The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.
Transient thermoreflectance from thin metal films
Abstract
This report describes the first demonstration of thermal diffusivity measurements using picosecond transient thermoreflectance (TTR). Although previously reported methods of measuring thermal transport properties of thin films require precise knowledge of the thermal properties of the substrate, this technique allows measurements on films as thin as 100 nm without any evidence of substrate interaction. The TTR measurement is modeled with a one-dimensional heat flow equation using a two-parameter fitting routine to determine the thermal diffusivity. The validity of our approach is confirmed by the TTR measured thermal diffusivity of single crystal nickel. We have also measured the thermal diffusivity of sputtered and evaporated single element metal films. Preliminary results from TTR measurements on compositionally modulated structures are also presented.
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Citations
Cites
A Simplex Method for Function Minimization
Nelder, J. A., & Mead, R. (1965) · The Computer Journal · doi:10.1093/comjnl/7.4.308 · Cited by 28,905
Cited by
Cahill, D. G., Ford, W. K., Goodson, K. E., Mahan, G. D., Majumdar, A., Maris, H. J., Merlin, R., & Phillpot, S. R. (2003) · Journal of Applied Physics · doi:10.1063/1.1524305 · Cited by 2,825
Nanoscale thermal transport. II. 2003–2012
Cahill, D. G., Braun, P. V., Chen, G., Clarke, D. R., Fan, S., Goodson, K. E., Keblinski, P., King, W. P., Mahan, G. D., Majumdar, A., et al. (2014) · Applied Physics Reviews · doi:10.1063/1.4832615 · Cited by 1,763
Analysis of heat flow in layered structures for time-domain thermoreflectance
Cahill, D. G. (2004) · Review of Scientific Instruments · doi:10.1063/1.1819431 · Cited by 1,543
Ultralow Thermal Conductivity in Disordered, Layered WSe 2 Crystals
Chiritescu, C., Cahill, D. G., Nguyen, N., Johnson, D., Bodapati, A., Keblinski, P., & Zschack, P. (2007) · Science · doi:10.1126/science.1136494 · Cited by 854
Schmidt, A. J., Chen, X., & Chen, G. (2008) · Review of Scientific Instruments · doi:10.1063/1.3006335 · Cited by 655
Metadata
- Authors
- Paddock, C. A., & Eesley, G. L.
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 1986-07-01
- Volume
- 60
- Issue
- 1
- Pages
- 285-290
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W2045647932
- Cited by
- 528
- References
- 1
- FWCI
- 8.09
- Type
- journal article
- Language
- en
- Open access
- closed
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- Paddock, C. A., & Eesley, G. L. (1986). Transient thermoreflectance from thin metal films. Journal of Applied Physics. https://doi.org/10.1063/1.337642
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
