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Cited by 268

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Theoretical analysis of the static deflection of plates for atomic force microscope applications

Sader, John Elie, White, Lee·1993·Journal of Applied Physics

Abstract

The analysis of the static deflection of cantilever plates is of fundamental importance in application to the atomic force microscope (AFM). In this paper we present a detailed theoretical study of the deflection of such cantilevers. This shall incorporate the presentation of approximate analytical methods applicable in the analysis of arbitrary cantilevers, and a discussion of their limitations and accuracies. Furthermore, we present results of a detailed finite element analysis for a current AFM cantilever, which will be of value to the users of the AFM.

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Metadata

Authors
Sader, J. E., & White, L.
Venue
Journal of Applied Physics
Published
1993-07-01
Volume
74
Issue
1
Pages
1-9
ISSN
  • 0021-8979 (ISSN-L)
  • 1089-7550
OpenAlex
W2026039974
Cited by
268
References
0
FWCI
7.85
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Theoretical analysis of the static deflection of plates for atomic force microscope applications. https://app.cochat.ai/papers/10.1063/1.354137
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Sader, J. E., & White, L. (1993). Theoretical analysis of the static deflection of plates for atomic force microscope applications. Journal of Applied Physics. https://doi.org/10.1063/1.354137

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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.