The DOI matches its Crossref record; 11 of the 11 references it cites were found in a registry or an index.
Observation of microstructure and damage in materials by phase sensitive radiography and tomography
Abstract
The novel possibilities of phase feature detection in radiography at a third generation synchrotron radiation source are used to image, both in projection and in computed tomography, a cracked silicon single crystal and metal matrix composites strained in tension. Through an instrumentally very simple technique, based on Fresnel diffraction, phase jumps related to the interface between the matrix and the reinforcing phases of the composites are detected even when these phases show very similar x-ray attenuation. Strain-induced cracks with openings below the micrometer range are also visible through the phase modulation they introduce, illustrating the potential of the technique for assessing damage in materials with improved resolution and sensitivity.
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Cites
Principles of Optics: 60th Anniversary Edition
Born, M., & Wolf, E. (2019) · Cambridge University Press eBooks · doi:10.1017/9781108769914 · Cited by 26,251
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Surface Studies of Solids by Total Reflection of X-Rays
Parratt, L. G. (1954) · Physical Review · doi:10.1103/physrev.95.359 · Cited by 5,188
Elementary engineering fracture mechanics
Broek, D. (1982) · Springer eBooks · doi:10.1007/978-94-009-4333-9 · Cited by 2,894
Phase-contrast imaging using polychromatic hard X-rays
Wilkins, S. W., Gureyev, T. E., Gao, D., Pogany, A., & Stevenson, A. W. (1996) · Nature · doi:10.1038/384335a0 · Cited by 1,766
Snigirev, A., Snigireva, I., Kohn, V., Kuznetsov, S., & Schelokov, I. (1995) · Review of Scientific Instruments · doi:10.1063/1.1146073 · Cited by 1,493
Image Reconstruction from Projections
(2004) · Biomedical Engineering · doi:10.1201/9780203492543.ch9 · Cited by 915
Phase objects in synchrotron radiation hard x-ray imaging
Cloetens, P., Barrett, R., Baruchel, J., Guigay, J.-P., & Schlenker, M. (1996) · Journal of Physics D: Applied Physics · doi:10.1088/0022-3727/29/1/023 · Cited by 853
Self-citationX-ray plane-wave topography observation of the phase contrast from a non-crystalline object
Ingal, V. N., & Beliaevskaya, E. A. (1995) · Journal of Physics D: Applied Physics · doi:10.1088/0022-3727/28/11/012 · Cited by 411
AN X-RAY INTERFEROMETER WITH LONG SEPARATED INTERFERING BEAM PATHS
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Cited by
Tafforeau, P., Boistel, R., Boller, E., Bravin, A., Brunet, M., Chaimanee, Y., Cloetens, P., Feist, M., Hoszowska, J., Jaeger, J.-J., et al. (2006) · Applied Physics A · doi:10.1007/s00339-006-3507-2 · Cited by 456
Self-citationAdvantages of phase retrieval for fast x-ray tomographic microscopy
Mokso, R., Marone, F., Irvine, S., Nyvlt, M., Schwyn, D., Mader, K., Taylor, G. K., Krapp, H. G., Skeren, M., & Stampanoni, M. (2013) · Journal of Physics D: Applied Physics · doi:10.1088/0022-3727/46/49/494004 · Cited by 56
Metadata
- Authors
- Cloetens, P., Pateyron-Salomé, M., Buffière, J. Y., Peix, G., Baruchel, J., Peyrin, F., & Schlenker, M.
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 1997-05-01
- Volume
- 81
- Issue
- 9
- Pages
- 5878-5886
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W2050757502
- Cited by
- 538
- References
- 11
- FWCI
- 14.99
- Type
- journal article
- Language
- en
- Open access
- closed
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- Cloetens, P., Pateyron-Salomé, M., Buffière, J. Y., Peix, G., Baruchel, J., Peyrin, F., & Schlenker, M. (1997). Observation of microstructure and damage in materials by phase sensitive radiography and tomography. Journal of Applied Physics. https://doi.org/10.1063/1.364374
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
