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Cited by 200

The DOI matches its Crossref record; 3 of the 3 references it cites were found in a registry or an index.

Application of the three omega thermal conductivity measurement method to a film on a substrate of finite thickness

Kim, Jung Hun, Feldman, Albert, Novotny, Donald·1999·Journal of Applied Physics

Abstract

The three omega thermal conductivity measurement method is analyzed for the case of one or more thin films on a substrate of finite thickness. The analysis is used to obtain the thermal conductivities of SiO2 films on Si substrates and of a chemical vapor deposition (CVD) diamond plate. For the case of the SiO2 films on a Si, we find an apparent thickness dependence of the thermal conductivity of the SiO2 films. However, the data can also be explained by a thickness-independent thermal conductivity and an interfacial thermal resistance. For the case of the CVD diamond plate, the fit of the theory to the experimental data is significantly improved if we assume that an interface layer separates the heater from the diamond plate.

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Metadata

Authors
Kim, J. H., Feldman, A., & Novotny, D.
Venue
Journal of Applied Physics
Published
1999-10-01
Volume
86
Issue
7
Pages
3959-3963
ISSN
  • 0021-8979 (ISSN-L)
  • 1089-7550
OpenAlex
W2089595166
Cited by
200
References
3
FWCI
2.00
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Application of the three omega thermal conductivity measurement method to a film on a substrate of finite thickness. https://app.cochat.ai/papers/10.1063/1.371314
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Kim, J. H., Feldman, A., & Novotny, D. (1999). Application of the three omega thermal conductivity measurement method to a film on a substrate of finite thickness. Journal of Applied Physics. https://doi.org/10.1063/1.371314

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.