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Theoretical analysis of the static deflection of plates for atomic force microscope applications
Abstract
The analysis of the static deflection of cantilever plates is of fundamental importance in application to the atomic force microscope (AFM). In this paper we present a detailed theoretical study of the deflection of such cantilevers. This shall incorporate the presentation of approximate analytical methods applicable in the analysis of arbitrary cantilevers, and a discussion of their limitations and accuracies. Furthermore, we present results of a detailed finite element analysis for a current AFM cantilever, which will be of value to the users of the AFM.
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Cited by
Calibration of rectangular atomic force microscope cantilevers
Sader, J. E., Chon, J. W. M., & Mulvaney, P. (1999) · Review of Scientific Instruments · doi:10.1063/1.1150021 · Cited by 2,145
Self-citationCalculation of thermal noise in atomic force microscopy
Butt, H. J., & Jaschke, M. (1995) · Nanotechnology · doi:10.1088/0957-4484/6/1/001 · Cited by 1,589
Regulation of stability and function of the epithelial Na+ channel (ENaC) by ubiquitination
Staub, O., Gautschi, I., Ishikawa, T., Breitschopf, K., Ciechanover, A., Schild, L., & Rotin, D. (1997) · The EMBO Journal · doi:10.1093/emboj/16.21.6325 · Cited by 601
AFM: a versatile tool in biophysics
Alessandrini, A., & Facci, P. (2005) · Measurement Science and Technology · doi:10.1088/0957-0233/16/6/r01 · Cited by 384
Lateral, normal, and longitudinal spring constants of atomic force microscopy cantilevers
Neumeister, J. M., & Ducker, W. A. (1994) · Review of Scientific Instruments · doi:10.1063/1.1144646 · Cited by 334
Metadata
- Authors
- Sader, J. E., & White, L.
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 1993-07-01
- Volume
- 74
- Issue
- 1
- Pages
- 1-9
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W2026039974
- Cited by
- 268
- References
- 0
- FWCI
- 7.85
- Type
- journal article
- Language
- en
- Open access
- closed
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- Sader, J. E., & White, L. (1993). Theoretical analysis of the static deflection of plates for atomic force microscope applications. Journal of Applied Physics. https://doi.org/10.1063/1.354137
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