Dirac cone on the surface
Zhang, H., Liu, C.-X., Qi, X.-L., Dai, X., Fang, Z., & Zhang, S.-C. (2009) · Nature Physics · doi:10.1038/nphys1270 · Cited by 6,359
Self-citationSuperconducting Proximity Effect and Majorana Fermions at the Surface of a Topological Insulator
Fu, L., & Kane, C. L. (2008) · Physical Review Letters · doi:10.1103/physrevlett.100.096407 · Cited by 4,868
Topological insulators with inversion symmetry
Fu, L., & Kane, C. L. (2007) · Physical Review B · doi:10.1103/physrevb.76.045302 · Cited by 4,252
Observation of a large-gap topological-insulator class with a single Dirac cone on the surface
Xia, Y., Qian, D., Hsieh, D., Wray, L., Pal, A., Lin, H., Bansil, A., Grauer, D., Hor, Y. S., Cava, R. J., et al. (2009) · Nature Physics · doi:10.1038/nphys1274 · Cited by 3,765
Experimental Realization of a Three-Dimensional Topological Insulator, Bi 2 Te 3
Chen, Y. L., Analytis, J. G., Chu, J.-H., Liu, Z. K., Mo, S.-K., Qi, X. L., Zhang, H. J., Lu, D. H., Dai, X., Fang, Z., et al. (2009) · Science · doi:10.1126/science.1173034 · Cited by 3,585
Self-citationp -type Bi 2 Se 3 for topological insulator and low-temperature thermoelectric applications
Hor, Y. S., Richardella, A., Roushan, P., Xia, Y., Checkelsky, J. G., Yazdani, A., Hasan, M. Z., Ong, N. P., & Cava, R. J. (2009) · Physical Review B · doi:10.1103/physrevb.79.195208 · Cited by 647
Magnetic Impurities on the Surface of a Topological Insulator
Liu, Q., Liu, C.-X., Xu, C., Qi, X.-L., & Zhang, S.-C. (2009) · Physical Review Letters · doi:10.1103/physrevlett.102.156603 · Cited by 607
Moore, J. (2009) · Nature Physics · doi:10.1038/nphys1294 · Cited by 444
Cited by
Colloquium : Topological insulators
Hasan, M. Z., & Kane, C. L. (2010) · Reviews of Modern Physics · doi:10.1103/revmodphys.82.3045 · Cited by 19,930
Topological insulators and superconductors
Qi, X.-L., & Zhang, S.-C. (2011) · Reviews of Modern Physics · doi:10.1103/revmodphys.83.1057 · Cited by 14,394
Weyl Semimetal in a Topological Insulator Multilayer
Burkov, A. A., & Balents, L. (2011) · Physical Review Letters · doi:10.1103/physrevlett.107.127205 · Cited by 2,289
Topological Insulator Materials
Ando, Y. (2013) · Journal of the Physical Society of Japan · doi:10.7566/jpsj.82.102001 · Cited by 1,789
Crossover of the three-dimensional topological insulator Bi2Se3 to the two-dimensional limit
Zhang, Y., He, K., Chang, C.-Z., Song, C.-L., Wang, L.-L., Chen, X., Jia, J.-F., Fang, Z., Dai, X., Shan, W.-Y., et al. (2010) · Nature Physics · doi:10.1038/nphys1689 · Cited by 1,454
Self-citation
Metadata
- Authors
- Zhang, G., Qin, H., Teng, J., Guo, J., Guo, Q., Dai, X., Fang, Z., & Wu, K.
- Venue
- Applied Physics Letters
- Publisher
- AIP Publishing
- Published
- 2009-08-03
- Volume
- 95
- Issue
- 5
- ISSN
- 0003-6951 (ISSN-L)
- 1077-3118
- OpenAlex
- W2114898354
- Cited by
- 358
- References
- 8
- FWCI
- 14.50
- Type
- journal article
- Language
- en
- Open access
- green
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Quintuple-layer epitaxy of thin films of topological insulator Bi2Se3. https://app.cochat.ai/papers/10.1063/1.3200237
- The paper
- Zhang, G., Qin, H., Teng, J., Guo, J., Guo, Q., Dai, X., Fang, Z., & Wu, K. (2009). Quintuple-layer epitaxy of thin films of topological insulator Bi2Se3. Applied Physics Letters. https://doi.org/10.1063/1.3200237
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
